Tadao Mimura

Person

Katsuta, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Ion trap/time-of-flight mass spectrometer and method of measuring i...
- Patent number 7,161,141
- Issue date Jan 9, 2007
- Hitachi High-Technologies Corporation
- Tadao Mimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap mass analyzing apparatus
- Patent number 6,977,373
- Issue date Dec 20, 2005
- Hitachi High-Technologies Corporation
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap mass analyzing apparatus
- Patent number 6,759,652
- Issue date Jul 6, 2004
- Hitachi High-Technologies Corporation
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap mass spectrometer and spectrometry
- Patent number 6,683,303
- Issue date Jan 27, 2004
- Hitachi, Ltd.
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for direct coupling of liquid chromatograph an...
- Patent number 6,339,218
- Issue date Jan 15, 2002
- Hitachi, Ltd.
- Yoshiaki Kato
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for direct coupling of liquid chromatograph an...
- Patent number 6,236,042
- Issue date May 22, 2001
- Hitachi, Ltd.
- Yoshiaki Kato
- G01 - MEASURING TESTING
Information Patent Grant
Ion trap mass spectrometer
- Patent number 6,157,030
- Issue date Dec 5, 2000
- Hitachi, Ltd.
- Minoru Sakairi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for ionizing a sample under atmospheric pressu...
- Patent number 6,005,245
- Issue date Dec 21, 1999
- Hitachi, Ltd.
- Minoru Sakairi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analyzer
- Patent number 5,986,260
- Issue date Nov 16, 1999
- Hitachi, Ltd.
- Mitsuru Oonuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for direct coupling of liquid chromatograph an...
- Patent number 5,859,432
- Issue date Jan 12, 1999
- Hitachi, Ltd.
- Yoshiaki Kato
- G01 - MEASURING TESTING
Information Patent Grant
Liquid chromatograph mass spectrometry and liquid chromatograph mas...
- Patent number 5,789,746
- Issue date Aug 4, 1998
- Hitachi, Ltd.
- Yoshiaki Kato
- G01 - MEASURING TESTING
Information Patent Grant
Three dimensional quadrupole mass spectrometry and mass spectrometer
- Patent number 5,789,747
- Issue date Aug 4, 1998
- Hitachi, Ltd.
- Yoshiaki Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic ionization mass spectrometer with a plurality of atmosphe...
- Patent number 5,668,370
- Issue date Sep 16, 1997
- Hitachi, Ltd.
- Masayoshi Yano
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for mass analysis of solution sample
- Patent number 5,663,560
- Issue date Sep 2, 1997
- Hitachi, Ltd.
- Minoru Sakairi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry apparatus
- Patent number 5,633,496
- Issue date May 27, 1997
- Hitachi, Ltd.
- Minoru Sakairi
- G01 - MEASURING TESTING
Information Patent Grant
Atmospheric pressure ionization mass spectrometer
- Patent number 5,612,534
- Issue date Mar 18, 1997
- Hitachi, Ltd.
- Tadao Mimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for direct coupling of liquid chromatograph an...
- Patent number 5,581,081
- Issue date Dec 3, 1996
- Hitachi, Ltd.
- Yoshiaki Kato
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometer
- Patent number 5,567,938
- Issue date Oct 22, 1996
- Hitachi, Ltd.
- Tadao Mimura
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometer and ion source
- Patent number 5,532,483
- Issue date Jul 2, 1996
- Hitachi, Ltd.
- Yoichi Ose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometric apparatus
- Patent number 5,422,482
- Issue date Jun 6, 1995
- Hitachi, Ltd.
- Fumihiko Nakajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer combined with liquid chromatograph
- Patent number D347396
- Issue date May 31, 1994
- Hitachi, Ltd.
- Mitsuru Ohnuma
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Mass spectrometer
- Patent number 5,298,744
- Issue date Mar 29, 1994
- Hitachi, Ltd.
- Tadao Mimura
- G01 - MEASURING TESTING
Information Patent Grant
Liquid chromatograph-direct coupled mass spectrometer
- Patent number 5,240,616
- Issue date Aug 31, 1993
- Hitachi, Ltd.
- Yoshiaki Kato
- G01 - MEASURING TESTING
Information Patent Grant
Atmospheric pressure ionization type mass spectrometer
- Patent number 5,051,583
- Issue date Sep 24, 1991
- Hitachi, Ltd.
- Tadao Mimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Atmospheric pressure ionization mass spectrometer
- Patent number 4,996,424
- Issue date Feb 26, 1991
- Hitachi, Ltd.
- Tadao Mimura
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Ion trap/time-of-flight mass spectrometer and method of measuring i...
- Publication number 20070069121
- Publication date Mar 29, 2007
- Hitachi High-Technologies Corporation
- Tadao Mimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion trap/time-of-flight mass spectrometer and method of measuring i...
- Publication number 20050253060
- Publication date Nov 17, 2005
- Tadao Mimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion trap mass analyzing apparatus
- Publication number 20040211898
- Publication date Oct 28, 2004
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion trap mass analyzing apparatus
- Publication number 20030150989
- Publication date Aug 14, 2003
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion trap mass spectrometer and spectrometry
- Publication number 20020162958
- Publication date Nov 7, 2002
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS

Tadao Mimura

Person

Patents Grantslast 30 patents

Ion trap/time-of-flight mass spectrometer and method of measuring i...

Ion trap mass analyzing apparatus

Ion trap mass analyzing apparatus

Ion trap mass spectrometer and spectrometry

Method and apparatus for direct coupling of liquid chromatograph an...

Method and apparatus for direct coupling of liquid chromatograph an...

Ion trap mass spectrometer

Method and apparatus for ionizing a sample under atmospheric pressu...

Mass analyzer

Method and apparatus for direct coupling of liquid chromatograph an...

Liquid chromatograph mass spectrometry and liquid chromatograph mas...

Three dimensional quadrupole mass spectrometry and mass spectrometer

Automatic ionization mass spectrometer with a plurality of atmosphe...

Method and apparatus for mass analysis of solution sample

Mass spectrometry apparatus

Atmospheric pressure ionization mass spectrometer

Method and apparatus for direct coupling of liquid chromatograph an...

Mass spectrometer

Mass spectrometer and ion source

Mass spectrometric apparatus

Mass spectrometer combined with liquid chromatograph

Mass spectrometer

Liquid chromatograph-direct coupled mass spectrometer

Atmospheric pressure ionization type mass spectrometer

Atmospheric pressure ionization mass spectrometer

Patents Applicationslast 30 patents

Ion trap/time-of-flight mass spectrometer and method of measuring i...

Ion trap/time-of-flight mass spectrometer and method of measuring i...

Ion trap mass analyzing apparatus

Ion trap mass analyzing apparatus

Ion trap mass spectrometer and spectrometry