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Steven Wang
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Hacienda Heights, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Probe head with machine mounting pads and method of forming same
Patent number
8,232,816
Issue date
Jul 31, 2012
Advantest America, Inc.
Salleh Ismail
G01 - MEASURING TESTING
Information
Patent Grant
Method of forming probe card assembly
Patent number
7,759,952
Issue date
Jul 20, 2010
Touchdown Technologies, Inc.
Raffi Garabedian
G01 - MEASURING TESTING
Information
Patent Grant
Probe card assembly and method of forming same
Patent number
7,728,612
Issue date
Jun 1, 2010
Touchdown Technologies, Inc.
Raffi Garabedian
G01 - MEASURING TESTING
Information
Patent Grant
Probe card assembly
Patent number
7,365,553
Issue date
Apr 29, 2008
Touchdown Technologies, Inc.
Raffi Garabedian
G01 - MEASURING TESTING
Information
Patent Grant
Probe head with machined mounting pads and method of forming same
Patent number
7,180,316
Issue date
Feb 20, 2007
Touchdown Technologies, Inc.
Salleh Ismail
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Probe card assembly and method of forming same
Publication number
20080211525
Publication date
Sep 4, 2008
TOUCHDOWN TECHNOLOGIES, INC.
Raffi Garabedian
G01 - MEASURING TESTING
Information
Patent Application
Method of forming probe card assembly
Publication number
20080007281
Publication date
Jan 10, 2008
TOUCHDOWN TECHNOLOGIES, INC.
Raffi Garabedian
G01 - MEASURING TESTING
Information
Patent Application
Probe head with machine mounting pads and method of forming same
Publication number
20070182430
Publication date
Aug 9, 2007
TOUCHDOWN TECHNOLOGIES, INC.
Salleh Ismail
G01 - MEASURING TESTING
Information
Patent Application
Probe card assembly
Publication number
20070145988
Publication date
Jun 28, 2007
TOUCHDOWN TECHNOLOGIES, INC.
Raffi Garabedian
G01 - MEASURING TESTING