5. BRIEF DESCRIPTION OF THE DRAWINGS
FIGS. 1A-1C are cross-sectional views of the novel probe card with an excess overdrive detecting structure.
FIGS. 2A and 2B are cross-sectional views of the novel probe card with an excess overdrive detecting structure, where the probe card experienced excess overdrive.
FIG. 3A is a cross-sectional view of the novel probe card with an excess overdrive detecting structure, where the structure also functions as a fiducial for alignment detection.
FIG. 3B is a plan view of a novel probe card, wherein a probe is misaligned relative to excess overdrive structure on the substrate.
FIGS. 4A-4C are cross-sectional views of the novel probe card with an excess overdrive detecting structure.
FIGS. 5A and 5B are cross-sectional views of the novel probe card with an excess overdrive detecting structure, where the probe card experienced excess overdrive.
FIG. 6 is a plan view of a probe card with twenty single die probe areas and a shaded area where the probes experienced excess overdrive.
FIG. 7 is a plan view of a generic probe card.
FIG. 8 is a cross-sectional view of generic probe card.
FIGS. 9A-9C is a cross-sectional view of generic probe card, where the bending element is bending (FIG. 9B) and hits the substrate (FIG. 9C).