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Steven Thijs
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Willebroek, BE
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Patents Grants
last 30 patents
Information
Patent Grant
Method for providing wideband electrostatic discharge protection an...
Patent number
8,508,893
Issue date
Aug 13, 2013
IMEC
Steven Thijs
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Electrostatic discharge protection circuit
Patent number
8,143,700
Issue date
Mar 27, 2012
Sofics BVBA
Pieter Vanysacker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Design methodology for MuGFET ESD protection devices
Patent number
7,923,266
Issue date
Apr 12, 2011
IMEC
Steven Thijs
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for calibrating an electrostatic discharge tester
Patent number
7,821,272
Issue date
Oct 26, 2010
IMEC
Mirko Scholz
G01 - MEASURING TESTING
Information
Patent Grant
Electronic circuit and method of manufacturing an electronic circuit
Patent number
7,687,859
Issue date
Mar 30, 2010
Infineon Technologies AG
Christian Russ
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electrostatic discharge protected circuits
Patent number
7,649,722
Issue date
Jan 19, 2010
Interuniversitair Microelektronica Centrum (IMEC)
Steven Thijs
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of determining current-voltage characteristics of a device
Patent number
7,181,352
Issue date
Feb 20, 2007
Interuniversitaire Microelektronica Centrum (IMEC) vzw
Natarajan Mahadeva Iyer
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
N-Channel Laterally Diffused Metal-Oxide-Semiconductor Device
Publication number
20130161750
Publication date
Jun 27, 2013
Katholieke Universiteit Leuven, K.U.Leuven R&D
Shih-Hung Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for Providing Wideband Electrostatic Discharge Protection a...
Publication number
20110051300
Publication date
Mar 3, 2011
IMEC
Steven Thijs
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Method for Designing Integrated Electronic Circuits Having Electros...
Publication number
20110051301
Publication date
Mar 3, 2011
IMEC
Steven Thijs
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Bidirectional ESD Power Clamp
Publication number
20100142105
Publication date
Jun 10, 2010
IMEC
Dimitri Linten
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Design Methodology for MuGFET ESD Protection Devices
Publication number
20090280582
Publication date
Nov 12, 2009
Interuniversitair Microelektronica Centrum
Steven Thijs
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electrostatic Discharge Protection Circuit
Publication number
20090101938
Publication date
Apr 23, 2009
Sarnoff Corporation
Pieter Vanysacker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Fast Triggering ESD Protection Device and Method for Designing Same
Publication number
20090073621
Publication date
Mar 19, 2009
Interuniversitair Microelektronica Centrum (IMEC)
Steven Thijs
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Electronic Circuit and Method of Manufacturing an Electronic Circuit
Publication number
20090065868
Publication date
Mar 12, 2009
Christian Russ
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for Calibrating an Electrostatic Discharge Tester
Publication number
20090027063
Publication date
Jan 29, 2009
Interuniversitair Microelektronica Centrum (IMEC)
Mirko Scholz
G01 - MEASURING TESTING
Information
Patent Application
ESD CLAMP CONTROL BY DETECTION OF POWER STATE
Publication number
20070247772
Publication date
Oct 25, 2007
Sarnoff Corporation
Bart Keppens
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electrostatic discharge protected circuits
Publication number
20070058308
Publication date
Mar 15, 2007
Interuniversitair Microelektronica Centrum (IMEC)
Steven Thijs
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Electrostatic discharge protection circuit
Publication number
20070002508
Publication date
Jan 4, 2007
Pieter Vanysacker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of determining current-voltage characteristics of a device
Publication number
20040239346
Publication date
Dec 2, 2004
Natarajan Mahadeva Iyer
G01 - MEASURING TESTING