Stefan Kreissig

Person

Venusberg, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Probe holder
- Patent number 8,402,848
- Issue date Mar 26, 2013
- Cascade Microtech, Inc.
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Probe station for testing semiconductor substrates and comprising E...
- Patent number 8,278,951
- Issue date Oct 2, 2012
- Cascade Microtech, Inc.
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Prober for testing magnetically sensitive components
- Patent number 7,741,860
- Issue date Jun 22, 2010
- SUSS MicroTec Test Systems GmbH
- Sebastian Giessmann
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for controlling the temperature of electronic...
- Patent number 7,671,615
- Issue date Mar 2, 2010
- SUSS MicroTec Tech Systems GmbH
- Carel van de Beek
- G01 - MEASURING TESTING
Information Patent Grant
Probe support with shield for the examination of test substrates un...
- Patent number 7,652,491
- Issue date Jan 26, 2010
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Probe holder for a probe for testing semiconductor components
- Patent number 7,579,849
- Issue date Aug 25, 2009
- SUSS MicroTec Test Systems GmbH
- Jorg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Probe station and method for measurements of semiconductor devices...
- Patent number 7,579,854
- Issue date Aug 25, 2009
- SUSS MicroTec Test Systems GmbH
- Jörg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Adapter for positioning of contact tips
- Patent number 7,463,044
- Issue date Dec 9, 2008
- SUSS MicroTec Test Systems GmbH
- Steffen Schott
- G01 - MEASURING TESTING
Information Patent Grant
Device for testing thin elements
- Patent number 7,282,930
- Issue date Oct 16, 2007
- SUSS MicroTec Test Systems GmbH
- Uwe Beier
- G01 - MEASURING TESTING
Information Patent Grant
Procedure for reproduction of a calibration position of an aligned...
- Patent number 7,265,536
- Issue date Sep 4, 2007
- SUSS MicroTec Test Systems GmbH
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Probe station comprising a bellows with EMI shielding capabilities
- Patent number 7,235,990
- Issue date Jun 26, 2007
- SUSS MicroTec Test Systems GmbH
- Stefan Kreissig
- G01 - MEASURING TESTING
Information Patent Grant
Method and prober for contacting a contact area with a contact tip
- Patent number 7,057,408
- Issue date Jun 6, 2006
- SUSS MicroTec Test Systems (GmbH)
- Stefan Schneidewind
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus with loading device
- Patent number 7,038,441
- Issue date May 2, 2006
- SUSS MicroTec Testsystems GmbH
- Karsten Stoll
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE HOLDER
- Publication number 20100294053
- Publication date Nov 25, 2010
- SUSS MicroTec Test Systems GmbH
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND ARRANGEMENT FOR POSITIONING A PROBE CARD
- Publication number 20090085595
- Publication date Apr 2, 2009
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Application
PROBER FOR TESTING COMPONENTS
- Publication number 20090058442
- Publication date Mar 5, 2009
- SUSS MicroTec Test Systems GmbH
- Sebastian GIESSMANN
- G01 - MEASURING TESTING
Information Patent Application
MICROMANIPULATOR FOR MOVING A PROBE
- Publication number 20090049944
- Publication date Feb 26, 2009
- SUSS MicroTec Test Systems GmbH
- Jorg Kiesewetter
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
METHOD AND ARRANGEMENT FOR POSITIONING A PROBE CARD
- Publication number 20090021275
- Publication date Jan 22, 2009
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Application
PROBE STATION AND METHOD FOR MEASUREMENTS OF SEMICONDUCTOR DEVICES...
- Publication number 20080143365
- Publication date Jun 19, 2008
- SUSS Micro Tec Test Systems GmbH
- Jorg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Application
PROBE HOLDER FOR A PROBE FOR TESTING SEMICONDUCTOR COMPONENTS
- Publication number 20080122468
- Publication date May 29, 2008
- SUSS MicroTec Test Systems GmbH
- Jorg KIESEWETTER
- G01 - MEASURING TESTING
Information Patent Application
PROBE SUPPORT AND PROCESS FOR THE EXAMINATION OF TEST SUBSTRATES UN...
- Publication number 20080116917
- Publication date May 22, 2008
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Application
PROBE STATION TO TESTING SEMICONDUCTOR SUBSTRATES AND COMPRISING EM...
- Publication number 20080116918
- Publication date May 22, 2008
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR CONTROLLING THE TEMPERATURE OF ELECTRONIC...
- Publication number 20080042679
- Publication date Feb 21, 2008
- SUSS MicroTec Test Systems GmbH
- Carel van de Beek
- G01 - MEASURING TESTING
Information Patent Application
ADAPTER FOR POSITIONING OF CONTACT TIPS
- Publication number 20070296402
- Publication date Dec 27, 2007
- SUSS MicroTec Test Systems GmbH
- Steffen Schott
- G01 - MEASURING TESTING
Information Patent Application
Device for testing thin elements
- Publication number 20070139067
- Publication date Jun 21, 2007
- SUSS MicroTec Test Systems GmbH
- Uwe Beier
- G01 - MEASURING TESTING
Information Patent Application
PROBE STATION COMPRISING A BELLOWS WITH EMI SHIELDING CAPABILITIES
- Publication number 20070132465
- Publication date Jun 14, 2007
- SUSS MicroTec Test Systems GmbH
- Stefan Kreissig
- G01 - MEASURING TESTING
Information Patent Application
Procedure for reproduction of a calibration position of an aligned...
- Publication number 20060212248
- Publication date Sep 21, 2006
- SUSS MicroTec Test Systems GmbH
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Application
Method and prober for contacting a contact area with a contact tip
- Publication number 20050007135
- Publication date Jan 13, 2005
- Stefan Schneidewind
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus with loading device
- Publication number 20040108847
- Publication date Jun 10, 2004
- Karsten Stoll
- G01 - MEASURING TESTING

Stefan Kreissig

Person

Patents Grantslast 30 patents

Probe holder

Probe station for testing semiconductor substrates and comprising E...

Prober for testing magnetically sensitive components

Method and apparatus for controlling the temperature of electronic...

Probe support with shield for the examination of test substrates un...

Probe holder for a probe for testing semiconductor components

Probe station and method for measurements of semiconductor devices...

Adapter for positioning of contact tips

Device for testing thin elements

Procedure for reproduction of a calibration position of an aligned...

Probe station comprising a bellows with EMI shielding capabilities

Method and prober for contacting a contact area with a contact tip

Test apparatus with loading device

Patents Applicationslast 30 patents

PROBE HOLDER

METHOD AND ARRANGEMENT FOR POSITIONING A PROBE CARD

PROBER FOR TESTING COMPONENTS

MICROMANIPULATOR FOR MOVING A PROBE

METHOD AND ARRANGEMENT FOR POSITIONING A PROBE CARD

PROBE STATION AND METHOD FOR MEASUREMENTS OF SEMICONDUCTOR DEVICES...

PROBE HOLDER FOR A PROBE FOR TESTING SEMICONDUCTOR COMPONENTS

PROBE SUPPORT AND PROCESS FOR THE EXAMINATION OF TEST SUBSTRATES UN...

PROBE STATION TO TESTING SEMICONDUCTOR SUBSTRATES AND COMPRISING EM...

METHOD AND APPARATUS FOR CONTROLLING THE TEMPERATURE OF ELECTRONIC...

ADAPTER FOR POSITIONING OF CONTACT TIPS

Device for testing thin elements

PROBE STATION COMPRISING A BELLOWS WITH EMI SHIELDING CAPABILITIES

Procedure for reproduction of a calibration position of an aligned...

Method and prober for contacting a contact area with a contact tip

Test apparatus with loading device