Stephen C. Minne

Person

Danville, IL, US

People

Patents Grantslast 30 patents

Information Patent Grant
Registration degradation correction for surgical navigation procedures
- Patent number 12,090,004
- Issue date Sep 17, 2024
- Digital Surgery Systems, Inc.
- George C. Polchin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Indicating a status of an analytical instrument on a screen of the...
- Patent number 11,965,900
- Issue date Apr 23, 2024
- Wyatt Technology, LLC
- Vivianna Day
- G01 - MEASURING TESTING
Information Patent Grant
High throughput method and apparatus for measuring multiple optical...
- Patent number 11,892,402
- Issue date Feb 6, 2024
- Wyatt Technology, LLC
- Vincent Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
High throughput method and apparatus for measuring multiple optical...
- Patent number 10,942,120
- Issue date Mar 9, 2021
- WYATT TECHNOLOGY CORPORATION
- Vincent Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
High throughput method and apparatus for measuring multiple optical...
- Patent number 10,473,591
- Issue date Nov 12, 2019
- WYATT TECHNOLOGY CORPORATION
- Vincent Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Chemical nano-identification of a sample using normalized near-fiel...
- Patent number 9,933,453
- Issue date Apr 3, 2018
- Bruker Nano, Inc.
- Gregory Andreev
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of electrical property measurement using an AF...
- Patent number 9,869,694
- Issue date Jan 16, 2018
- Bruker Nano, Inc.
- Chunzeng Li
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Chemical nano-identification of a sample using normalized near-fiel...
- Patent number 9,846,178
- Issue date Dec 19, 2017
- Bruker Nano, Inc.
- Gregory Andreev
- G01 - MEASURING TESTING
Information Patent Grant
Chemical nano-identification of a sample using normalized near-fiel...
- Patent number 9,448,252
- Issue date Sep 20, 2016
- BRUKER NANO, INCORPORATED
- Gregory Andreev
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of electrical property measurement using an AF...
- Patent number 9,213,047
- Issue date Dec 15, 2015
- Bruker Nano, Inc.
- Chunzeng Li
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of physical property measurement using a probe...
- Patent number 9,052,336
- Issue date Jun 9, 2015
- Bruker Nano, Inc.
- Markus B. Raschke
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of physical property measurement using a probe...
- Patent number 8,881,311
- Issue date Nov 4, 2014
- Bruker Nano, Inc.
- Markus B. Raschke
- G01 - MEASURING TESTING
Information Patent Grant
Method of fabricating a surface probing device
- Patent number 7,691,661
- Issue date Apr 6, 2010
- Veeco Instruments, Inc.
- Stephen C. Minne
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic activation for an atomic force microscope and method of use...
- Patent number 7,204,131
- Issue date Apr 17, 2007
- Veeco Instruments Inc.
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic activation for an atomic force microscope and method of use...
- Patent number 7,036,357
- Issue date May 2, 2006
- Veeco Instruments Inc.
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Grant
Active probe for an atomic force microscope and method for use thereof
- Patent number 7,017,398
- Issue date Mar 28, 2006
- Veeco Instruments Inc.
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Grant
Three-axis sensor assembly for use in an elastomeric material
- Patent number 6,951,143
- Issue date Oct 4, 2005
- Michelin Recherche et Technique S.A.
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method to compensate for stress in a microcantilever
- Patent number 6,941,823
- Issue date Sep 13, 2005
- Veeco Instruments Inc.
- Jonathan W. Lai
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for improving tuning of a probe-based instrument
- Patent number 6,912,893
- Issue date Jul 5, 2005
- Veeco Instruments Inc.
- Stephen C. Minne
- G01 - MEASURING TESTING
Information Patent Grant
Method of fabricating a surface probing device and probing device p...
- Patent number 6,886,395
- Issue date May 3, 2005
- Veeco Instruments Inc.
- Stephen C. Minne
- G01 - MEASURING TESTING
Information Patent Grant
Active probe for an atomic force microscope and method of use thereof
- Patent number 6,810,720
- Issue date Nov 2, 2004
- Veeco Instruments Inc.
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Grant
Direct DNA sequencing with a transcription protein and a nanometer...
- Patent number 6,770,472
- Issue date Aug 3, 2004
- The Board of Trustees of the Leland Stanford Junior University
- Scott R. Manalis
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Dynamic activation for an atomic force microscope and method of use...
- Patent number 6,672,144
- Issue date Jan 6, 2004
- Veeco Instruments Inc.
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Grant
Tire sensor and method
- Patent number 6,637,276
- Issue date Oct 28, 2003
- Michelin Recherche et Technique S.A.
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Grant
Active probe for an atomic force microscope and method of use thereof
- Patent number 6,530,266
- Issue date Mar 11, 2003
- NanoDevices, Inc.
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Grant
Bimorph spirals for uncooled photothermal spectroscopy
- Patent number 6,307,202
- Issue date Oct 23, 2001
- The Board of Trustees of the Leland Stanford Junior University
- Scott R. Manalis
- G01 - MEASURING TESTING
Information Patent Grant
AFM with referenced or differential height measurement
- Patent number 6,279,389
- Issue date Aug 28, 2001
- NanoDevices, Inc.
- Dennis M. Adderton
- B82 - NANO-TECHNOLOGY
Information Patent Grant
AFM with referenced or differential height measurement
- Patent number 6,196,061
- Issue date Mar 6, 2001
- NanoDevices, Inc.
- Dennis M. Adderton
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Active probe for an atomic force microscope and method of use thereof
- Patent number 6,189,374
- Issue date Feb 20, 2001
- NanoDevices, Inc.
- Dennis M. Adderton
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for making nitride cantilevers devices
- Patent number 6,156,216
- Issue date Dec 5, 2000
- The Board of Trustees of the Leland Stanford Junior University
- Scott R. Manalis
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
MICROPHONE DIRECTIONALITY CONTROL BASED ON SURGEON'S COMMAND
- Publication number 20250032199
- Publication date Jan 30, 2025
- Digital Surgery Systems, Inc.
- Saurabh Kotian
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
REGISTRATION DEGRADATION CORRECTION FOR SURGICAL NAVIGATION PROCEDURES
- Publication number 20250009466
- Publication date Jan 9, 2025
- Digital Surgery Systems, Inc.
- George C. Polchin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED SURGICAL NAVIGATION AND VISUALIZATION SYSTEM, AND METHOD...
- Publication number 20240390075
- Publication date Nov 28, 2024
- Digital Surgery Systems, Inc.
- Stephen Minne
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
AUTOMATED TOUCHLESS REGISTRATION FOR SURGICAL NAVIGATION
- Publication number 20240299100
- Publication date Sep 12, 2024
- Digital Surgery Systems, Inc.
- Stephen C. Minne
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BAYONET REGISTRATION TOOL/PROBE
- Publication number 20240238050
- Publication date Jul 18, 2024
- Digital Surgery Systems, Inc.
- Alan Fridman
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SYSTEM, METHOD, AND APPARATUS FOR TRACKING A TOOL VIA A DIGITAL SUR...
- Publication number 20240185432
- Publication date Jun 6, 2024
- Digital Surgery Systems, Inc.
- George C. Polchin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REGISTRATION DEGRADATION CORRECTION FOR SURGICAL NAVIGATION PROCEDURES
- Publication number 20230390021
- Publication date Dec 7, 2023
- Digital Surgery Systems, Inc.
- George C. Polchin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LOCALIZATION TARGET FOR A DIGITAL SURGICAL STEREOSCOPE
- Publication number 20230123717
- Publication date Apr 20, 2023
- Digital Surgery Systems, Inc.
- Thomas Kanusky
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
STEREOSCOPIC VISUALIZATION CAMERA AND INTEGRATED ROBOTICS PLATFORM...
- Publication number 20230110248
- Publication date Apr 13, 2023
- True Digital Surgery
- Hossein Faraji
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
High throughput method and apparatus for measuring multiple optical...
- Publication number 20210215608
- Publication date Jul 15, 2021
- WYATT TECHNOLOGY CORPORATION
- Vincent Hsieh
- G01 - MEASURING TESTING
Information Patent Application
INDICATING A STATUS OF AN ANALYTICAL INSTRUMENT ON A SCREEN OF THE...
- Publication number 20200150137
- Publication date May 14, 2020
- WYATT TECHNOLOGY CORPORATION
- Vivianna Day
- G01 - MEASURING TESTING
Information Patent Application
High throughput method and apparatus for measuring multiple optical...
- Publication number 20200080939
- Publication date Mar 12, 2020
- WYATT TECHNOLOGY CORPORATION
- Vincent Hsieh
- G01 - MEASURING TESTING
Information Patent Application
High throughput method and apparatus for measuring multiple optical...
- Publication number 20180313758
- Publication date Nov 1, 2018
- WYATT TECHNOLOGY CORPORATION
- Vincent Hsieh
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIEL...
- Publication number 20180059136
- Publication date Mar 1, 2018
- BRUKER NANO, INC.
- Gregory Andreev
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIEL...
- Publication number 20160356809
- Publication date Dec 8, 2016
- BRUKER NANO, INC.
- Gregory Andreev
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Electrical Property Measurement Using an AF...
- Publication number 20160178659
- Publication date Jun 23, 2016
- Bruker Nano, Inc.
- Chunzeng Li
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Physical Property Measurement Using a Probe...
- Publication number 20160033547
- Publication date Feb 4, 2016
- Bruker Nano, Inc.
- Markus B. Raschke
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIEL...
- Publication number 20160018437
- Publication date Jan 21, 2016
- Bruker Nano, Inc.
- Gregory Andreev
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Physical Property Measurement Using a Probe...
- Publication number 20150067930
- Publication date Mar 5, 2015
- Bruker Nano, Inc.
- Markus B. Raschke
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Physical Property Measurement Using a Probe...
- Publication number 20140259234
- Publication date Sep 11, 2014
- Bruker Nano, Inc.
- Markus B. Raschke
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Electrical Property Measurement Using an AF...
- Publication number 20130276174
- Publication date Oct 17, 2013
- Chunzeng Li
- B82 - NANO-TECHNOLOGY
Information Patent Application
Dynamic activation for an atomic force microscope and method of use...
- Publication number 20060191329
- Publication date Aug 31, 2006
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Application
Method of fabricating a surface probing device and probing device p...
- Publication number 20050210967
- Publication date Sep 29, 2005
- Stephen C. Minne
- G01 - MEASURING TESTING
Information Patent Application
Active probe for an atomic force microscope and method for use thereof
- Publication number 20050066714
- Publication date Mar 31, 2005
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Application
Dynamic activation for an atomic force microscope and method of use...
- Publication number 20040255651
- Publication date Dec 23, 2004
- Dennis M. Adderton
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for improving tuning of a probe-based instrument
- Publication number 20040206165
- Publication date Oct 21, 2004
- NonoDevices, Inc.
- Stephen C. Minne
- G01 - MEASURING TESTING
Information Patent Application
Method of fabricating a surface probing device and probing device p...
- Publication number 20040139794
- Publication date Jul 22, 2004
- NANODEVICES, INC.
- Stephen C. Minne
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus of carbon nanotube fabrication
- Publication number 20040053440
- Publication date Mar 18, 2004
- First Nano, Inc.
- Jonathan W. Lai
- D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information Patent Application
Method and apparatus of carbon nanotube fabrication
- Publication number 20040037767
- Publication date Feb 26, 2004
- First Nano, Inc.
- Dennis M. Adderton
- D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information Patent Application
Active probe for an atomic force microscope and method of use thereof
- Publication number 20030094036
- Publication date May 22, 2003
- Dennis M. Adderton
- G01 - MEASURING TESTING

Stephen C. Minne

Person

Patents Grantslast 30 patents

Registration degradation correction for surgical navigation procedures

Indicating a status of an analytical instrument on a screen of the...

High throughput method and apparatus for measuring multiple optical...

High throughput method and apparatus for measuring multiple optical...

High throughput method and apparatus for measuring multiple optical...

Chemical nano-identification of a sample using normalized near-fiel...

Method and apparatus of electrical property measurement using an AF...

Chemical nano-identification of a sample using normalized near-fiel...

Chemical nano-identification of a sample using normalized near-fiel...

Method and apparatus of electrical property measurement using an AF...

Method and apparatus of physical property measurement using a probe...

Method and apparatus of physical property measurement using a probe...

Method of fabricating a surface probing device

Dynamic activation for an atomic force microscope and method of use...

Dynamic activation for an atomic force microscope and method of use...

Active probe for an atomic force microscope and method for use thereof

Three-axis sensor assembly for use in an elastomeric material

Apparatus and method to compensate for stress in a microcantilever

Apparatus and method for improving tuning of a probe-based instrument

Method of fabricating a surface probing device and probing device p...

Active probe for an atomic force microscope and method of use thereof

Direct DNA sequencing with a transcription protein and a nanometer...

Dynamic activation for an atomic force microscope and method of use...

Tire sensor and method

Active probe for an atomic force microscope and method of use thereof

Bimorph spirals for uncooled photothermal spectroscopy

AFM with referenced or differential height measurement

AFM with referenced or differential height measurement

Active probe for an atomic force microscope and method of use thereof

Method for making nitride cantilevers devices

Patents Applicationslast 30 patents

MICROPHONE DIRECTIONALITY CONTROL BASED ON SURGEON'S COMMAND

REGISTRATION DEGRADATION CORRECTION FOR SURGICAL NAVIGATION PROCEDURES

INTEGRATED SURGICAL NAVIGATION AND VISUALIZATION SYSTEM, AND METHOD...

AUTOMATED TOUCHLESS REGISTRATION FOR SURGICAL NAVIGATION

BAYONET REGISTRATION TOOL/PROBE

SYSTEM, METHOD, AND APPARATUS FOR TRACKING A TOOL VIA A DIGITAL SUR...

REGISTRATION DEGRADATION CORRECTION FOR SURGICAL NAVIGATION PROCEDURES

LOCALIZATION TARGET FOR A DIGITAL SURGICAL STEREOSCOPE

STEREOSCOPIC VISUALIZATION CAMERA AND INTEGRATED ROBOTICS PLATFORM...

High throughput method and apparatus for measuring multiple optical...

INDICATING A STATUS OF AN ANALYTICAL INSTRUMENT ON A SCREEN OF THE...

High throughput method and apparatus for measuring multiple optical...

High throughput method and apparatus for measuring multiple optical...

CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIEL...

CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIEL...

Method and Apparatus of Electrical Property Measurement Using an AF...

Method and Apparatus of Physical Property Measurement Using a Probe...

CHEMICAL NANO-IDENTIFICATION OF A SAMPLE USING NORMALIZED NEAR-FIEL...

Method and Apparatus of Physical Property Measurement Using a Probe...

Method and Apparatus of Physical Property Measurement Using a Probe...

Method and Apparatus of Electrical Property Measurement Using an AF...

Dynamic activation for an atomic force microscope and method of use...

Method of fabricating a surface probing device and probing device p...

Active probe for an atomic force microscope and method for use thereof

Dynamic activation for an atomic force microscope and method of use...

Apparatus and method for improving tuning of a probe-based instrument

Method of fabricating a surface probing device and probing device p...

Method and apparatus of carbon nanotube fabrication

Method and apparatus of carbon nanotube fabrication

Active probe for an atomic force microscope and method of use thereof