Steven J. Walker

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Monrovia, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Excess overdrive detector for probe cards
- Patent number 7,365,551
- Issue date Apr 29, 2008
- Touchdown Technologies, Inc.
- Steven J Walker
- G01 - MEASURING TESTING
Information Patent Grant
Optically enhanced probe alignment
- Patent number 7,355,422
- Issue date Apr 8, 2008
- Touchdown Technologies, Inc.
- Steven J Walker
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Excess Overdrive Detector for Probe Cards
- Publication number 20070205782
- Publication date Sep 6, 2007
- TOUCHDOWN TECHNOLOGIES, INC.
- Steven J. Walker
- G01 - MEASURING TESTING
Information Patent Application
Optically enhanced probe alignment
- Publication number 20070063716
- Publication date Mar 22, 2007
- TOUCHDOWN TECHNOLOGIES, INC.
- Steven J. Walker
- G01 - MEASURING TESTING