Tadanori Yoshioka

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for preparing samples
- Patent number 7,722,818
- Issue date May 25, 2010
- Jeol Ltd.
- Fuminori Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for preparing specimen
- Patent number 7,531,794
- Issue date May 12, 2009
- Jeol Ltd.
- Tadanori Yoshioka
- G01 - MEASURING TESTING
Information Patent Grant
Method and equipment for specimen preparation
- Patent number 7,453,073
- Issue date Nov 18, 2008
- Jeol Ltd.
- Tadanori Yoshioka
- G01 - MEASURING TESTING
Information Patent Grant
Mask and apparatus using it to prepare sample by ion milling
- Patent number 7,354,500
- Issue date Apr 8, 2008
- Jeol Ltd.
- Tadanori Yoshioka
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for preparing specimen
- Patent number 5,907,157
- Issue date May 25, 1999
- Jeol Ltd.
- Tadanori Yoshioka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Ion source
- Publication number 20060284105
- Publication date Dec 21, 2006
- JEOL Ltd.
- Takushi Yamashita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for preparing specimen
- Publication number 20060255295
- Publication date Nov 16, 2006
- JEOL Ltd.
- Tadanori Yoshioka
- G01 - MEASURING TESTING
Information Patent Application
Method and equipment for specimen preparation
- Publication number 20060113496
- Publication date Jun 1, 2006
- JEOL Ltd.
- Tadanori Yoshioka
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for preparing samples
- Publication number 20050118065
- Publication date Jun 2, 2005
- JEOL Ltd.
- Fuminori Hasegawa
- G01 - MEASURING TESTING
Information Patent Application
Mask and apparatus using it to prepare sample by ion milling
- Publication number 20050081997
- Publication date Apr 21, 2005
- JEOL Ltd.
- Tadanori Yoshioka
- G01 - MEASURING TESTING