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Suk-lae Kim
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Chungcheongnam-do, KR
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last 30 patents
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Patent Grant
Method of testing an object and apparatus for performing the same
Patent number
9,013,201
Issue date
Apr 21, 2015
Samsung Electronics Co., Ltd.
Jae-Ho Park
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
SEMICONDUCTOR PACKAGE TEST BLADE AND SEMICONDUCTOR PACKAGE TEST APP...
Publication number
20160109512
Publication date
Apr 21, 2016
Samsung Electronics Co., Ltd.
Suk-lae Kim
G01 - MEASURING TESTING
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Patent Application
METHOD OF TESTING AN OBJECT AND APPARATUS FOR PERFORMING THE SAME
Publication number
20130118956
Publication date
May 16, 2013
Jae-Ho PARK
G01 - MEASURING TESTING