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Syed M. Ali
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Lynchburg, VA, US
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Patents Grants
last 30 patents
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Patent Grant
Pipeline inspection tool with double spiral EMAT sensor array
Patent number
8,319,494
Issue date
Nov 27, 2012
TDW Delaware Inc.
James Simek
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
DEFECT SIZING COMBINING FIXED WAVELENGTH AND VARIABLE WAVELENGTH GU...
Publication number
20240125742
Publication date
Apr 18, 2024
Innerspec Technologies, Inc.
Borja Lopez Jauregui
G01 - MEASURING TESTING
Information
Patent Application
EMAT FOR INSPECTING THICK-SECTION WELDS AND WELD OVERLAYS DURING TH...
Publication number
20110296922
Publication date
Dec 8, 2011
Syed Mohamed Ali
G01 - MEASURING TESTING
Information
Patent Application
Pipeline Inspection Tool with Double Spiral EMAT Sensor Array
Publication number
20100327858
Publication date
Dec 30, 2010
James Simek
G01 - MEASURING TESTING