Steven P. Zuhoski

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Rowlett, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for improving reliability of copper interconnects
- Patent number 7,309,651
- Issue date Dec 18, 2007
- Texas Instruments Incorporated
- Jeffrey A. West
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Control of Vmin transient voltage drift by maintaining a temperatur...
- Patent number 6,740,603
- Issue date May 25, 2004
- Texas Instruments Incorporated
- Steven P. Zuhoski
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method for improving reliability of copper interconnects
- Publication number 20050095843
- Publication date May 5, 2005
- Jeffrey A. West
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Control of Vmin transient voltage drift by using a PECVD silicon ox...
- Publication number 20020123225
- Publication date Sep 5, 2002
- Steven P. Zuhoski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Control of Vmin transient voltage drift by using silicon formed wit...
- Publication number 20020123214
- Publication date Sep 5, 2002
- Steven P. Zuhoski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Control of Vmin transient voltage drift by maintaining a temperatur...
- Publication number 20020123247
- Publication date Sep 5, 2002
- Steven P. Zuhoski
- H01 - BASIC ELECTRIC ELEMENTS