Srivatsan Seshadri

Person

San Ramon, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for x-ray absorption spectroscopy using a crystal...
- Patent number 11,428,651
- Issue date Aug 30, 2022
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
System and method for x-ray absorption spectroscopy using a crystal...
- Patent number 11,215,572
- Issue date Jan 4, 2022
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectrometer system
- Patent number 10,976,273
- Issue date Apr 13, 2021
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray emission spectrometer system
- Patent number 10,578,566
- Issue date Mar 3, 2020
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Method of performing X-ray spectroscopy and X-ray absorption spectr...
- Patent number 10,416,099
- Issue date Sep 17, 2019
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and apparatus for x-ray microscopy
- Patent number 10,352,880
- Issue date Jul 16, 2019
- Sigray, Inc.
- Wenbing Yun
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Multi energy X-ray microscope data acquisition and image reconstruc...
- Patent number 10,335,104
- Issue date Jul 2, 2019
- Carl Zeiss X-ray Microscopy, Inc.
- Thomas A. Case
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Talbot X-ray microscope
- Patent number 10,304,580
- Issue date May 28, 2019
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray transmission spectrometer system
- Patent number 10,295,485
- Issue date May 21, 2019
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Multi energy X-ray microscope data acquisition and image reconstruc...
- Patent number 10,169,865
- Issue date Jan 1, 2019
- Carl Zeiss X-ray Microscopy, Inc.
- Thomas A. Case
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Combined confocal X-ray fluorescence and X-ray computerised tomogra...
- Patent number 9,739,729
- Issue date Aug 22, 2017
- Carl Zeiss X-ray Microscopy, Inc.
- Michael Feser
- G01 - MEASURING TESTING
Information Patent Grant
Confocal XRF-CT system for mining analysis
- Patent number 9,488,605
- Issue date Nov 8, 2016
- Carl Zeiss X-ray Microscopy, Inc.
- Michael Feser
- G01 - MEASURING TESTING
Information Patent Grant
Multi energy X-ray microscope data acquisition and image reconstruc...
- Patent number 9,128,584
- Issue date Sep 8, 2015
- Carl Zeiss X-ray Microscopy, Inc.
- Thomas A. Case
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
CD-GISAXS system and method
- Patent number 7,920,676
- Issue date Apr 5, 2011
- Xradia, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Structured anode X-ray source for X-ray microscopy
- Patent number 7,443,953
- Issue date Oct 28, 2008
- Xradia, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING A CRYSTAL...
- Publication number 20220082516
- Publication date Mar 17, 2022
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING A CRYSTAL...
- Publication number 20210356412
- Publication date Nov 18, 2021
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
X-RAY EMISSION SPECTROMETER SYSTEM
- Publication number 20190302042
- Publication date Oct 3, 2019
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
X-RAY TRANSMISSION SPECTROMETER SYSTEM
- Publication number 20190145917
- Publication date May 16, 2019
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
METHOD OF PERFORMING X-RAY SPECTROSCOPY AND X-RAY ABSORPTION SPECTR...
- Publication number 20190011379
- Publication date Jan 10, 2019
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
TALBOT X-RAY MICROSCOPE
- Publication number 20180261350
- Publication date Sep 13, 2018
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY TRANSMISSION SPECTROMETER SYSTEM
- Publication number 20170336334
- Publication date Nov 23, 2017
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR X-RAY MICROSCOPY
- Publication number 20170261442
- Publication date Sep 14, 2017
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
Multi Energy X-Ray Microscope Data Acquisition and Image Reconstruc...
- Publication number 20170109882
- Publication date Apr 20, 2017
- CARL ZEISS X-RAY MICROSCOPY, INC.
- Thomas A. Case
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Multi Energy X-Ray Microscope Data Acquisition and Image Reconstruc...
- Publication number 20150323474
- Publication date Nov 12, 2015
- CARL ZEISS X-RAY MICROSCOPY, INC.
- Thomas A. Case
- G01 - MEASURING TESTING
Information Patent Application
COMBINED CONFOCAL X-RAY FLUORESCENCE AND X-RAY COMPUTERISED TOMOGRA...
- Publication number 20150253263
- Publication date Sep 10, 2015
- CARL ZEISS X-RAY MICROSCOPY, INC.
- Michael Feser
- G01 - MEASURING TESTING
Information Patent Application
Multi Energy X-Ray Microscope Data Acquisition and Image Reconstruc...
- Publication number 20140233692
- Publication date Aug 21, 2014
- XRADIA, INC.
- Thomas A. Case
- G01 - MEASURING TESTING
Information Patent Application
Confocal XRF-CT System for Mining Analysis
- Publication number 20140072095
- Publication date Mar 13, 2014
- Michael Feser
- G01 - MEASURING TESTING
Information Patent Application
CD-GISAXS System and Method
- Publication number 20080273662
- Publication date Nov 6, 2008
- Xradia, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
Tunable x-ray fluorescence imager for multi-element analysis
- Publication number 20070108387
- Publication date May 17, 2007
- Xradia, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING

Srivatsan Seshadri

Person

Patents Grantslast 30 patents

System and method for x-ray absorption spectroscopy using a crystal...

System and method for x-ray absorption spectroscopy using a crystal...

X-ray spectrometer system

X-ray emission spectrometer system

Method of performing X-ray spectroscopy and X-ray absorption spectr...

Method and apparatus for x-ray microscopy

Multi energy X-ray microscope data acquisition and image reconstruc...

Talbot X-ray microscope

X-ray transmission spectrometer system

Multi energy X-ray microscope data acquisition and image reconstruc...

Combined confocal X-ray fluorescence and X-ray computerised tomogra...

Confocal XRF-CT system for mining analysis

Multi energy X-ray microscope data acquisition and image reconstruc...

CD-GISAXS system and method

Structured anode X-ray source for X-ray microscopy

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING A CRYSTAL...

SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING A CRYSTAL...

X-RAY EMISSION SPECTROMETER SYSTEM

X-RAY TRANSMISSION SPECTROMETER SYSTEM

METHOD OF PERFORMING X-RAY SPECTROSCOPY AND X-RAY ABSORPTION SPECTR...

TALBOT X-RAY MICROSCOPE

X-RAY TRANSMISSION SPECTROMETER SYSTEM

METHOD AND APPARATUS FOR X-RAY MICROSCOPY

Multi Energy X-Ray Microscope Data Acquisition and Image Reconstruc...

Multi Energy X-Ray Microscope Data Acquisition and Image Reconstruc...

COMBINED CONFOCAL X-RAY FLUORESCENCE AND X-RAY COMPUTERISED TOMOGRA...

Multi Energy X-Ray Microscope Data Acquisition and Image Reconstruc...

Confocal XRF-CT System for Mining Analysis

CD-GISAXS System and Method

Tunable x-ray fluorescence imager for multi-element analysis