Steven M. McDonald

Person

Star, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods for forming and cleaning photolithography reticles
- Patent number 7,767,365
- Issue date Aug 3, 2010
- Micron Technology, Inc.
- Craig M. Carpenter
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods of fabricating substrates including one or more conductive...
- Patent number 7,603,772
- Issue date Oct 20, 2009
- Micron Technology, Inc.
- Warren M. Farnworth
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Methods of fabricating substrates including at least one conductive...
- Patent number 7,594,322
- Issue date Sep 29, 2009
- Micron Technology, Inc.
- Warren M. Farnworth
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Semiconductor structures having electrophoretically insulated vias
- Patent number 7,498,670
- Issue date Mar 3, 2009
- Micron Technology, Inc.
- Warren M. Farnworth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of forming semiconductor constructions
- Patent number 7,470,590
- Issue date Dec 30, 2008
- Micron Technology, Inc.
- Werner Juengling
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for creating electrophoretically insulated vias in semicond...
- Patent number 7,335,981
- Issue date Feb 26, 2008
- Micron Technology, Inc.
- Warren M. Farnworth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer-level redistribution circuit
- Patent number 7,329,899
- Issue date Feb 12, 2008
- Micron Technology, Inc.
- Warren M. Farnworth
- G01 - MEASURING TESTING
Information Patent Grant
Methods of fabricating substrates including at least one conductive...
- Patent number 7,316,063
- Issue date Jan 8, 2008
- Micron Technology, Inc.
- Warren M. Farnworth
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Methods of forming semiconductor constructions
- Patent number 7,115,512
- Issue date Oct 3, 2006
- Micron Technology
- Werner Juengling
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor assemblies having electrophoretically insulated vias
- Patent number 7,105,921
- Issue date Sep 12, 2006
- Micron Technology, Inc.
- Warren M. Farnworth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for creating electrophoretically insulated vias in semicond...
- Patent number 7,105,437
- Issue date Sep 12, 2006
- Micron Technology, Inc.
- Warren M. Farnworth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for creating electrophoretically insulated vias in semicond...
- Patent number 7,030,010
- Issue date Apr 18, 2006
- Micron Technology, Inc.
- Warren M. Farnworth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer-level testing apparatus and method
- Patent number 6,884,642
- Issue date Apr 26, 2005
- Micron Technology, Inc.
- Warren M. Farnworth
- G01 - MEASURING TESTING
Information Patent Grant
Method for patterning a photoresist material for semiconductor comp...
- Patent number 6,777,144
- Issue date Aug 17, 2004
- Micron Technology, Inc.
- Jeffrey W. Honeycutt
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Wafer-level testing apparatus and method
- Patent number 6,744,067
- Issue date Jun 1, 2004
- Micron Technology, Inc.
- Warren M. Farnworth
- G01 - MEASURING TESTING
Information Patent Grant
Method for providing an alignment diffraction grating for photolith...
- Patent number 6,635,396
- Issue date Oct 21, 2003
- Micron Technology, Inc.
- Jeffrey W. Honeycutt
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Isolation using an antireflective coating
- Patent number 6,605,502
- Issue date Aug 12, 2003
- Micron Technology, Inc.
- Ravi Iyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer, wafer alignment patterns and method of forming...
- Patent number 6,605,516
- Issue date Aug 12, 2003
- Mark E. Jost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for providing an alignment diffraction grating for photolith...
- Patent number 6,573,013
- Issue date Jun 3, 2003
- Micron Technology, Inc.
- Jeffrey W. Honeycutt
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Isolation using an antireflective coating
- Patent number 6,495,450
- Issue date Dec 17, 2002
- Micron Technology, Inc.
- Ravi Iyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for providing an alignment diffraction grating for photolith...
- Patent number 6,482,572
- Issue date Nov 19, 2002
- Micron Technology, Inc.
- Jeffrey W. Honeycutt
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method for providing an alignment diffraction grating for photolith...
- Patent number 6,455,212
- Issue date Sep 24, 2002
- Micron Technology, Inc.
- Jeffrey W. Honeycutt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Isolation using an antireflective coating
- Patent number 6,423,631
- Issue date Jul 23, 2002
- Micron Technology, Inc.
- Ravi Iyer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Insert testing system
- Patent number 6,313,650
- Issue date Nov 6, 2001
- Micron Technology, Inc.
- Salman Akram
- G01 - MEASURING TESTING
Information Patent Grant
Metallized recess in a substrate
- Patent number 6,248,429
- Issue date Jun 19, 2001
- Micron Technology, Inc.
- Salman Akram
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer,wafer alignment patterns and method of forming...
- Patent number 6,207,529
- Issue date Mar 27, 2001
- Micron Technology, Inc.
- Mark E. Jost
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Isolation using an antireflective coating
- Patent number 6,174,590
- Issue date Jan 16, 2001
- Micron Technology, Inc.
- Ravi Iyer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of making a metallized recess in a substrate
- Patent number 6,169,021
- Issue date Jan 2, 2001
- Micron Technology, Inc.
- Salman Akram
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer, wafer alignment patterns and method of forming...
- Patent number 6,137,186
- Issue date Oct 24, 2000
- Micron Technology, Inc.
- Mark E. Jost
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Isolation using an antireflective coating
- Patent number 6,121,133
- Issue date Sep 19, 2000
- Micron Technology, Inc.
- Ravi Iyer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHODS OF FABRICATING SUBSTRATES INCLUDING AT LEAST ONE CONDUCTIVE...
- Publication number 20080060193
- Publication date Mar 13, 2008
- Micron Technology, Inc.
- Warren M. Farnworth
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Methods for forming and cleaning photolithography reticles
- Publication number 20080057411
- Publication date Mar 6, 2008
- Craig M. Carpenter
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Methods of fabricating substrates including one or more conductive...
- Publication number 20070169343
- Publication date Jul 26, 2007
- Warren M. Farnworth
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Methods for creating electrophoretically insulated vias in semicond...
- Publication number 20070004197
- Publication date Jan 4, 2007
- Warren M. Farnworth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor structures having electrophoretically insulated vias
- Publication number 20060273448
- Publication date Dec 7, 2006
- Warren M. Farnworth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Substrate precursor structures
- Publication number 20060254808
- Publication date Nov 16, 2006
- Warren M. Farnworth
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Methods of forming semiconductor constructions
- Publication number 20060231528
- Publication date Oct 19, 2006
- Werner Juengling
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods for creating electrophoretically insulated vias in semicond...
- Publication number 20060063377
- Publication date Mar 23, 2006
- Warren M. Farnworth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods for creating electrophoretically insulated vias in semicond...
- Publication number 20060027911
- Publication date Feb 9, 2006
- Warren M. Farnworth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods of forming semiconductor constructions
- Publication number 20050255701
- Publication date Nov 17, 2005
- Werner Juengling
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods of fabricating substrates and substrate precursor structure...
- Publication number 20050150683
- Publication date Jul 14, 2005
- Warren M. Farnworth
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Wafer-level testing apparatus
- Publication number 20050146013
- Publication date Jul 7, 2005
- Warren M. Farnworth
- G01 - MEASURING TESTING
Information Patent Application
Wafer-level testing apparatus and method
- Publication number 20040142499
- Publication date Jul 22, 2004
- Warren M. Farnworth
- G01 - MEASURING TESTING
Information Patent Application
Methods for creating electrophoretically insulated vias in semicond...
- Publication number 20040043607
- Publication date Mar 4, 2004
- Warren M. Farnworth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for providing an alignment diffraction grating for photolith...
- Publication number 20030077528
- Publication date Apr 24, 2003
- Jeffrey W. Honeycutt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR PROVIDING AN ALIGNMENT DIFFRACTION GRATING FOR PHOTOLITH...
- Publication number 20020187410
- Publication date Dec 12, 2002
- Jeffrey W. Honeycutt
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Application
Method for providing an alignment diffraction grating for photolith...
- Publication number 20020187409
- Publication date Dec 12, 2002
- Jeffrey W. Honeycutt
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Application
Isolation using an antireflective coating
- Publication number 20020155698
- Publication date Oct 24, 2002
- Micron Technologies, Inc.
- Ravi Lyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for providing an alignment diffraction grating for photolith...
- Publication number 20020064718
- Publication date May 30, 2002
- Jeffrey W. Honeycutt
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Application
Semiconductor wafer, wafer alignment patterns and method of forming...
- Publication number 20010007786
- Publication date Jul 12, 2001
- Mark E. Jost
- H01 - BASIC ELECTRIC ELEMENTS

Steven M. McDonald

Person

Patents Grantslast 30 patents

Methods for forming and cleaning photolithography reticles

Methods of fabricating substrates including one or more conductive...

Methods of fabricating substrates including at least one conductive...

Semiconductor structures having electrophoretically insulated vias

Methods of forming semiconductor constructions

Methods for creating electrophoretically insulated vias in semicond...

Wafer-level redistribution circuit

Methods of fabricating substrates including at least one conductive...

Methods of forming semiconductor constructions

Semiconductor assemblies having electrophoretically insulated vias

Methods for creating electrophoretically insulated vias in semicond...

Methods for creating electrophoretically insulated vias in semicond...

Wafer-level testing apparatus and method

Method for patterning a photoresist material for semiconductor comp...

Wafer-level testing apparatus and method

Method for providing an alignment diffraction grating for photolith...

Isolation using an antireflective coating

Semiconductor wafer, wafer alignment patterns and method of forming...

Method for providing an alignment diffraction grating for photolith...

Isolation using an antireflective coating

Method for providing an alignment diffraction grating for photolith...

Method for providing an alignment diffraction grating for photolith...

Isolation using an antireflective coating

Insert testing system

Metallized recess in a substrate

Semiconductor wafer,wafer alignment patterns and method of forming...

Isolation using an antireflective coating

Method of making a metallized recess in a substrate

Semiconductor wafer, wafer alignment patterns and method of forming...

Isolation using an antireflective coating

Patents Applicationslast 30 patents

METHODS OF FABRICATING SUBSTRATES INCLUDING AT LEAST ONE CONDUCTIVE...

Methods for forming and cleaning photolithography reticles

Methods of fabricating substrates including one or more conductive...

Methods for creating electrophoretically insulated vias in semicond...

Semiconductor structures having electrophoretically insulated vias

Substrate precursor structures

Methods of forming semiconductor constructions

Methods for creating electrophoretically insulated vias in semicond...

Methods for creating electrophoretically insulated vias in semicond...

Methods of forming semiconductor constructions

Methods of fabricating substrates and substrate precursor structure...

Wafer-level testing apparatus

Wafer-level testing apparatus and method

Methods for creating electrophoretically insulated vias in semicond...

Method for providing an alignment diffraction grating for photolith...

METHOD FOR PROVIDING AN ALIGNMENT DIFFRACTION GRATING FOR PHOTOLITH...

Method for providing an alignment diffraction grating for photolith...

Isolation using an antireflective coating

Method for providing an alignment diffraction grating for photolith...

Semiconductor wafer, wafer alignment patterns and method of forming...