Stephanie W. Butler

Person

Plano, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Visual identification of semiconductor dies
- Patent number 10,431,551
- Issue date Oct 1, 2019
- Texas Instruments Incorporated
- Kenneth Michael Butler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Visual identification of semiconductor dies
- Patent number 9,899,332
- Issue date Feb 20, 2018
- Texas Instruments Incorporated
- Kenneth Michael Butler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test method and system for characterizing and/or refining an IC des...
- Patent number 8,051,398
- Issue date Nov 1, 2011
- Texas Instruments Incorporated
- Clive D. Bittlestone
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for increasing the extent of built-in self-testin...
- Patent number 7,793,186
- Issue date Sep 7, 2010
- Texas Instruments Incorporated
- Cloves R. Cleavelin
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for increasing the extent of built-in self-testin...
- Patent number 7,752,518
- Issue date Jul 6, 2010
- Texas Instruments Incorporated
- Cloves R. Cleavelin
- G11 - INFORMATION STORAGE
Information Patent Grant
Annealing to improve edge roughness in semiconductor technology
- Patent number 7,704,883
- Issue date Apr 27, 2010
- Texas Instruments Incorporated
- Stephanie W. Butler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and devices employing metal layers in gates to introduce ch...
- Patent number 7,531,398
- Issue date May 12, 2009
- Texas Instruments Incorporated
- Zhibo Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Complementary junction-narrowing implants for ultra-shallow junctions
- Patent number 7,345,355
- Issue date Mar 18, 2008
- Texas Instruments Incorporated
- Amitabh Jain
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Source drain and extension dopant concentration
- Patent number 6,812,073
- Issue date Nov 2, 2004
- Texas Instrument Incorporated
- Haowen Bu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Complementary junction-narrowing implants for ultra-shallow junctions
- Patent number 6,808,997
- Issue date Oct 26, 2004
- Texas Instruments Incorporated
- Amitabh Jain
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for fabricating transistor gate structures
- Patent number 6,787,425
- Issue date Sep 7, 2004
- Texas Instruments Incorporated
- Antonio Luis Pacheco Rotondaro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Virtual sensor based monitoring and fault detection/classification...
- Patent number 5,864,773
- Issue date Jan 26, 1999
- Texas Instruments Incorporated
- Gabriel G. Barna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for model based process control
- Patent number 5,838,595
- Issue date Nov 17, 1998
- Texas Instruments, Inc.
- Michael Francis Sullivan
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for process endpoint prediction based on actua...
- Patent number 5,503,707
- Issue date Apr 2, 1996
- Texas Instruments Incorporated
- Sonny Maung
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and system for identifying process conditions
- Patent number 5,458,732
- Issue date Oct 17, 1995
- Texas Instruments Incorporated
- Stephanie W. Butler
- B24 - GRINDING POLISHING
Information Patent Grant
Apparatus and method for model based process control
- Patent number 5,402,367
- Issue date Mar 28, 1995
- Texas Instruments, Incorporated
- Michael F. Sullivan
- G05 - CONTROLLING REGULATING
Information Patent Grant
System and method for monitoring and evaluating semiconductor wafer...
- Patent number 5,399,229
- Issue date Mar 21, 1995
- Texas Instruments Incorporated
- Jerry A. Stefani
- B24 - GRINDING POLISHING

Patents Applicationslast 30 patents

Information Patent Application
VISUAL IDENTIFICATION OF SEMICONDUCTOR DIES
- Publication number 20180130754
- Publication date May 10, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Kenneth Michael Butler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VISUAL IDENTIFICATION OF SEMICONDUCTOR DIES
- Publication number 20170243831
- Publication date Aug 24, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Kenneth Michael Butler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Increasing the Extent of Built-In Self-Testin...
- Publication number 20100229056
- Publication date Sep 9, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Cloves R. Cleavelin
- G11 - INFORMATION STORAGE
Information Patent Application
System and Method for Increasing the Extent of Built-In Self-Testin...
- Publication number 20090204861
- Publication date Aug 13, 2009
- Cloves R. Cleavelin
- G11 - INFORMATION STORAGE
Information Patent Application
Test Method and System for Characterizing and/or Refining an IC Des...
- Publication number 20090037854
- Publication date Feb 5, 2009
- Clive D. Bittlestone
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STACKED POLY STRUCTURE TO REDUCE THE POLY PARTICLE COUNT IN ADVANCE...
- Publication number 20080251864
- Publication date Oct 16, 2008
- Yuanning Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANNEALING TO IMPROVE EDGE ROUGHNESS IN SEMICONDUCTOR TECHNOLOGY
- Publication number 20080150045
- Publication date Jun 26, 2008
- TEXAS INSTRUMENTS INCORPORATED
- Stephanie W. Butler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and devices employing metal layers in gates to introduce ch...
- Publication number 20080096338
- Publication date Apr 24, 2008
- TEXAS INSTRUMENTS INCORPORATED
- Zhibo Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Source drain and extension dopant concentration
- Publication number 20050189660
- Publication date Sep 1, 2005
- Haowen Bu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Complementary junction-narrowing implants for ultra-shallow junctions
- Publication number 20050042848
- Publication date Feb 24, 2005
- Amitabh Jain
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPLEMENTARY JUNCTION-NARROWING IMPLANTS FOR ULTRA-SHALLOW JUNCTIONS
- Publication number 20040185633
- Publication date Sep 23, 2004
- TEXAS INSTRUMENTS INCORPORATED
- Amitabh Jain
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOURCE DRAIN AND EXTENSION DOPANT CONCENTRATION
- Publication number 20040110352
- Publication date Jun 10, 2004
- TEXAS INSTRUMENTS INCORPORATED
- Haowen Bu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Reduction of seed layer roughness for use in forming SiGe gate elec...
- Publication number 20040067631
- Publication date Apr 8, 2004
- Haowen Bu
- H01 - BASIC ELECTRIC ELEMENTS

Stephanie W. Butler

Person

Patents Grantslast 30 patents

Visual identification of semiconductor dies

Visual identification of semiconductor dies

Test method and system for characterizing and/or refining an IC des...

System and method for increasing the extent of built-in self-testin...

System and method for increasing the extent of built-in self-testin...

Annealing to improve edge roughness in semiconductor technology

Methods and devices employing metal layers in gates to introduce ch...

Complementary junction-narrowing implants for ultra-shallow junctions

Source drain and extension dopant concentration

Complementary junction-narrowing implants for ultra-shallow junctions

Methods for fabricating transistor gate structures

Virtual sensor based monitoring and fault detection/classification...

Apparatus and method for model based process control

Method and apparatus for process endpoint prediction based on actua...

Method and system for identifying process conditions

Apparatus and method for model based process control

System and method for monitoring and evaluating semiconductor wafer...

Patents Applicationslast 30 patents

VISUAL IDENTIFICATION OF SEMICONDUCTOR DIES

VISUAL IDENTIFICATION OF SEMICONDUCTOR DIES

System and Method for Increasing the Extent of Built-In Self-Testin...

System and Method for Increasing the Extent of Built-In Self-Testin...

Test Method and System for Characterizing and/or Refining an IC Des...

STACKED POLY STRUCTURE TO REDUCE THE POLY PARTICLE COUNT IN ADVANCE...

ANNEALING TO IMPROVE EDGE ROUGHNESS IN SEMICONDUCTOR TECHNOLOGY

Methods and devices employing metal layers in gates to introduce ch...

Source drain and extension dopant concentration

Complementary junction-narrowing implants for ultra-shallow junctions

COMPLEMENTARY JUNCTION-NARROWING IMPLANTS FOR ULTRA-SHALLOW JUNCTIONS

SOURCE DRAIN AND EXTENSION DOPANT CONCENTRATION

Reduction of seed layer roughness for use in forming SiGe gate elec...