Stephen Arlon MEISNER

Person

Allen, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated circuits having dielectric layers including an anti-refl...
- Patent number 12,002,846
- Issue date Jun 4, 2024
- Texas Instruments Incorporated
- Poornika Fernandes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuits having dielectric layers including an anti-refl...
- Patent number 11,171,200
- Issue date Nov 9, 2021
- Texas Instruments Incorporated
- Poornika Fernandes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit with scribe lane patterns for defect reduction
- Patent number 11,094,644
- Issue date Aug 17, 2021
- Texas Instruments Incorporated
- Adrian Salinas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analog capacitor on submicron pitch metal level
- Patent number 10,608,075
- Issue date Mar 31, 2020
- Texas Instruments Incorporated
- Bhaskar Srinivasan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analog capacitor on submicron pitch metal level
- Patent number 10,177,215
- Issue date Jan 8, 2019
- Texas Instruments Incorporated
- Bhaskar Srinivasan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Increasing exposure tool alignment signal strength for a ferroelect...
- Patent number 8,586,130
- Issue date Nov 19, 2013
- Texas Instruments Incorporated
- Stephen Arion Meisner
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Increasing exposure tool alignment signal strength for a ferroelect...
- Patent number 8,466,569
- Issue date Jun 18, 2013
- Texas Instruments Incorporated
- Stephen Arlon Meisner
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Capacitor contact formed concurrently with bond pad metallization
- Patent number 8,431,463
- Issue date Apr 30, 2013
- Texas Instruments Incorporated
- Maxwell Walthour Lippitt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Alignment mark for opaque layer
- Patent number 8,324,742
- Issue date Dec 4, 2012
- Texas Instruments Incorporated
- Scott R. Summerfelt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Alignment mark for opaque layer
- Patent number 8,268,696
- Issue date Sep 18, 2012
- Texas Instruments Incorporated
- Scott R. Summerfelt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for removing contaminants from aluminum-comprising bond pad...
- Patent number 8,236,703
- Issue date Aug 7, 2012
- Texas Instruments Incorporated
- Alfred J. Griffin, Jr.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Unique method for manufacturing a digital micromirror device and a...
- Patent number 7,450,297
- Issue date Nov 11, 2008
- Texas Instruments Incorporated
- Anthony DiCarlo
- G02 - OPTICS
Information Patent Grant
Multiple purpose reticle layout for selective printing of test circ...
- Patent number 6,893,806
- Issue date May 17, 2005
- Agere Systems, INC
- Cheryl Anne Bollinger
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT HAVING IMPROVED ASML ALIGNMENT MARKS
- Publication number 20230134102
- Publication date May 4, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Stephen Arlon Meisner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUITS HAVING DIELECTRIC LAYERS INCLUDING AN ANTI-REFL...
- Publication number 20220069067
- Publication date Mar 3, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Poornika FERNANDES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT WITH SCRIBE LANE PATTERNS FOR DEFECT REDUCTION
- Publication number 20210398910
- Publication date Dec 23, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Adrian SALINAS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT WITH SCRIBE LANE PATTERNS FOR DEFECT REDUCTION
- Publication number 20210104468
- Publication date Apr 8, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Adrian SALINAS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUITS HAVING DIELECTRIC LAYERS INCLUDING AN ANTI-REFL...
- Publication number 20210098565
- Publication date Apr 1, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Poornika FERNANDES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALOG CAPACITOR ON SUBMICRON PITCH METAL LEVEL
- Publication number 20190157379
- Publication date May 23, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Bhaskar Srinivasan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ALIGNMENT MARK FOR OPAQUE LAYER
- Publication number 20110306176
- Publication date Dec 15, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Scott R. Summerfelt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Process and Method for a Decoupled Multi-Parameter Run-to-Run Contr...
- Publication number 20110029119
- Publication date Feb 3, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Madhu Sudan RAMAVAJJALA
- G05 - CONTROLLING REGULATING
Information Patent Application
Increasing Exposure Tool Alignment Signal Strength for a Ferroelect...
- Publication number 20110014360
- Publication date Jan 20, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Stephen Arion Meisner
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
CAPACITOR CONTACT FORMED CONCURRENTLY WITH BOND PAD METALLIZATION
- Publication number 20100032803
- Publication date Feb 11, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Maxwell Walthour Lippitt, III
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ALIGNMENT MARK FOR OPAQUE LAYER
- Publication number 20090243122
- Publication date Oct 1, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Scott R. Summerfelt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Increasing Exposure Tool Alignment Signal Strength for a Ferroelect...
- Publication number 20090243123
- Publication date Oct 1, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Stephen Arlon Meisner
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS FOR REMOVING CONTAMINANTS FROM ALUMINUM-COMPRISING BOND PAD...
- Publication number 20090068847
- Publication date Mar 12, 2009
- Texas Instruments Inc.
- Alfred J. Griffin, JR.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Unique Method for Manufacturing a Digital Micromirror Device and a...
- Publication number 20090040592
- Publication date Feb 12, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Anthony DiCarlo
- G02 - OPTICS
Information Patent Application
Unique method for manufacturing a digital micromirror device and a...
- Publication number 20070035807
- Publication date Feb 15, 2007
- Texas Instruments, Incorporated
- Anthony DiCarlo
- G02 - OPTICS
Information Patent Application
Overlay metrology using scatterometry profiling
- Publication number 20030223066
- Publication date Dec 4, 2003
- Cynthia C. Lee
- G01 - MEASURING TESTING
Information Patent Application
Multiple purpose reticle layout for selective printing of test circ...
- Publication number 20030039928
- Publication date Feb 27, 2003
- Cheryl Anne Bollinger
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Stephen Arlon MEISNER

Person

Patents Grantslast 30 patents

Integrated circuits having dielectric layers including an anti-refl...

Integrated circuits having dielectric layers including an anti-refl...

Integrated circuit with scribe lane patterns for defect reduction

Analog capacitor on submicron pitch metal level

Analog capacitor on submicron pitch metal level

Increasing exposure tool alignment signal strength for a ferroelect...

Increasing exposure tool alignment signal strength for a ferroelect...

Capacitor contact formed concurrently with bond pad metallization

Alignment mark for opaque layer

Alignment mark for opaque layer

Methods for removing contaminants from aluminum-comprising bond pad...

Unique method for manufacturing a digital micromirror device and a...

Multiple purpose reticle layout for selective printing of test circ...

Patents Applicationslast 30 patents

INTEGRATED CIRCUIT HAVING IMPROVED ASML ALIGNMENT MARKS

INTEGRATED CIRCUITS HAVING DIELECTRIC LAYERS INCLUDING AN ANTI-REFL...

INTEGRATED CIRCUIT WITH SCRIBE LANE PATTERNS FOR DEFECT REDUCTION

INTEGRATED CIRCUIT WITH SCRIBE LANE PATTERNS FOR DEFECT REDUCTION

INTEGRATED CIRCUITS HAVING DIELECTRIC LAYERS INCLUDING AN ANTI-REFL...

ANALOG CAPACITOR ON SUBMICRON PITCH METAL LEVEL

ALIGNMENT MARK FOR OPAQUE LAYER

Process and Method for a Decoupled Multi-Parameter Run-to-Run Contr...

Increasing Exposure Tool Alignment Signal Strength for a Ferroelect...

CAPACITOR CONTACT FORMED CONCURRENTLY WITH BOND PAD METALLIZATION

ALIGNMENT MARK FOR OPAQUE LAYER

Increasing Exposure Tool Alignment Signal Strength for a Ferroelect...

METHODS FOR REMOVING CONTAMINANTS FROM ALUMINUM-COMPRISING BOND PAD...

Unique Method for Manufacturing a Digital Micromirror Device and a...

Unique method for manufacturing a digital micromirror device and a...

Overlay metrology using scatterometry profiling

Multiple purpose reticle layout for selective printing of test circ...