Stefan Florek

Person

Berlin, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Spectrometer arrangement
- Patent number 8,873,048
- Issue date Oct 28, 2014
- Leibniz-Institut fur Analytische Wissenschaften - ISAS - e.V.
- Stefan Florek
- G01 - MEASURING TESTING
Information Patent Grant
Echelle spectrometer arrangement using internal predispersion
- Patent number 8,681,329
- Issue date Mar 25, 2014
- Leibniz—Institut für Analytische Wissenschaften—ISAS—e.V.
- Helmut Becker-Roβ
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer assembly
- Patent number 8,102,527
- Issue date Jan 24, 2012
- Leibniz-Institut fur Analytische
- Helmut Becker-Ross
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining background and correction of broadband backg...
- Patent number 7,876,435
- Issue date Jan 25, 2011
- Leibniz-Institut fur Analytische Wissenschaften - ISAS - e.V.
- Helmut Becker-Ross
- G01 - MEASURING TESTING
Information Patent Grant
Echelle spectometer with improved use of the detector by means of t...
- Patent number 7,804,593
- Issue date Sep 28, 2010
- Leibniz-Institut fur Analytische Wissenschaften - ISAS - e.V.
- Helmut Becker-Roβ
- G01 - MEASURING TESTING
Information Patent Grant
Method for the analysis of echelle spectra
- Patent number 7,319,519
- Issue date Jan 15, 2008
- Gesellschaft zur Förderung angewandter Optik, Optoelektronik, Quantenelektron...
- Stefan Florek
- G01 - MEASURING TESTING
Information Patent Grant
Assembly and method for wavelength calibration in an echelle spectr...
- Patent number 7,215,422
- Issue date May 8, 2007
- Gesellschaft zur Förderung der Analytischen Wissenschaften e.V.
- Stefan Florek
- G01 - MEASURING TESTING
Information Patent Grant
High-resolution littrow spectrometer and method for the quasi-simul...
- Patent number 6,717,670
- Issue date Apr 6, 2004
- Gesellschaft zur Förderung der Spektrochemie und angewandten Spectroskopie e.V.
- Helmut Becker-Ross
- G01 - MEASURING TESTING
Information Patent Grant
Echelle polychromator
- Patent number 5,448,351
- Issue date Sep 5, 1995
- Bodenseewerk Perkin-Elmer GmbH
- Stefan Florek
- G01 - MEASURING TESTING
Information Patent Grant
Echelle polychromator
- Patent number 5,189,486
- Issue date Feb 23, 1993
- Zentralinstitut fur Optik und Spektroskopie
- Stefan Florek
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer
- Patent number 5,182,609
- Issue date Jan 26, 1993
- Zentralinstitut fur Optik und Spektroskopie
- Stefan Florek
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPECTROMETER ARRANGEMENT
- Publication number 20120262713
- Publication date Oct 18, 2012
- Leibniz Institut fur Analytische Wissenschaften- ISAS-e.V.
- Stefan Florek
- G01 - MEASURING TESTING
Information Patent Application
ECHELLE SPECTROMETER ARRANGEMENT USING INTERNAL PREDISPERSION
- Publication number 20110285993
- Publication date Nov 24, 2011
- Leibniz Institut fur Analytische Wissenschaften- ISAS-e.V.
- Helmut Becker-Ross
- G01 - MEASURING TESTING
Information Patent Application
Spectrometer Assembly
- Publication number 20100171953
- Publication date Jul 8, 2010
- Gesellschaft zur Forderung der analytischen Wissenschaften e.V.
- Helmut Becker-Ross
- G01 - MEASURING TESTING
Information Patent Application
Method for determining background and correction of broadband backg...
- Publication number 20080106735
- Publication date May 8, 2008
- Helmut Becker-Ross
- G01 - MEASURING TESTING
Information Patent Application
Echelle Spectometer with Improved Use of the Detector by Means of T...
- Publication number 20080094626
- Publication date Apr 24, 2008
- Helmut Becker-Ross
- G01 - MEASURING TESTING
Information Patent Application
Assembly and method for wavelength calibration in an echelle spectr...
- Publication number 20050157293
- Publication date Jul 21, 2005
- Stefan Florek
- G01 - MEASURING TESTING
Information Patent Application
Method for the analysis of echelle spectra
- Publication number 20040114139
- Publication date Jun 17, 2004
- Stefan Florek
- G01 - MEASURING TESTING
Information Patent Application
High-resolution littrow spectrometer and method for the quasi-simul...
- Publication number 20020180969
- Publication date Dec 5, 2002
- Helmut Becker-Ross
- G01 - MEASURING TESTING

Stefan Florek

Person

Patents Grantslast 30 patents

Spectrometer arrangement

Echelle spectrometer arrangement using internal predispersion

Spectrometer assembly

Method for determining background and correction of broadband backg...

Echelle spectometer with improved use of the detector by means of t...

Method for the analysis of echelle spectra

Assembly and method for wavelength calibration in an echelle spectr...

High-resolution littrow spectrometer and method for the quasi-simul...

Echelle polychromator

Echelle polychromator

Spectrometer

Patents Applicationslast 30 patents

SPECTROMETER ARRANGEMENT

ECHELLE SPECTROMETER ARRANGEMENT USING INTERNAL PREDISPERSION

Spectrometer Assembly

Method for determining background and correction of broadband backg...

Echelle Spectometer with Improved Use of the Detector by Means of T...

Assembly and method for wavelength calibration in an echelle spectr...

Method for the analysis of echelle spectra

High-resolution littrow spectrometer and method for the quasi-simul...