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Siming Lin
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Austin, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Shape feature extraction and classification
Patent number
7,668,376
Issue date
Feb 23, 2010
National Instruments Corporation
Siming Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automatic wafer edge inspection and review system
Patent number
7,508,504
Issue date
Mar 24, 2009
Accretech USA, Inc.
Ju Jin
G01 - MEASURING TESTING
Information
Patent Grant
System and method for color characterization using fuzzy pixel clas...
Patent number
7,046,842
Issue date
May 16, 2006
National Instruments Corporation
Siming Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Locating regions in a target image using color match, luminance pat...
Patent number
7,039,229
Issue date
May 2, 2006
National Instruments Corporation
Siming Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for locating color and pattern match regions in a...
Patent number
6,963,425
Issue date
Nov 8, 2005
National Instruments Corporation
Dinesh Nair
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Locating regions in a target image using color matching, luminance...
Patent number
6,944,331
Issue date
Sep 13, 2005
National Instruments Corporation
Darren R. Schmidt
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for color characterization with applications in c...
Patent number
6,757,428
Issue date
Jun 29, 2004
National Instruments Corporation
Siming Lin
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
Apparatus and Method for Wafer Edge Exclusion Measurement
Publication number
20090122304
Publication date
May 14, 2009
Accretech USA, Inc.
Ju Jin
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and Method for Wafer Edge Defects Detection
Publication number
20090116727
Publication date
May 7, 2009
Accretech USA, Inc.
Ju Jin
G01 - MEASURING TESTING
Information
Patent Application
Automatic wafer edge inspection and review system
Publication number
20080030731
Publication date
Feb 7, 2008
Accretech USA, Inc.
Ju Jin
G01 - MEASURING TESTING
Information
Patent Application
Shape feature extraction and classification
Publication number
20060008151
Publication date
Jan 12, 2006
National Instruments Corporation
Siming Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
System and method for color characterization using fuzzy pixel clas...
Publication number
20040228526
Publication date
Nov 18, 2004
Siming Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Locating regions in a target image using color matching, luminance...
Publication number
20030083850
Publication date
May 1, 2003
Darren R. Schmidt
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
System and method for color characterization using fuzzy pixel clas...
Publication number
20020102018
Publication date
Aug 1, 2002
Siming Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Locating regions in a target image using color matching, luminance...
Publication number
20020041705
Publication date
Apr 11, 2002
National Instruments Corporation
Siming Lin
G06 - COMPUTING CALCULATING COUNTING