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Steven W. Meeks

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  • San Jose, CA, US
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    TIME DOMAIN MULTIPLEXED DEFECT SCANNER
    • Publication number 20230341332
    • Publication date Oct 26, 2023
    • Steven W. Meeks
    • G01 - MEASURING TESTING
  • Information Patent Application

    SCANNING MICRO PROFILER
    • Publication number 20220269071
    • Publication date Aug 25, 2022
    • Lumina Instruments
    • Steven W. Meeks
    • G02 - OPTICS
  • Information Patent Application

    SURFACE CONTOUR MEASUREMENT
    • Publication number 20220187057
    • Publication date Jun 16, 2022
    • Lumina Instruments
    • Steven W. Meeks
    • G01 - MEASURING TESTING
  • Information Patent Application

    SLOPE, P-COMPONENT AND S-COMPONENT MEASUREMENT
    • Publication number 20220187204
    • Publication date Jun 16, 2022
    • Lumina Instruments
    • Steven W. Meeks
    • G01 - MEASURING TESTING
  • Information Patent Application

    ANGLE INDEPENDENT OPTICAL SURFACE INSPECTOR
    • Publication number 20220187218
    • Publication date Jun 16, 2022
    • Steven W. Meeks
    • G02 - OPTICS
  • Information Patent Application

    REGION PROBER OPTICAL INSPECTOR
    • Publication number 20220136982
    • Publication date May 5, 2022
    • Lumina Instruments
    • Steven W. Meeks
    • G01 - MEASURING TESTING
  • Information Patent Application

    REGION PROBER OPTICAL INSPECTOR
    • Publication number 20200319116
    • Publication date Oct 8, 2020
    • Lumina Instruments Inc.
    • Steven W. Meeks
    • G01 - MEASURING TESTING
  • Information Patent Application

    SCATTERED RADIATION DEFECT DEPTH DETECTION
    • Publication number 20200278192
    • Publication date Sep 3, 2020
    • Lumina Instruments Inc.
    • Steven W. Meeks
    • G01 - MEASURING TESTING
  • Information Patent Application

    DUAL MODE INSPECTOR
    • Publication number 20180005364
    • Publication date Jan 4, 2018
    • Zeta Instruments, Inc.
    • Steven W. Meeks
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    METHOD OF DETECTING DEFECT LOCATION USING MULTI-SURFACE SPECULAR RE...
    • Publication number 20170336330
    • Publication date Nov 23, 2017
    • Zeta Instruments, Inc.
    • Steven W. Meeks
    • G01 - MEASURING TESTING
  • Information Patent Application

    MULTI-SURFACE SPECULAR REFLECTION INSPECTOR
    • Publication number 20170336331
    • Publication date Nov 23, 2017
    • Zeta Instruments, Inc.
    • Steven W. Meeks
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHOD AND APPARATUS TO DETECT DEFECTS IN TRANSPARENT SOLIDS
    • Publication number 20170261440
    • Publication date Sep 14, 2017
    • Zeta Instruments, Inc.
    • Steven W. Meeks
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHOD AND APPARATUS TO DETECT DEFECTS IN TRANSPARENT SOLIDS
    • Publication number 20160033421
    • Publication date Feb 4, 2016
    • Zeta Instruments, Inc.
    • Steven W. Meeks
    • G01 - MEASURING TESTING
  • Information Patent Application

    MULTI-SURFACE SCATTERED RADIATION DIFFERENTIATION
    • Publication number 20140307255
    • Publication date Oct 16, 2014
    • Zeta Instruments, Inc.
    • Steven W. Meeks
    • G01 - MEASURING TESTING
  • Information Patent Application

    Optical Inspector
    • Publication number 20140218722
    • Publication date Aug 7, 2014
    • Zeta Instruments, Inc.
    • Steven W. Meeks
    • G02 - OPTICS
  • Information Patent Application

    Optical Inspector
    • Publication number 20140218724
    • Publication date Aug 7, 2014
    • Zeta Instruments, Inc.
    • Steven W. Meeks
    • G01 - MEASURING TESTING
  • Information Patent Application

    Substrate Inspection
    • Publication number 20130308124
    • Publication date Nov 21, 2013
    • KLA-Tencor Corporation
    • Mahendra Prabhu Ramachandran
    • G01 - MEASURING TESTING
  • Information Patent Application

    DEFECT INSPECTION AND PHOTOLUMINESCENCE MEASUREMENT SYSTEM
    • Publication number 20120049085
    • Publication date Mar 1, 2012
    • KLA-Tencor Corporation
    • Roman Sappey
    • G01 - MEASURING TESTING
  • Information Patent Application

    Substrate Edge Inspection
    • Publication number 20110058174
    • Publication date Mar 10, 2011
    • KLA-Tencor Corporation
    • Mahendra P. Ramachandran
    • G01 - MEASURING TESTING
  • Information Patent Application

    Scattered Light Separation
    • Publication number 20110019197
    • Publication date Jan 27, 2011
    • KLA-Tencor Corporation
    • Steven W. Meeks
    • G01 - MEASURING TESTING
  • Information Patent Application

    Wafer Edge Inspection
    • Publication number 20090059236
    • Publication date Mar 5, 2009
    • KLA-Tencor Technologies Corporation
    • Steven W. Meeks
    • G01 - MEASURING TESTING
  • Information Patent Application

    SURFACE CHARACTERISTIC ANALYSIS
    • Publication number 20080180656
    • Publication date Jul 31, 2008
    • KLA-Tencor Technologies Corporation
    • Steven W. Meeks
    • G01 - MEASURING TESTING
  • Information Patent Application

    MATERIAL INDEPENDENT PROFILER
    • Publication number 20070153273
    • Publication date Jul 5, 2007
    • Steven W. Meeks
    • G01 - MEASURING TESTING
  • Information Patent Application

    WAFER EDGE INSPECTION
    • Publication number 20070127016
    • Publication date Jun 7, 2007
    • Steven W. Meeks
    • G01 - MEASURING TESTING
  • Information Patent Application

    SURFACE FINISH ROUGHNESS MEASUREMENT
    • Publication number 20070115483
    • Publication date May 24, 2007
    • Dave S. Oak
    • G01 - MEASURING TESTING
  • Information Patent Application

    Wafer edge inspection
    • Publication number 20060250609
    • Publication date Nov 9, 2006
    • KLA-Tencor Technologies Corp.
    • Steven W. Meeks
    • G01 - MEASURING TESTING
  • Information Patent Application

    Wafer edge inspection
    • Publication number 20060250610
    • Publication date Nov 9, 2006
    • KLA-Tencor Technologies Corp.
    • Steven W. Meeks
    • G01 - MEASURING TESTING
  • Information Patent Application

    Detecting and classifying surface features or defects by controllin...
    • Publication number 20060250612
    • Publication date Nov 9, 2006
    • Steven W. Meeks
    • G01 - MEASURING TESTING
  • Information Patent Application

    Wafer edge inspection
    • Publication number 20060250611
    • Publication date Nov 9, 2006
    • KLA-Tencor Technologies Corp.
    • Vamsi Velidandla
    • G01 - MEASURING TESTING
  • Information Patent Application

    Servo pattern characterization on magnetic disks
    • Publication number 20060215289
    • Publication date Sep 28, 2006
    • KLA-Tencor Technologies Corp.
    • Zhen Hou
    • G11 - INFORMATION STORAGE