Silviu Reinhorn

Person

Mevaseret Zion, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Particle detection assembly, system and method
- Patent number 10,910,193
- Issue date Feb 2, 2021
- EL-MUL TECHNOLOGIES LTD.
- Eli Cheifetz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection assembly, system and method
- Patent number 10,236,155
- Issue date Mar 19, 2019
- EL-MUL TECHNOLOGIES LTD.
- Eli Cheifetz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Position sensitive STEM detector
- Patent number 9,076,632
- Issue date Jul 7, 2015
- EL-MUL TECHNOLOGIES LTD.
- Silviu Reinhorn
- G01 - MEASURING TESTING
Information Patent Grant
High resolution wafer inspection system
- Patent number 7,973,919
- Issue date Jul 5, 2011
- Applied Materials Israel, Ltd.
- Dan Grossman
- G01 - MEASURING TESTING
Information Patent Grant
High resolution wafer inspection system
- Patent number 7,714,999
- Issue date May 11, 2010
- Applied Materials Israel, Ltd.
- Dan Grossman
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for article inspection including speckle reduc...
- Patent number 7,463,352
- Issue date Dec 9, 2008
- Applied Materials, Inc.
- Avner Karpol
- G01 - MEASURING TESTING
Information Patent Grant
Multi beam scanning with bright/dark field imaging
- Patent number 7,399,647
- Issue date Jul 15, 2008
- Applied Materials, Inc.
- Silviu Reinhorn
- G01 - MEASURING TESTING
Information Patent Grant
Multi beam scanning with bright/dark field imaging
- Patent number 7,190,459
- Issue date Mar 13, 2007
- Applied Materials, Inc.
- Silviu Reinhorn
- G01 - MEASURING TESTING
Information Patent Grant
Wafer defect detection system with traveling lens multi-beam scanner
- Patent number 7,053,395
- Issue date May 30, 2006
- Applied Materials, Inc.
- Haim Feldman
- G01 - MEASURING TESTING
Information Patent Grant
Multi beam scanning with bright/dark field imaging
- Patent number 7,049,586
- Issue date May 23, 2006
- Applied Material Israel, Ltd.
- Silviu Reinhorn
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for article inspection including speckle reduc...
- Patent number 6,924,891
- Issue date Aug 2, 2005
- Applied Materials, Inc.
- Avner Karpol
- G01 - MEASURING TESTING
Information Patent Grant
Variable angle illumination wafer inspection system
- Patent number 6,853,446
- Issue date Feb 8, 2005
- Applied Materials, Inc.
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Grant
Wafer defect detection system with traveling lens multi-beam scanner
- Patent number 6,853,475
- Issue date Feb 8, 2005
- Applied Materials Inc.
- Haim Feldman
- G01 - MEASURING TESTING
Information Patent Grant
Wafer defect detection system with traveling lens multi-beam scanner
- Patent number 6,809,808
- Issue date Oct 26, 2004
- Applied Materials, Inc.
- Haim Feldman
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for article inspection including speckle reduc...
- Patent number 6,798,505
- Issue date Sep 28, 2004
- Applied Materials, Inc.
- Avner Karpol
- G01 - MEASURING TESTING
Information Patent Grant
Laser scanning wafer inspection using nonlinear optical phenomena
- Patent number 6,791,099
- Issue date Sep 14, 2004
- Applied Materials, Inc.
- Daniel I. Some
- G01 - MEASURING TESTING
Information Patent Grant
Multi-beam polygon scanning system
- Patent number 6,788,445
- Issue date Sep 7, 2004
- Applied Materials, Inc.
- Boris Goldberg
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspection of patterned semiconductor wafers
- Patent number 6,671,398
- Issue date Dec 30, 2003
- Applied Materials, Inc.
- Silviu Reinhorn
- G01 - MEASURING TESTING
Information Patent Grant
Method of and apparatus for article inspection including speckle re...
- Patent number 6,587,194
- Issue date Jul 1, 2003
- Applied Materials, Inc.
- Avner Karpol
- G01 - MEASURING TESTING
Information Patent Grant
Method of and apparatus for article inspection including speckle re...
- Patent number 6,556,294
- Issue date Apr 29, 2003
- Applied Materials, Inc.
- Avner Karpol
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for article inspection including speckle reduc...
- Patent number 6,429,931
- Issue date Aug 6, 2002
- Applied Materials, Inc.
- Avner Karpol
- G02 - OPTICS
Information Patent Grant
Method and apparatus for article inspection including speckle reduc...
- Patent number 6,369,888
- Issue date Apr 9, 2002
- Applied Materials, Inc.
- Avner Karpol
- G02 - OPTICS
Information Patent Grant
Method and apparatus for inspection of patterned semiconductor wafers
- Patent number 6,317,514
- Issue date Nov 13, 2001
- Applied Materials, Inc.
- Silviu Reinhorn
- G01 - MEASURING TESTING
Information Patent Grant
Compact planar optical correlator
- Patent number 6,185,015
- Issue date Feb 6, 2001
- Yeda Research and Development Co. Ltd.
- Silviu Reinhorn
- G02 - OPTICS
Information Patent Grant
Compact optical crossbar switch
- Patent number 6,172,778
- Issue date Jan 9, 2001
- Yeda Research & Development Co. Ltd. of Weizmann Institute of Science
- Silviu Reinhorn
- G02 - OPTICS
Information Patent Grant
Planar holographic optical device
- Patent number 5,966,223
- Issue date Oct 12, 1999
- Yeda Research and Development Co., Ltd.
- Asher Albert Friesem
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
PARTICLE DETECTION ASSEMBLY, SYSTEM AND METHOD
- Publication number 20190259571
- Publication date Aug 22, 2019
- EL-MUL TECHNOLOGIES LTD.
- ELI CHEIFETZ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTION ASSEMBLY, SYSTEM AND METHOD
- Publication number 20170069459
- Publication date Mar 9, 2017
- EL-MUL TECHNOLOGIES LTD.
- ELI CHEIFETZ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POSITION SENSITIVE STEM DETECTOR
- Publication number 20150034822
- Publication date Feb 5, 2015
- EL-MUL TECHNOLOGIES LTD.
- Silviu Reinhorn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER INSPECTION SYSTEM
- Publication number 20110141462
- Publication date Jun 16, 2011
- Silviu Reinhorn
- G01 - MEASURING TESTING
Information Patent Application
HIGH RESOLUTION WAFER INSPECTION SYSTEM
- Publication number 20100188658
- Publication date Jul 29, 2010
- Dan Grossman
- G01 - MEASURING TESTING
Information Patent Application
HIGH RESOLUTION WAFER INSPECTION SYSTEM
- Publication number 20080231845
- Publication date Sep 25, 2008
- Dan Grossman
- G01 - MEASURING TESTING
Information Patent Application
Collapsible portable display
- Publication number 20060232578
- Publication date Oct 19, 2006
- Silviu Reinhorn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Collapsible portable display
- Publication number 20060234784
- Publication date Oct 19, 2006
- Silviu Reinhorn
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Multi beam scanning with bright/dark field imaging
- Publication number 20060028649
- Publication date Feb 9, 2006
- APPLIED MATERIALS, INC.
- Silviu Reinhorn
- G02 - OPTICS
Information Patent Application
Wafer inspection system
- Publication number 20060012791
- Publication date Jan 19, 2006
- Silviu Reinhorn
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for article inspection including speckle reduc...
- Publication number 20050128473
- Publication date Jun 16, 2005
- Applied Materials, Inc.
- Avner Karpol
- G02 - OPTICS
Information Patent Application
Multi beam scanning with bright/dark field imaging
- Publication number 20050030527
- Publication date Feb 10, 2005
- APPLIED MATERIALS, INC.
- Silviu Reinhorn
- G02 - OPTICS
Information Patent Application
MULTI BEAM SCANNING WITH BRIGHT/DARK FIELD IMAGING
- Publication number 20040235208
- Publication date Nov 25, 2004
- Applied Materials, Inc.
- Silviu REINHORN
- G02 - OPTICS
Information Patent Application
Method and apparatus for article inspection including speckle reduc...
- Publication number 20040201842
- Publication date Oct 14, 2004
- Applied Materials, Inc.
- Avner Karpol
- G02 - OPTICS
Information Patent Application
Wafer defect detection system with traveling lens multi-beam scanner
- Publication number 20040080740
- Publication date Apr 29, 2004
- APPLIED MATERIALS, INC.
- Haim Feldman
- G02 - OPTICS
Information Patent Application
Wafer defect detection system with traveling lens multi-beam scanner
- Publication number 20040075068
- Publication date Apr 22, 2004
- APPLIED MATERIALS, INC.
- Haim Feldman
- G02 - OPTICS
Information Patent Application
Method and apparatus for article inspection including speckle reduc...
- Publication number 20030197858
- Publication date Oct 23, 2003
- Applied Materials, Inc.
- Avner Karpol
- G02 - OPTICS
Information Patent Application
Multi-beam polygon scanning system
- Publication number 20030184835
- Publication date Oct 2, 2003
- Boris Goldberg
- G02 - OPTICS
Information Patent Application
Wafer defect detection system with traveling lens multi-beam scanner
- Publication number 20030179369
- Publication date Sep 25, 2003
- APPLIED MATERIALS, INC.
- Haim Feldman
- G02 - OPTICS
Information Patent Application
Multi beam scanning with bright/dark field imaging
- Publication number 20030156280
- Publication date Aug 21, 2003
- APPLIED MATERIALS, INC.
- Silviu Reinhorn
- G02 - OPTICS
Information Patent Application
Laser scanning wafer inspection using nonlinear optical phenomena
- Publication number 20020109110
- Publication date Aug 15, 2002
- APPLIED MATERIALS, INC.
- Daniel I. Some
- G01 - MEASURING TESTING
Information Patent Application
Method of and apparatus for article inspection including speckle re...
- Publication number 20020080348
- Publication date Jun 27, 2002
- APPLIED MATERIALS, INC.
- Avner Karpol
- G01 - MEASURING TESTING
Information Patent Application
Method of and apparatus for article inspection including speckle re...
- Publication number 20020067478
- Publication date Jun 6, 2002
- APPLIED MATERIALS, INC.
- Avner Karpol
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for article inspection including speckel reduc...
- Publication number 20020057427
- Publication date May 16, 2002
- APPLIED MATERIALS, INC.
- Avner Karpol
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for inspection of patterned semiconductor wafers
- Publication number 20020034325
- Publication date Mar 21, 2002
- APPLIED MATERIALS, INC.
- Silviu Reinhorn
- G01 - MEASURING TESTING

Silviu Reinhorn

Person

Patents Grantslast 30 patents

Particle detection assembly, system and method

Detection assembly, system and method

Position sensitive STEM detector

High resolution wafer inspection system

High resolution wafer inspection system

Method and apparatus for article inspection including speckle reduc...

Multi beam scanning with bright/dark field imaging

Multi beam scanning with bright/dark field imaging

Wafer defect detection system with traveling lens multi-beam scanner

Multi beam scanning with bright/dark field imaging

Method and apparatus for article inspection including speckle reduc...

Variable angle illumination wafer inspection system

Wafer defect detection system with traveling lens multi-beam scanner

Wafer defect detection system with traveling lens multi-beam scanner

Method and apparatus for article inspection including speckle reduc...

Laser scanning wafer inspection using nonlinear optical phenomena

Multi-beam polygon scanning system

Method and apparatus for inspection of patterned semiconductor wafers

Method of and apparatus for article inspection including speckle re...

Method of and apparatus for article inspection including speckle re...

Method and apparatus for article inspection including speckle reduc...

Method and apparatus for article inspection including speckle reduc...

Method and apparatus for inspection of patterned semiconductor wafers

Compact planar optical correlator

Compact optical crossbar switch

Planar holographic optical device

Patents Applicationslast 30 patents

PARTICLE DETECTION ASSEMBLY, SYSTEM AND METHOD

DETECTION ASSEMBLY, SYSTEM AND METHOD

POSITION SENSITIVE STEM DETECTOR

WAFER INSPECTION SYSTEM

HIGH RESOLUTION WAFER INSPECTION SYSTEM

HIGH RESOLUTION WAFER INSPECTION SYSTEM

Collapsible portable display

Collapsible portable display

Multi beam scanning with bright/dark field imaging

Wafer inspection system

Method and apparatus for article inspection including speckle reduc...

Multi beam scanning with bright/dark field imaging

MULTI BEAM SCANNING WITH BRIGHT/DARK FIELD IMAGING

Method and apparatus for article inspection including speckle reduc...

Wafer defect detection system with traveling lens multi-beam scanner

Wafer defect detection system with traveling lens multi-beam scanner

Method and apparatus for article inspection including speckle reduc...

Multi-beam polygon scanning system

Wafer defect detection system with traveling lens multi-beam scanner

Multi beam scanning with bright/dark field imaging

Laser scanning wafer inspection using nonlinear optical phenomena

Method of and apparatus for article inspection including speckle re...

Method of and apparatus for article inspection including speckle re...

Method and apparatus for article inspection including speckel reduc...

Method and apparatus for inspection of patterned semiconductor wafers