Tadao Nagatsuma

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Specific absorption rate measuring system, and a method thereof
- Patent number 7,511,511
- Issue date Mar 31, 2009
- NTT DoCoMo, Inc.
- Teruo Onishi
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic apparatus for measuring signal potentials
- Patent number 6,683,447
- Issue date Jan 27, 2004
- Ando Electric Co., Ltd.
- Yoshiki Yanagisawa
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic probe and magneto-optic probe
- Patent number 6,624,644
- Issue date Sep 23, 2003
- Ando Electric Co., Ltd.
- Akishige Ito
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic sampling oscilloscope
- Patent number 6,567,760
- Issue date May 20, 2003
- Ando Electric Co., Ltd.
- Jun Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic probe
- Patent number 6,507,014
- Issue date Jan 14, 2003
- Ando Electric Co. Ltd.
- Akishige Ito
- G01 - MEASURING TESTING
Information Patent Grant
Pattern forming method
- Patent number 6,468,895
- Issue date Oct 22, 2002
- Nippon Telegraph and Telephone Corporation
- Hiromu Ishii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electro-optic sampling probe and measuring method using the same
- Patent number 6,469,528
- Issue date Oct 22, 2002
- Ando Electric Co., Ltd.
- Fumio Akikuni
- G01 - MEASURING TESTING
Information Patent Grant
Probe for electro-optic sampling oscilloscope
- Patent number 6,452,378
- Issue date Sep 17, 2002
- Ando Electric Co., Ltd.
- Noriyuki Toriyama
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic sampling probe and a method for adjusting the same
- Patent number 6,445,198
- Issue date Sep 3, 2002
- Ando Electric Co., Ltd.
- Fumio Akikuni
- G01 - MEASURING TESTING
Information Patent Grant
Temperature-insensitive electro-optic probe
- Patent number 6,429,669
- Issue date Aug 6, 2002
- Ando Electric Co., Ltd.
- Akishige Ito
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic probe
- Patent number 6,410,906
- Issue date Jun 25, 2002
- Ando Electric Co., Ltd.
- Akishige Ito
- G01 - MEASURING TESTING
Information Patent Grant
Probe for electro-optic sampling oscilloscope
- Patent number 6,407,561
- Issue date Jun 18, 2002
- Ando Electric Co., Ltd.
- Akishige Ito
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic sampling probe comprising photodiodes insulated from...
- Patent number 6,403,946
- Issue date Jun 11, 2002
- Ando Electric Co., Ltd.
- Fumio Akikuni
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic sampling prober
- Patent number 6,388,454
- Issue date May 14, 2002
- Ando Electric Co., Ltd.
- Fumio Akikuni
- G01 - MEASURING TESTING
Information Patent Grant
Light receiving circuit for use in electro-optic sampling oscilloscope
- Patent number 6,384,590
- Issue date May 7, 2002
- Ando Electric Co., Ltd.
- Jun Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic sampling oscilloscope
- Patent number 6,377,036
- Issue date Apr 23, 2002
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optical probe for oscilloscope measuring signal waveform
- Patent number 6,369,562
- Issue date Apr 9, 2002
- Ando Electric Co., Ltd.
- Akishige Ito
- G01 - MEASURING TESTING
Information Patent Grant
Electrooptic probe
- Patent number 6,348,787
- Issue date Feb 19, 2002
- Ando Electric Co., Ltd.
- Akishige Ito
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic sampling probe
- Patent number 6,347,005
- Issue date Feb 12, 2002
- Ando Electric Co., Ltd.
- Noriyuki Toriyama
- G01 - MEASURING TESTING
Information Patent Grant
Electrooptic probe
- Patent number 6,342,783
- Issue date Jan 29, 2002
- Ando Electric Co., Ltd.
- Akishige Ito
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic probe
- Patent number 6,337,565
- Issue date Jan 8, 2002
- Ando Electric Co., Ltd.
- Akishige Ito
- G01 - MEASURING TESTING
Information Patent Grant
Timing generation circuit for electro-optic sampling oscilloscope
- Patent number 6,310,507
- Issue date Oct 30, 2001
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic sampling probe having unit for adjusting quantity of...
- Patent number 6,297,651
- Issue date Oct 2, 2001
- Ando Electric Co., Ltd.
- Fumio Akikuni
- G01 - MEASURING TESTING
Information Patent Grant
Electrooptic probe
- Patent number 6,297,650
- Issue date Oct 2, 2001
- Ando Electric Co., Ltd.
- Akishige Ito
- G01 - MEASURING TESTING
Information Patent Grant
Probe for electro-optic sampling oscilloscope
- Patent number 6,288,531
- Issue date Sep 11, 2001
- Ando Electric Co., Ltd.
- Akishige Ito
- G01 - MEASURING TESTING
Information Patent Grant
Timing generation circuit for an electro-optic oscilloscope
- Patent number 6,288,529
- Issue date Sep 11, 2001
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Oscilloscope utilizing probe with electro-optic crystal
- Patent number 6,252,387
- Issue date Jun 26, 2001
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optical oscilloscope with improved sampling
- Patent number 6,232,765
- Issue date May 15, 2001
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic sampling oscilloscope
- Patent number 6,201,235
- Issue date Mar 13, 2001
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic probe
- Patent number 6,166,845
- Issue date Dec 26, 2000
- Ando Electric Co., Ltd.
- Akishige Ito
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPECIFIC ABSORPTION RATE MEASURING SYSTEM, AND A METHOD THEREOF
- Publication number 20070236229
- Publication date Oct 11, 2007
- NTT DoCoMo, Inc.
- Teruo Onishi
- G01 - MEASURING TESTING
Information Patent Application
Specific absorption rate measuring system, and a method thereof
- Publication number 20060114003
- Publication date Jun 1, 2006
- NTT DoCoMo, Inc.
- Teruo Onishi
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR ELECTRO-OPTIC SAMPLING OSCILLOSCOPE
- Publication number 20020140416
- Publication date Oct 3, 2002
- Noriyuki Toriyama
- G01 - MEASURING TESTING
Information Patent Application
Electro-optic probe
- Publication number 20020092975
- Publication date Jul 18, 2002
- AKISHIGE ITO
- G01 - MEASURING TESTING
Information Patent Application
ELECTRO-OPTIC SAMPLING PROBE AND MEASURING METHOD USING THE SAME
- Publication number 20020030500
- Publication date Mar 14, 2002
- FUMIO AKIKUNI
- G01 - MEASURING TESTING
Information Patent Application
Electro-optic sampling probe
- Publication number 20020017913
- Publication date Feb 14, 2002
- Toshiyuki Yagi
- G01 - MEASURING TESTING
Information Patent Application
ELECTRO-OPTICAL PROBE FOR OSCILLOSCOPE MEASURING SIGNAL WAVEFORM
- Publication number 20020011830
- Publication date Jan 31, 2002
- AKISHIGE ITO
- G01 - MEASURING TESTING
Information Patent Application
Electro-optic probe and magneto-optic probe
- Publication number 20020008533
- Publication date Jan 24, 2002
- ANDO ELECTRIC CO., LTD.
- Akishige Ito
- G01 - MEASURING TESTING
Information Patent Application
Pattern forming method
- Publication number 20010027019
- Publication date Oct 4, 2001
- Hiromu Ishii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Probe signal outputting apparatus
- Publication number 20010022338
- Publication date Sep 20, 2001
- Yoshiki Yanagisawa
- G01 - MEASURING TESTING
Information Patent Application
Probe signal outputting apparatus
- Publication number 20010022339
- Publication date Sep 20, 2001
- Yoshiki Yanagisawa
- G01 - MEASURING TESTING
Information Patent Application
Electro-optic probe
- Publication number 20010022340
- Publication date Sep 20, 2001
- Akishige Ito
- G01 - MEASURING TESTING

Tadao Nagatsuma

Person

Patents Grantslast 30 patents

Specific absorption rate measuring system, and a method thereof

Electro-optic apparatus for measuring signal potentials

Electro-optic probe and magneto-optic probe

Electro-optic sampling oscilloscope

Electro-optic probe

Pattern forming method

Electro-optic sampling probe and measuring method using the same

Probe for electro-optic sampling oscilloscope

Electro-optic sampling probe and a method for adjusting the same

Temperature-insensitive electro-optic probe

Electro-optic probe

Probe for electro-optic sampling oscilloscope

Electro-optic sampling probe comprising photodiodes insulated from...

Electro-optic sampling prober

Light receiving circuit for use in electro-optic sampling oscilloscope

Electro-optic sampling oscilloscope

Electro-optical probe for oscilloscope measuring signal waveform

Electrooptic probe

Electro-optic sampling probe

Electrooptic probe

Electro-optic probe

Timing generation circuit for electro-optic sampling oscilloscope

Electro-optic sampling probe having unit for adjusting quantity of...

Electrooptic probe

Probe for electro-optic sampling oscilloscope

Timing generation circuit for an electro-optic oscilloscope

Oscilloscope utilizing probe with electro-optic crystal

Electro-optical oscilloscope with improved sampling

Electro-optic sampling oscilloscope

Electro-optic probe

Patents Applicationslast 30 patents

SPECIFIC ABSORPTION RATE MEASURING SYSTEM, AND A METHOD THEREOF

Specific absorption rate measuring system, and a method thereof

PROBE FOR ELECTRO-OPTIC SAMPLING OSCILLOSCOPE

Electro-optic probe

ELECTRO-OPTIC SAMPLING PROBE AND MEASURING METHOD USING THE SAME

Electro-optic sampling probe

ELECTRO-OPTICAL PROBE FOR OSCILLOSCOPE MEASURING SIGNAL WAVEFORM

Electro-optic probe and magneto-optic probe

Pattern forming method

Probe signal outputting apparatus

Probe signal outputting apparatus

Electro-optic probe