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THROUGH SILICON VIA FABRICATION
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Publication number 20220406659
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Publication date Dec 22, 2022
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Quantinuum LLC
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Robert Edward Higashi
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H01 - BASIC ELECTRIC ELEMENTS
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THROUGH SILICON VIA FABRICATION
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Publication number 20210082759
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Publication date Mar 18, 2021
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HONEYWELL INTERNATIONAL INC.
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Robert Edward Higashi
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H01 - BASIC ELECTRIC ELEMENTS
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THROUGH SILICON VIA FABRICATION
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Publication number 20200365459
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Publication date Nov 19, 2020
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HONEYWELL INTERNATIONAL INC.
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Robert E. Higashi
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H01 - BASIC ELECTRIC ELEMENTS
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THIN FLEXIBLE CIRCUITS
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Publication number 20150053465
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Publication date Feb 26, 2015
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Honeywell International Inc.
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Daniel Youngner
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H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
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THIN FLEXIBLE CIRCUITS
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Publication number 20090223700
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Publication date Sep 10, 2009
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Honeywell International Inc.
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Daniel Youngner
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H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
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Shell flow sensor
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Publication number 20090044620
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Publication date Feb 19, 2009
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Honeywell International Inc.
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Robert E. Higashi
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G01 - MEASURING TESTING
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ELECTRIC FIELD ASSISTED SOLDER BONDING
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Publication number 20070034676
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Publication date Feb 15, 2007
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Honeywell International Inc.
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Chunbo Zhang
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B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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Analyte detector
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Publication number 20050123442
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Publication date Jun 9, 2005
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Yuandong Gu
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G01 - MEASURING TESTING
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Optical pressure sensor
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Publication number 20040244502
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Publication date Dec 9, 2004
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Daniel W. Youngner
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G01 - MEASURING TESTING
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Optical pressure sensor
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Publication number 20030117630
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Publication date Jun 26, 2003
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Daniel W. Youngner
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G01 - MEASURING TESTING