1. Field of the Invention
The present invention relates to an ion source used in ion beam processing equipment for preparing a specimen to be observed with an electron microscope.
2. Description of Related Art
Currently, ion beam processing equipment is used to prepare specimens to be observed with transmission electron microscopes (TEMs) and scanning electron microscopes (SEMs). One type of the ion beam processing equipment uses a shielding material placed over a specimen. The portion of the specimen that is not shielded with the shielding material is etched with an ion beam to obtain a cross section for observation. In this ion beam processing equipment used for preparation of electron microscope (EM) specimens, the used ion source is of the Penning type.
The Penning ion source has cathodes, an anode, and a magnetic field-producing means. In addition, the ion source has a means for introducing a gas into the ionization chamber. In this structure, electrons released from the cathodes are made to revolve by the magnetic field. The gas introduced into the ionization chamber is ionized by collision with the electrodes. Positive ions produced by the ionization are accelerated out of the ionization chamber and released.
A patent reference regarding the Penning ion source is Japanese Patent Laid-Open No. S53-114661.
In one design of Penning ion source, the cathodes act also as the polepieces of the magnetic field-producing means. In this structure, the cathodes are made of iron (Fe) that is a magnetic material.
Some of the positive ions produced in the ionization chamber collide against the cathodes, sputtering the surfaces of the cathodes. Particles of the sputtered cathodes deposit inside the ionization chamber. Where the cathodes are made of the magnetic material Fe as described previously, the deposited particles (Fe) of the cathodes are made to assume a needle-like form by the magnetic field inside the ionization chamber. That is, the particles (Fe) of the sputtered cathodes stack on top of each other in the sense of the magnetic field within the ionization chamber. As a result, the particles deposit in needle-like form, for example, on the surface of the anode.
If such needle-like portions are formed on the anode in this way, abnormal electric discharge will be produced among the needle-like portions because a voltage is applied between each cathode and the anode. The abnormal electric discharge electrically shorts the power supply circuit that applies the voltage between each cathode and the anode. Consequently, the given voltage is no longer applied between the electrodes. As a result, emission of electrons from the cathodes is reduced or stopped. Hence, the ion beam is no longer released from the ion source.
It is an object of the present invention to provide an ion source capable of being operated normally for a long time inside an ionization chamber without producing abnormal electric discharge.
An ion source that achieves the above-described object in accordance with the teachings of the present invention has cathodes, an anode, a magnetic field-producing means, and a means for introducing a gas into the ionization chamber. Electrons released from the cathodes are made to revolve by the magnetic field. The gas is ionized by the revolving electrons. The produced ions are released out of the ionization chamber. Surfaces of the cathodes against which some of the ions collide are made of an electrically conductive, nonmagnetic material.
According to the present invention, therefore, the ion source can be offered which can be operated normally for a long time inside the ionization chamber without producing abnormal electric discharge.
Other objects and features of the invention will appear in the course of the description thereof, which follows.
An embodiment of the present invention is hereinafter described with reference to the accompanying drawings.
Referring to
The material of the cathode 2 is now described. The cathode body 2a is made of an electrically conductive, magnetic material. For example, the cathode body 2a is made of iron (Fe). On the other hand, the nonmagnetic disk 2b is made of an electrically conductive, nonmagnetic material (e.g., titanium (Ti)). The screw 2d is also made of titanium.
The cathode 2 has been described so far. The feature of the present invention is that the cathode 2 has the nonmagnetic disk 2b as described previously. That is, the surface of the cathode that faces the ionization chamber 3 is made of a conductive nonmagnetic material (Ti).
Referring still to
The ion source has a second disk-like cathode 5 made of an electrically conductive, magnetic material (e.g., Fe). The second cathode 5 is connected with the other end of the magnet 4. The second cathode 5 acts also as another polepiece of the magnetic field-producing means. The magnetic field-producing means of the ion source shown in
The ion source further includes a cylindrical insulator 6 fitted inside the magnet 4. The outer surface of the insulator 6 is in contact with the inner surface of the magnet 4. The insulator 6 is made of an electrically insulative, nonmagnetic material, such as a ceramic.
Furthermore, the ion source includes a cylindrical anode 7 fitted inside the insulator 6. The outer surface of the anode 7 is in contact with the inner surface of the insulator 6. On the other hand, the inner surface of the anode 7 faces the ionization chamber 3. The anode 7 is made of an electrically conductive, nonmagnetic material (such as a stainless steel). The anode 7 is electrically insulated from the cathodes 2 and 5 and from the magnet 4 by the insulator 6.
In addition, the ion source includes a cylindrical accelerating electrode 8 maintained at ground potential. The electrode 8 is mounted to fringes of the base 1 and surrounds the cathodes 2, 5 and magnet 4. The accelerating electrode 8 is provided with an ion passage hole 8a.
The ion source further includes a gas supply source 9 connected with the base 1. The gas supply source 9 is used to admit argon gas, for example, into the ionization chamber 3 via the gas admission holes 1a and 2e.
A first voltage power supply 10 applies a voltage V1 between the accelerating electrode 8 and the cathode 5. The magnet 4 and first cathode 2 electrically connected with the second cathode 5 are maintained at the same potential as the second cathode 5. The cathode body 2a of the cathode 2 and electrically conductive, nonmagnetic disk 2b are maintained at the same potential as the second cathode 5. A second voltage power supply 11 applies a voltage V2 between each of the cathodes 2 and 5 and the anode 7.
The structure of the ion source of
Where the ion source of
The voltage application releases electrons from some surfaces of the first cathode 2 (surface of the cathode body 2a facing the ionization chamber 3 and surface S of the nonmagnetic disk 2b facing the ionization chamber 3) and from the surface of the second cathode 5. The released electrons are accelerated toward the anode 7. The orbit of the electrons released from the surfaces of the cathodes 2 and 5 is bent by the magnetic field E produced in the ionization chamber 3, so that the electrons revolve. The electrons revolving inside the ionization chamber 3 collide against the argon gas, ionizing the argon gas. As a result, positive ions a are produced in the ionization chamber 3.
Some of the positive ions a produced inside the ionization chamber 3 pass through the ion passage hole 5a in the second cathode 5, are accelerated by the accelerating electrode 8, and are released to the outside through the ion passage hole 8a as indicated by the arrow A in
On the other hand, others of the positive ions a produced in the ionization chamber 3 are accelerated toward the first cathode 2 as indicated by the arrow B in
In this way, in the present invention, the sputtered particles b deposit on the anode 7 so as to form a mirror-like surface. Consequently, in the present invention, it is unlikely that needle-like portions are formed on the anode 7 as in the prior art. Abnormal electric discharge that would have been heretofore produced inside the ionization chamber can be prevented. Accordingly, the ion source according to the present invention can emit ions normally over a long time. Specimens adapted to be observed by electron microscopy can be prepared reliably by using this ion source in ion beam processing equipment for preparing EM specimens.
In the prior art, if particles of a cathode deposit in needle-like form on an anode, the operator has removed the deposition with sandpaper regularly. In the present invention, such cleaning can be dispensed with. The burden on the operator is alleviated.
The nonmagnetic disk 2b is made of electrically conductive titanium. Therefore, the deposition J formed by the sputtered particles b is electrically conductive in nature. It is unlikely that the electrode function of the anode 7 is lost by the deposition J. In consequence, electrons emitted from the cathode surface are accelerated toward the anode 7.
While one embodiment of the present invention has been described so far, the invention is not limited thereto. In the above-described embodiment, the nonmagnetic disk 2b is made of titanium of low etch rate (i.e., can be ion sputtered less easily) such that the nonmagnetic disk 2b has prolonged life. Alternatively, the nonmagnetic disk 2b may be made of chromium or tantalum that has an etch rate slightly higher than that of titanium but lower than those of other materials. Both chromium and tantalum are electrically conductive, nonmagnetic materials.
Furthermore, in the above-described embodiment, the nonmagnetic disk 2b is detachably mounted to the cathode body 2a. An electrically conductive, nonmagnetic material may be vapor deposited on the surface of the cathode body 2a facing the ionization chamber 3. If each cathode does not act also as a polepiece of the magnetic field-producing means, the whole cathode may be made of an electrically conductive, nonmagnetic material.
Having thus described our invention with the detail and particularity required by the Patent Laws, what is desired protected by Letters Patent is set forth in the following claims.
Number | Date | Country | Kind |
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2005-176446 | Jun 2005 | JP | national |