Srikanth Kommu

Person

St. Peters, MO, US

People

Patents Grantslast 30 patents

Information Patent Grant
High resistivity semiconductor-on-insulator wafer and a method of m...
- Patent number 11,699,615
- Issue date Jul 11, 2023
- GlobalWafers Co., Ltd.
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resistivity SOI wafers and a method of manufacturing thereof
- Patent number 11,594,446
- Issue date Feb 28, 2023
- GlobalWafers Co., Ltd.
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resistivity semiconductor-on-insulator wafer and a method of m...
- Patent number 11,139,198
- Issue date Oct 5, 2021
- GlobalWafers Co., Ltd.
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resistivity SOI wafers and a method of manufacturing thereof
- Patent number 11,081,386
- Issue date Aug 3, 2021
- GlobalWafers Co., Ltd.
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for assessing semiconductor structures
- Patent number 11,081,407
- Issue date Aug 3, 2021
- GlobalWafers Co., Ltd.
- Igor Rapoport
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resistivity SOI wafers and a method of manufacturing thereof
- Patent number 10,910,257
- Issue date Feb 2, 2021
- GlobalWafers Co., Ltd.
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for assessing semiconductor structures
- Patent number 10,490,464
- Issue date Nov 26, 2019
- GlobalWafers Co., Ltd.
- Igor Rapoport
- G01 - MEASURING TESTING
Information Patent Grant
High resistivity semiconductor-on-insulator wafer and a method of m...
- Patent number 10,483,152
- Issue date Nov 19, 2019
- GlobalWafers Co., Ltd.
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resistivity silicon-on-insulator substrate comprising a charge...
- Patent number 10,468,294
- Issue date Nov 5, 2019
- GlobalWafers Co., Ltd.
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing high resistivity semiconductor-on-insulator...
- Patent number 10,381,261
- Issue date Aug 13, 2019
- GlobalWafers Co., Ltd.
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing high resistivity semiconductor-on-insulator...
- Patent number 10,381,260
- Issue date Aug 13, 2019
- GlobalWafers Co., Inc.
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resistivity SOI wafers and a method of manufacturing thereof
- Patent number 10,079,170
- Issue date Sep 18, 2018
- GlobalWafers Co., Ltd.
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process flow for manufacturing semiconductor on insulator structure...
- Patent number 9,831,115
- Issue date Nov 28, 2017
- SunEdison Semiconductor Limited (UEN201334164H)
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Epitaxial barrel susceptor having improved thickness uniformity
- Patent number 8,404,049
- Issue date Mar 26, 2013
- MEMC Electronic Materials, Inc.
- Lance G. Hellwig
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
HIGH RESISTIVITY SEMICONDUCTOR-ON-INSULATOR WAFER AND A METHOD OF M...
- Publication number 20210384070
- Publication date Dec 9, 2021
- GLOBALWAFERS CO., LTD.
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESISTIVITY SOI WAFERS AND A METHOD OF MANUFACTURING THEREOF
- Publication number 20210327750
- Publication date Oct 21, 2021
- GLOBALWAFERS CO., LTD.
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESISTIVITY SOI WAFERS AND A METHOD OF MANUFACTURING THEREOF
- Publication number 20210005507
- Publication date Jan 7, 2021
- GLOBALWAFERS CO., LTD.
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR ASSESSING SEMICONDUCTOR STRUCTURES
- Publication number 20200058566
- Publication date Feb 20, 2020
- GLOBALWAFERS CO., LTD.
- Igor Rapoport
- G01 - MEASURING TESTING
Information Patent Application
HIGH RESISTIVITY SEMICONDUCTOR-ON-INSULATOR WAFER AND A METHOD OF M...
- Publication number 20190139818
- Publication date May 9, 2019
- GlobalWafers Co., Ltd.
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR ON INSULATOR STRUCTURE COMPRISING A BURIED HIGH RESIS...
- Publication number 20190080957
- Publication date Mar 14, 2019
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESISTIVITY SILICON-ON-INSULATOR SUBSTRATE COMPRISING A CHARGE...
- Publication number 20190027397
- Publication date Jan 24, 2019
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESISTIVITY SOI WAFERS AND A METHOD OF MANUFACTURING THEREOF
- Publication number 20180350661
- Publication date Dec 6, 2018
- GLOBALWAFERS CO., LTD.
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING HIGH RESISTIVITY SEMICONDUCTOR-ON-INSULATOR...
- Publication number 20180277421
- Publication date Sep 27, 2018
- SunEdison Semiconductor Limited (UEN201334164H)
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR ASSESSING SEMICONDUCTOR STRUCTURES
- Publication number 20180233420
- Publication date Aug 16, 2018
- SunEdison Semiconductor Limited (UEN201334164H)
- Igor Rapoport
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A METHOD OF MANUFACTURING HIGH RESISTIVITY SEMICONDUCTOR-ON-INSULAT...
- Publication number 20170338143
- Publication date Nov 23, 2017
- SunEdison Semiconductor Limited (UEN201334 164)
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESISTIVITY SEMICONDUCTOR-IN-INSULATOR WAFER AND A METHOD OF M...
- Publication number 20170316968
- Publication date Nov 2, 2017
- SunEdison Semiconductor Limited (UEN201334164H)
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESS FLOW FOR MANUFACTURING SEMICONDUCTOR ON INSULATOR STRUCTURE...
- Publication number 20170243781
- Publication date Aug 24, 2017
- SunEdison Semiconductor Limited (UEN201334164H)
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESISTIVITY SOI WAFERS AND A METHOD OF MANUFACTURING THEREOF
- Publication number 20160351437
- Publication date Dec 1, 2016
- Igor Peidous
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EPITAXIAL BARREL SUSCEPTOR HAVING IMPROVED THICKNESS UNIFORMITY
- Publication number 20090165719
- Publication date Jul 2, 2009
- MEMC Electronic Materials, Inc.
- Lance G. Hellwig
- C30 - CRYSTAL GROWTH
Information Patent Application
SUSCEPTOR FOR IMPROVING THROUGHPUT AND REDUCING WAFER DAMAGE
- Publication number 20080314319
- Publication date Dec 25, 2008
- MEMC Electronic Materials, Inc.
- Manabu Hamano
- C30 - CRYSTAL GROWTH
Information Patent Application
High throughput epitaxial growth by chemical vapor deposition
- Publication number 20030037723
- Publication date Feb 27, 2003
- MEMC Electronic Materials, Inc.
- Srikanth Kommu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
High throughput epitaxial growth by chemical vapor deposition
- Publication number 20020088389
- Publication date Jul 11, 2002
- MEMC Electronic Materials, Inc.
- Srikanth Kommu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Srikanth Kommu

Person

Patents Grantslast 30 patents

High resistivity semiconductor-on-insulator wafer and a method of m...

High resistivity SOI wafers and a method of manufacturing thereof

High resistivity semiconductor-on-insulator wafer and a method of m...

High resistivity SOI wafers and a method of manufacturing thereof

Methods for assessing semiconductor structures

High resistivity SOI wafers and a method of manufacturing thereof

Methods for assessing semiconductor structures

High resistivity semiconductor-on-insulator wafer and a method of m...

High resistivity silicon-on-insulator substrate comprising a charge...

Method of manufacturing high resistivity semiconductor-on-insulator...

Method of manufacturing high resistivity semiconductor-on-insulator...

High resistivity SOI wafers and a method of manufacturing thereof

Process flow for manufacturing semiconductor on insulator structure...

Epitaxial barrel susceptor having improved thickness uniformity

Patents Applicationslast 30 patents

HIGH RESISTIVITY SEMICONDUCTOR-ON-INSULATOR WAFER AND A METHOD OF M...

HIGH RESISTIVITY SOI WAFERS AND A METHOD OF MANUFACTURING THEREOF

HIGH RESISTIVITY SOI WAFERS AND A METHOD OF MANUFACTURING THEREOF

METHODS FOR ASSESSING SEMICONDUCTOR STRUCTURES

HIGH RESISTIVITY SEMICONDUCTOR-ON-INSULATOR WAFER AND A METHOD OF M...

SEMICONDUCTOR ON INSULATOR STRUCTURE COMPRISING A BURIED HIGH RESIS...

HIGH RESISTIVITY SILICON-ON-INSULATOR SUBSTRATE COMPRISING A CHARGE...

HIGH RESISTIVITY SOI WAFERS AND A METHOD OF MANUFACTURING THEREOF

METHOD OF MANUFACTURING HIGH RESISTIVITY SEMICONDUCTOR-ON-INSULATOR...

METHODS FOR ASSESSING SEMICONDUCTOR STRUCTURES

A METHOD OF MANUFACTURING HIGH RESISTIVITY SEMICONDUCTOR-ON-INSULAT...

HIGH RESISTIVITY SEMICONDUCTOR-IN-INSULATOR WAFER AND A METHOD OF M...

PROCESS FLOW FOR MANUFACTURING SEMICONDUCTOR ON INSULATOR STRUCTURE...

HIGH RESISTIVITY SOI WAFERS AND A METHOD OF MANUFACTURING THEREOF

EPITAXIAL BARREL SUSCEPTOR HAVING IMPROVED THICKNESS UNIFORMITY

SUSCEPTOR FOR IMPROVING THROUGHPUT AND REDUCING WAFER DAMAGE

High throughput epitaxial growth by chemical vapor deposition

High throughput epitaxial growth by chemical vapor deposition