Sushant SURYAGANDH

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Test structure for determining gate-to-body tunneling current in a...
- Patent number 8,309,951
- Issue date Nov 13, 2012
- GLOBALFOUNDRIES Inc.
- Sushant S. Suryagandh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and test system for determining gate-to-body current in a fl...
- Patent number 8,064,832
- Issue date Nov 22, 2011
- Advanced Micro Devices, Inc.
- Sushant S. Suryagandh
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit tester information processing system
- Patent number 7,610,160
- Issue date Oct 27, 2009
- GLOBALFOUNDRIES Inc.
- Sushant S. Suryagandh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR TRANSISTOR DEVICE HAVING AN ASYMMETRIC EMBEDDED STRES...
- Publication number 20100207175
- Publication date Aug 19, 2010
- Advanced Micro Devices, Inc.
- Sushant SURYAGANDH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Modeling of variations in drain-induced barrier lowering (DIBL)
- Publication number 20100010798
- Publication date Jan 14, 2010
- Advanced Micro Devices, Inc.
- Vineet Wason
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT TESTER INFORMATION PROCESSING SYSTEM
- Publication number 20090076750
- Publication date Mar 19, 2009
- Advanced Micro Devices, Inc.
- Sushant S. Suryagandh
- G01 - MEASURING TESTING
Information Patent Application
Test structure for determining gate-to-body tunneling current in a...
- Publication number 20090020754
- Publication date Jan 22, 2009
- Advanced Micro Devices, Inc.
- Sushant S. Suryagandh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and test system for determining gate-to-body current in a fl...
- Publication number 20090021280
- Publication date Jan 22, 2009
- Advanced Micro Devices, Inc.
- Sushant S. Suryagandh
- G01 - MEASURING TESTING