Tab A. Stephens

Person

Buda, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Optical die test interface with separate voltages for adjacent elec...
- Patent number 10,230,458
- Issue date Mar 12, 2019
- NXP USA, INC.
- Michael B. McShane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical backplane mirror
- Patent number 9,810,843
- Issue date Nov 7, 2017
- NXP USA, INC.
- Tab A. Stephens
- G02 - OPTICS
Information Patent Grant
Optical redundancy
- Patent number 9,766,409
- Issue date Sep 19, 2017
- NXP USA, INC.
- Perry H. Pelley
- G02 - OPTICS
Information Patent Grant
Integration of a MEMS beam with optical waveguide and deflection in...
- Patent number 9,435,952
- Issue date Sep 6, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Tab A. Stephens
- G02 - OPTICS
Information Patent Grant
Microelectronic assembly having a heat spreader for a plurality of die
- Patent number 9,431,380
- Issue date Aug 30, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Tab A. Stephens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wirebond recess for stacked die
- Patent number 9,318,451
- Issue date Apr 19, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Tim V. Pham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical wafer and die probe testing
- Patent number 9,261,556
- Issue date Feb 16, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Michael B. McShane
- G01 - MEASURING TESTING
Information Patent Grant
Techniques for reducing inductance in through-die vias of an electr...
- Patent number 9,099,475
- Issue date Aug 4, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Michael B. McShane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and structures for reducing heat exposure of thermally sens...
- Patent number 9,093,429
- Issue date Jul 28, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Michael B. McShane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Communication system die stack
- Patent number 9,091,820
- Issue date Jul 28, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Tab A. Stephens
- G02 - OPTICS
Information Patent Grant
Die stack with optical TSVs
- Patent number 9,094,135
- Issue date Jul 28, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Perry H. Pelley
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Stacked semiconductor devices
- Patent number 9,082,757
- Issue date Jul 14, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Perry H. Pelley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microelectronic assembly having a heat spreader for a plurality of die
- Patent number 9,070,653
- Issue date Jun 30, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Tab A. Stephens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gate security feature
- Patent number 8,980,734
- Issue date Mar 17, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Tab A. Stephens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices with nonconductive vias
- Patent number 8,796,855
- Issue date Aug 5, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Perry H. Pelley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and structures for reducing heat exposure of thermally sens...
- Patent number 8,680,674
- Issue date Mar 25, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Michael B. McShane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to improve source/drain parasitics in vertical devices
- Patent number 8,258,035
- Issue date Sep 4, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Leo Mathew
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having an organic anti-reflective coating (ARC...
- Patent number 8,039,389
- Issue date Oct 18, 2011
- FREESCALE SEMICONDUCTOR, INC.
- Douglas M. Reber
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method of forming a finFET and structure
- Patent number 7,910,482
- Issue date Mar 22, 2011
- FREESCALE SEMICONDUCTOR, INC.
- Tab A. Stephens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with selectively modulated gate work function
- Patent number 7,911,002
- Issue date Mar 22, 2011
- FREESCALE SEMICONDUCTOR, INC.
- Voon-Yew Thean
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure pattern formation
- Patent number 7,829,447
- Issue date Nov 9, 2010
- FREESCALE SEMICONDUCTOR, INC.
- Leo Mathew
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a via
- Patent number 7,745,298
- Issue date Jun 29, 2010
- FREESCALE SEMICONDUCTOR, INC.
- Tab A. Stephens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to selectively modulate gate work function through selective...
- Patent number 7,659,156
- Issue date Feb 9, 2010
- FREESCALE SEMICONDUCTOR, INC.
- Voon-Yew Thean
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic device including a semiconductor fin having a plurality...
- Patent number 7,566,623
- Issue date Jul 28, 2009
- FREESCALE SEMICONDUCTOR, INC.
- Leo Mathew
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process of forming a non-volatile memory cell including a capacitor...
- Patent number 7,504,302
- Issue date Mar 17, 2009
- FREESCALE SEMICONDUCTOR, INC.
- Leo Mathew
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Undoped gate poly integration for improved gate patterning and coba...
- Patent number 7,491,630
- Issue date Feb 17, 2009
- FREESCALE SEMICONDUCTOR, INC.
- Mehul D. Shroff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FinFET structure with contacts
- Patent number 7,339,241
- Issue date Mar 4, 2008
- FREESCALE SEMICONDUCTOR, INC.
- Marius K. Orlowski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming a semiconductor device having a silicide layer
- Patent number 7,235,471
- Issue date Jun 26, 2007
- FREESCALE SEMICONDUCTOR, INC.
- Dharmesh Jawarani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a semiconductor device having a metal layer
- Patent number 7,208,424
- Issue date Apr 24, 2007
- FREESCALE SEMICONDUCTOR, INC.
- Tab A. Stephens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having an organic anti-reflective coating (ARC...
- Patent number 7,199,429
- Issue date Apr 3, 2007
- FREESCALE SEMICONDUCTOR, INC.
- Douglas M. Reber
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MICROELECTRONIC ASSEMBLY HAVING A HEAT SPREADER FOR A PLURALITY OF DIE
- Publication number 20150214208
- Publication date Jul 30, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Tab A. STEPHENS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STACKED SEMICONDUCTOR DEVICES
- Publication number 20150115463
- Publication date Apr 30, 2015
- Perry H. Pelley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WIREBOND RECESS FOR STACKED DIE
- Publication number 20150115474
- Publication date Apr 30, 2015
- TIM V. PHAM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Optical Backplane Mirror
- Publication number 20140363120
- Publication date Dec 11, 2014
- Tab A. Stephens
- G02 - OPTICS
Information Patent Application
Optical Die Test Interface
- Publication number 20140363153
- Publication date Dec 11, 2014
- Michael B. McShane
- G01 - MEASURING TESTING
Information Patent Application
Integration of a MEMS Beam with Optical Waveguide and Deflection in...
- Publication number 20140363119
- Publication date Dec 11, 2014
- Tab A. Stephens
- G02 - OPTICS
Information Patent Application
Optical Redundancy
- Publication number 20140363124
- Publication date Dec 11, 2014
- Perry H. Pelley
- G02 - OPTICS
Information Patent Application
Die Stack with Optical TSVs
- Publication number 20140363172
- Publication date Dec 11, 2014
- Perry H. Pelley
- G02 - OPTICS
Information Patent Application
Optical Wafer and Die Probe Testing
- Publication number 20140363905
- Publication date Dec 11, 2014
- Michael B. McShane
- G02 - OPTICS
Information Patent Application
Communication System Die Stack
- Publication number 20140362425
- Publication date Dec 11, 2014
- Tab A. Stephens
- G02 - OPTICS
Information Patent Application
Gate Security Feature
- Publication number 20140252487
- Publication date Sep 11, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Tab A. Stephens
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MICROELECTRONIC ASSEMBLY HAVING A HEAT SPREADER FOR A PLURALITY OF DIE
- Publication number 20140197541
- Publication date Jul 17, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Tab A. STEPHENS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TECHNIQUES FOR REDUCING INDUCTANCE IN THROUGH-DIE VIAS OF AN ELECTR...
- Publication number 20140071652
- Publication date Mar 13, 2014
- FREESCALE SEMICONDUCTOR, INC.
- MICHAEL B. MCSHANE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND STRUCTURES FOR REDUCING HEAT EXPOSURE OF THERMALLY SENS...
- Publication number 20140001641
- Publication date Jan 2, 2014
- Michael B. Mcshane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND STRUCTURES FOR REDUCING HEAT EXPOSURE OF THERMALLY SENS...
- Publication number 20130320480
- Publication date Dec 5, 2013
- Michael B. Mcshane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES WITH NONCONDUCTIVE VIAS
- Publication number 20130181350
- Publication date Jul 18, 2013
- Perry H. PELLEY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH SELECTIVELY MODULATED GATE WORK FUNCTION
- Publication number 20100230756
- Publication date Sep 16, 2010
- Freescale Semiconductor Inc.
- Voon-Yew Thean
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING A FINFET AND STRUCTURE
- Publication number 20090294919
- Publication date Dec 3, 2009
- Tab A. Stephens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING A VIA
- Publication number 20090142895
- Publication date Jun 4, 2009
- Tab A. Stephens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method to improve source/drain parasitics in vertical devices
- Publication number 20080274600
- Publication date Nov 6, 2008
- Freescale Semiconductor, Inc.
- Leo Mathew
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method to selectively modulate gate work function through selective...
- Publication number 20080258219
- Publication date Oct 23, 2008
- Freescale Semiconductor, Inc.
- Voon-Yew Thean
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC DEVICE INCLUDING A SEMICONDUCTOR FIN HAVING A PLURALITY...
- Publication number 20080185654
- Publication date Aug 7, 2008
- FREESCALE SEMICONDUCTOR, INC.
- Leo Mathew
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE PATTERN FORMATION
- Publication number 20070269969
- Publication date Nov 22, 2007
- Leo Mathew
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Undoped gate poly integration for improved gate patterning and coba...
- Publication number 20070218661
- Publication date Sep 20, 2007
- Mehul D. Shroff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Poly pre-doping anneals for improved gate profiles
- Publication number 20070196988
- Publication date Aug 23, 2007
- Mehul D. Shroff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE HAVING AN ORGANIC ANTI-REFLECTIVE COATING (ARC...
- Publication number 20070141770
- Publication date Jun 21, 2007
- FREESCALE SEMICONDUCTOR, INC.
- Douglas M. Reber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FinFET structure with contacts
- Publication number 20070045735
- Publication date Mar 1, 2007
- Marius K. Orlowski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Non-volatile memory cell including a capacitor structure and proces...
- Publication number 20060220102
- Publication date Oct 5, 2006
- FREESCALE SEMICONDUCTOR, INC.
- Leo Mathew
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR FABRICATION PROCESS INCLUDING RECESSED SOURCE/DRAIN R...
- Publication number 20060148196
- Publication date Jul 6, 2006
- Freescale Semiconductor, Inc.
- Voon-Yew Thean
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Plasma enhanced nitride layer
- Publication number 20060073698
- Publication date Apr 6, 2006
- Jian Chen
- H01 - BASIC ELECTRIC ELEMENTS

Tab A. Stephens

Person

Patents Grantslast 30 patents

Optical die test interface with separate voltages for adjacent elec...

Optical backplane mirror

Optical redundancy

Integration of a MEMS beam with optical waveguide and deflection in...

Microelectronic assembly having a heat spreader for a plurality of die

Wirebond recess for stacked die

Optical wafer and die probe testing

Techniques for reducing inductance in through-die vias of an electr...

Methods and structures for reducing heat exposure of thermally sens...

Communication system die stack

Die stack with optical TSVs

Stacked semiconductor devices

Microelectronic assembly having a heat spreader for a plurality of die

Gate security feature

Semiconductor devices with nonconductive vias

Methods and structures for reducing heat exposure of thermally sens...

Method to improve source/drain parasitics in vertical devices

Semiconductor device having an organic anti-reflective coating (ARC...

Method of forming a finFET and structure

Semiconductor device with selectively modulated gate work function

Semiconductor structure pattern formation

Method of forming a via

Method to selectively modulate gate work function through selective...

Electronic device including a semiconductor fin having a plurality...

Process of forming a non-volatile memory cell including a capacitor...

Undoped gate poly integration for improved gate patterning and coba...

FinFET structure with contacts

Method for forming a semiconductor device having a silicide layer

Method of forming a semiconductor device having a metal layer

Semiconductor device having an organic anti-reflective coating (ARC...

Patents Applicationslast 30 patents

MICROELECTRONIC ASSEMBLY HAVING A HEAT SPREADER FOR A PLURALITY OF DIE

STACKED SEMICONDUCTOR DEVICES

WIREBOND RECESS FOR STACKED DIE

Optical Backplane Mirror

Optical Die Test Interface

Integration of a MEMS Beam with Optical Waveguide and Deflection in...

Optical Redundancy

Die Stack with Optical TSVs

Optical Wafer and Die Probe Testing

Communication System Die Stack

Gate Security Feature

MICROELECTRONIC ASSEMBLY HAVING A HEAT SPREADER FOR A PLURALITY OF DIE

TECHNIQUES FOR REDUCING INDUCTANCE IN THROUGH-DIE VIAS OF AN ELECTR...

METHODS AND STRUCTURES FOR REDUCING HEAT EXPOSURE OF THERMALLY SENS...

METHODS AND STRUCTURES FOR REDUCING HEAT EXPOSURE OF THERMALLY SENS...

SEMICONDUCTOR DEVICES WITH NONCONDUCTIVE VIAS

SEMICONDUCTOR DEVICE WITH SELECTIVELY MODULATED GATE WORK FUNCTION

METHOD OF FORMING A FINFET AND STRUCTURE

METHOD OF FORMING A VIA

Method to improve source/drain parasitics in vertical devices

Method to selectively modulate gate work function through selective...

ELECTRONIC DEVICE INCLUDING A SEMICONDUCTOR FIN HAVING A PLURALITY...

SEMICONDUCTOR STRUCTURE PATTERN FORMATION

Undoped gate poly integration for improved gate patterning and coba...

Poly pre-doping anneals for improved gate profiles

SEMICONDUCTOR DEVICE HAVING AN ORGANIC ANTI-REFLECTIVE COATING (ARC...

FinFET structure with contacts

Non-volatile memory cell including a capacitor structure and proces...

SEMICONDUCTOR FABRICATION PROCESS INCLUDING RECESSED SOURCE/DRAIN R...

Plasma enhanced nitride layer