Steven Weinzierl

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Hudson, OH, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for detecting metal contamination on a semiconduc...
- Patent number 6,759,255
- Issue date Jul 6, 2004
- KLA-Tencor Technologies Corp.
- Zhiwei Xu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and system for detecting metal contamination on a semiconduc...
- Publication number 20020090746
- Publication date Jul 11, 2002
- Zhiwei Xu
- G01 - MEASURING TESTING