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Steve S. Huang
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Dallas, TX, US
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last 30 patents
Information
Patent Grant
Plasma density monitor and method
Patent number
5,760,573
Issue date
Jun 2, 1998
Texas Instruments Incorporated
Ajit Pramod Paranjpe
G01 - MEASURING TESTING
Information
Patent Grant
Plasma processing system using surface wave plasma generating appar...
Patent number
5,389,153
Issue date
Feb 14, 1995
Texas Instruments Incorporated
Ajit P. Paranjpe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor wafer heater with infrared lamp module with light blo...
Patent number
5,345,534
Issue date
Sep 6, 1994
Texas Instruments Incorporated
Habib N. Najm
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Low particulate reliability enhanced remote microwave plasma discha...
Patent number
5,262,610
Issue date
Nov 16, 1993
The United States of America as represented by the Air Force
Steve S. Huang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for integrating optical sensor into processor
Patent number
5,101,764
Issue date
Apr 7, 1992
Texas Instruments Incorporated
Lee M. Loewenstein
G01 - MEASURING TESTING
Information
Patent Grant
Distributed ECR remote plasma processing and apparatus
Patent number
4,996,077
Issue date
Feb 26, 1991
Texas Instruments Incorporated
Mehrdad M. Moslehi
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Method for etching semiconductor materials using a remote plasma ge...
Patent number
4,988,644
Issue date
Jan 29, 1991
Texas Instruments Incorporated
Rhett B. Jucha
H01 - BASIC ELECTRIC ELEMENTS