Sun Mo An

Person

Icon-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit capable of controlling test modes...
- Patent number 9,368,237
- Issue date Jun 14, 2016
- Hynix Semiconductor Inc.
- Sun Mo An
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device and thermal code output circuit capable...
- Patent number 8,542,548
- Issue date Sep 24, 2013
- Hynix Semiconductor Inc.
- Sun Mo An
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory apparatus
- Patent number 8,391,100
- Issue date Mar 5, 2013
- SK Hynix Inc.
- Sun Mo An
- G11 - INFORMATION STORAGE
Information Patent Grant
Self-refresh test circuit of semiconductor memory apparatus
- Patent number 8,259,527
- Issue date Sep 4, 2012
- Hynix Semiconductor Inc.
- Sun Mo An
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory apparatus and probe test control circuit therefor
- Patent number 8,248,874
- Issue date Aug 21, 2012
- SK Hynix Inc.
- Sun Mo An
- G11 - INFORMATION STORAGE
Information Patent Grant
Anti-fuse repair control circuit and semiconductor device including...
- Patent number 8,023,347
- Issue date Sep 20, 2011
- Hynix Semiconductor Inc.
- Shin Ho Chu
- G11 - INFORMATION STORAGE
Information Patent Grant
Fuse circuit for semiconductor integrated circuit and control metho...
- Patent number 7,940,115
- Issue date May 10, 2011
- Hynix Semiconductor Inc.
- Sun-Mo An
- G01 - MEASURING TESTING
Information Patent Grant
Multi-column decoder stress test circuit
- Patent number 7,940,585
- Issue date May 10, 2011
- Hynix Semiconductor Inc.
- Shin-Ho Chun
- G11 - INFORMATION STORAGE
Information Patent Grant
Address control circuit of semiconductor memory apparatus
- Patent number 7,920,437
- Issue date Apr 5, 2011
- Hynix Semiconductor Inc.
- Sun Mo An
- G11 - INFORMATION STORAGE
Information Patent Grant
Thermal code transmission circuit and semiconductor memory device u...
- Patent number 7,864,613
- Issue date Jan 4, 2011
- Hynix Semiconductor Inc.
- Sun Mo An
- G11 - INFORMATION STORAGE
Information Patent Grant
Wafer burn-in test circuit
- Patent number 7,800,964
- Issue date Sep 21, 2010
- Hynix Semiconductor Inc.
- Youk-Hee Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Anti-fuse repair control circuit and semiconductor device including...
- Patent number 7,688,663
- Issue date Mar 30, 2010
- Hynix Semiconductor Inc.
- Shin Ho Chu
- G11 - INFORMATION STORAGE
Information Patent Grant
Buffer
- Patent number 7,368,953
- Issue date May 6, 2008
- Hynix Semiconductor Inc.
- Shin Ho Chu
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR MEMORY APPARATUS
- Publication number 20110242929
- Publication date Oct 6, 2011
- Hynix Semiconductor Inc.
- Sun Mo AN
- G11 - INFORMATION STORAGE
Information Patent Application
SELF-REFRESH TEST CIRCUIT OF SEMICONDUCTOR MEMORY APPARATUS
- Publication number 20110103165
- Publication date May 5, 2011
- Hynix Semiconductor Inc.
- Sun Mo An
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY APPARATUS AND PROBE TEST CONTROL CIRCUIT THEREFOR
- Publication number 20100309739
- Publication date Dec 9, 2010
- HYNIX SEMICONDUCTOR INC.
- Sun Mo AN
- G11 - INFORMATION STORAGE
Information Patent Application
ADDRESS CONTROL CIRCUIT OF SEMICONDUCTOR MEMORY APPARATUS
- Publication number 20100265784
- Publication date Oct 21, 2010
- Sun Mo An
- G11 - INFORMATION STORAGE
Information Patent Application
ANTI-FUSE REPAIR CONTROL CIRCUIT AND SEMICONDUCTOR DEVICE INCLUDING...
- Publication number 20100142299
- Publication date Jun 10, 2010
- Hynix Semiconductor Inc.
- Shin Ho CHU
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT CAPABLE OF CONTROLLING TEST MODES...
- Publication number 20100032669
- Publication date Feb 11, 2010
- Sun Mo An
- G11 - INFORMATION STORAGE
Information Patent Application
Thermal code output circuit and semiconductor memory device
- Publication number 20090268777
- Publication date Oct 29, 2009
- Hynix Semiconductor Inc.
- Sun Mo An
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT, FUSE CIRCUIT FOR SEMICONDUCTOR IN...
- Publication number 20090230986
- Publication date Sep 17, 2009
- HYNIX SEMICONDUCTOR INC.
- Sun Mo An
- G01 - MEASURING TESTING
Information Patent Application
Thermal code transmission circuit and semiconductor memory device u...
- Publication number 20090168589
- Publication date Jul 2, 2009
- Hynix Semiconductor Inc.
- Sun Mo An
- G11 - INFORMATION STORAGE
Information Patent Application
ANTI-FUSE REPAIR CONTROL CIRCUIT AND SEMICONDUCTOR DEVICE INCLUDING...
- Publication number 20090141577
- Publication date Jun 4, 2009
- Shin Ho Chu
- G11 - INFORMATION STORAGE
Information Patent Application
WAFER BURN-IN TEST CIRCUIT
- Publication number 20090046525
- Publication date Feb 19, 2009
- HYNIX SEMICONDUCTOR, INC.
- Youk Hee Kim
- G11 - INFORMATION STORAGE
Information Patent Application
MULTI-COLUMN DECODER STRESS TEST CIRCUIT
- Publication number 20090046524
- Publication date Feb 19, 2009
- HYNIX SEMICONDUCTOR, INC.
- Shin-Ho Chu
- G11 - INFORMATION STORAGE
Information Patent Application
Buffer
- Publication number 20070080719
- Publication date Apr 12, 2007
- Hynix Semiconductor Inc.
- Shin Ho Chu
- G11 - INFORMATION STORAGE
Information Patent Application
Buffer
- Publication number 20070080722
- Publication date Apr 12, 2007
- Hynix Semiconductor Inc.
- Shin Ho Chu
- G11 - INFORMATION STORAGE

Person

Patents Grantslast 30 patents

Semiconductor integrated circuit capable of controlling test modes...

Semiconductor memory device and thermal code output circuit capable...

Semiconductor memory apparatus

Self-refresh test circuit of semiconductor memory apparatus

Semiconductor memory apparatus and probe test control circuit therefor

Anti-fuse repair control circuit and semiconductor device including...

Fuse circuit for semiconductor integrated circuit and control metho...

Multi-column decoder stress test circuit

Address control circuit of semiconductor memory apparatus

Thermal code transmission circuit and semiconductor memory device u...

Wafer burn-in test circuit

Anti-fuse repair control circuit and semiconductor device including...

Buffer

Patents Applicationslast 30 patents

SEMICONDUCTOR MEMORY APPARATUS

SELF-REFRESH TEST CIRCUIT OF SEMICONDUCTOR MEMORY APPARATUS

SEMICONDUCTOR MEMORY APPARATUS AND PROBE TEST CONTROL CIRCUIT THEREFOR

ADDRESS CONTROL CIRCUIT OF SEMICONDUCTOR MEMORY APPARATUS

ANTI-FUSE REPAIR CONTROL CIRCUIT AND SEMICONDUCTOR DEVICE INCLUDING...

SEMICONDUCTOR INTEGRATED CIRCUIT CAPABLE OF CONTROLLING TEST MODES...

Thermal code output circuit and semiconductor memory device

SEMICONDUCTOR INTEGRATED CIRCUIT, FUSE CIRCUIT FOR SEMICONDUCTOR IN...

Thermal code transmission circuit and semiconductor memory device u...

ANTI-FUSE REPAIR CONTROL CIRCUIT AND SEMICONDUCTOR DEVICE INCLUDING...

WAFER BURN-IN TEST CIRCUIT

MULTI-COLUMN DECODER STRESS TEST CIRCUIT

Buffer

Buffer