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Steven W. Mittl
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Essex, VT, US
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Patents Grants
last 30 patents
Information
Patent Grant
Voltage balanced stacked clamp
Patent number
10,170,460
Issue date
Jan 1, 2019
International Business Machines Corporation
Alain F. Loiseau
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Voltage balanced stacked clamp
Patent number
9,978,743
Issue date
May 22, 2018
International Business Machines Corporation
Alain F. Loiseau
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Monitoring aging of silicon in an integrated circuit device
Patent number
9,310,424
Issue date
Apr 12, 2016
International Business Machines Corporation
Malcolm S. Allen-Ware
G01 - MEASURING TESTING
Information
Patent Grant
Correction for stress induced leakage current in dielectric reliabi...
Patent number
9,310,418
Issue date
Apr 12, 2016
International Business Machines Corporation
Steven W. Mittl
G01 - MEASURING TESTING
Information
Patent Grant
Correction for stress induced leakage current in dielectric reliabi...
Patent number
8,937,487
Issue date
Jan 20, 2015
International Business Machines Corporation
Steven W. Mittl
G01 - MEASURING TESTING
Information
Patent Grant
Managing aging of silicon in an integrated circuit device
Patent number
8,713,490
Issue date
Apr 29, 2014
International Business Machines Corporation
Malcolm S. Allen-Ware
G01 - MEASURING TESTING
Information
Patent Grant
Measuring bias temperature instability induced ring oscillator freq...
Patent number
8,587,383
Issue date
Nov 19, 2013
International Business Machines Corporation
David G. Brochu
G01 - MEASURING TESTING
Information
Patent Grant
Reprogrammable integrated circuit (IC) with overwritable nonvolatil...
Patent number
7,123,517
Issue date
Oct 17, 2006
International Business Machines Corporation
Matthew Breitwisch
G11 - INFORMATION STORAGE
Information
Patent Grant
Deuterium reservoirs and ingress paths
Patent number
6,770,501
Issue date
Aug 3, 2004
International Business Machines Corporation
Jay Burnham
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Deuterium reservoirs and ingress paths
Patent number
6,521,977
Issue date
Feb 18, 2003
International Business Machines Corporation
Jay Burnham
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electronic switch for decoupling capacitor
Patent number
6,307,250
Issue date
Oct 23, 2001
International Business Machines Corporation
Byron L. Krauter
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Silicon-on-insulator non-volatile random access memory device
Patent number
6,252,275
Issue date
Jun 26, 2001
International Business Machines Corporation
John M. Aitken
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Hot electron compensation for improved MOS transistor reliability
Patent number
5,982,225
Issue date
Nov 9, 1999
International Business Machines Corporation
Timothy E. Forhan
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method to calculate hot-electron test voltage differential for asse...
Patent number
5,634,001
Issue date
May 27, 1997
International Business Machines Corporation
Steven W. Mittl
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
VOLTAGE BALANCED STACKED CLAMP
Publication number
20180247930
Publication date
Aug 30, 2018
International Business Machines Corporation
Alain F. Loiseau
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
VOLTAGE BALANCED STACKED CLAMP
Publication number
20180247932
Publication date
Aug 30, 2018
International Business Machines Corporation
Alain F. Loiseau
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
VOLTAGE BALANCED STACKED CLAMP
Publication number
20180247931
Publication date
Aug 30, 2018
International Business Machines Corporation
Alain F. Loiseau
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
CORRECTION FOR STRESS INDUCED LEAKAGE CURRENT IN DIELECTRIC RELIABI...
Publication number
20150061724
Publication date
Mar 5, 2015
International Business Machines Corporation
Steven W. Mittl
G01 - MEASURING TESTING
Information
Patent Application
Monitoring Aging of Silicon in an Integrated Circuit Device
Publication number
20140244212
Publication date
Aug 28, 2014
International Business Machines Corporation
Malcolm S. Allen-Ware
G01 - MEASURING TESTING
Information
Patent Application
MEASURING BIAS TEMPERATURE INSTABILITY INDUCED RING OSCILLATOR FREQ...
Publication number
20130147562
Publication date
Jun 13, 2013
Internatinal Business Machines Corporation
David G. Brochu
G01 - MEASURING TESTING
Information
Patent Application
CORRECTION FOR STRESS INDUCED LEAKAGE CURRENT IN DIELECTRIC RELIABI...
Publication number
20120303303
Publication date
Nov 29, 2012
International Business Machines Corporation
Steven W. Mittl
G01 - MEASURING TESTING
Information
Patent Application
REPROGRAMMABLE INTEGRATED CIRCUIT (IC) WITH OVERWRITABLE NONVOLATIL...
Publication number
20060077719
Publication date
Apr 13, 2006
International Business Machines Corporation
Matthew Breitwisch
G11 - INFORMATION STORAGE
Information
Patent Application
Deuterium reservoirs and ingress paths
Publication number
20030102529
Publication date
Jun 5, 2003
Jay Burnham
H01 - BASIC ELECTRIC ELEMENTS