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last 30 patents
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Patent Grant
Dual ion implantation process for gate oxide improvement
Patent number
5,714,788
Issue date
Feb 3, 1998
Chartered Semiconductor Manufacturing, PTE Ltd.
Sukhum Ngaoaram
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Dual ion implantation process for gate oxide improvement
Patent number
5,605,848
Issue date
Feb 25, 1997
Chartered Semiconductor Manufacturing Pte Ltd
Sukhum Ngaoaram
H01 - BASIC ELECTRIC ELEMENTS