Subramani Iyer

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Electrostatic charge measurement tool
- Patent number 11,881,424
- Issue date Jan 23, 2024
- Intel Corporation
- Ho Fang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTROSTATIC CHARGE MEASUREMENT TOOL
- Publication number 20230290662
- Publication date Sep 14, 2023
- Intel Corporation
- Ho FANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRAP FILTER SYSTEM FOR SEMICONDUCTOR EQUIPMENT
- Publication number 20220112598
- Publication date Apr 14, 2022
- Intel Corporation
- Subramani IYER
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
MANIFOLD ASSEMBLY FOR TRAP FILTER SYSTEMS
- Publication number 20220111324
- Publication date Apr 14, 2022
- Intel Corporation
- Subramani IYER
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SELECTIVE HEATING DURING SEMICONDUCTOR DEVICE PROCESSING TO COMPENS...
- Publication number 20150087082
- Publication date Mar 26, 2015
- Applied Materials, Inc.
- Subramani Iyer
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR