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Tak Eun
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Ansan-shi, KR
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Patents Grants
last 30 patents
Information
Patent Grant
Inspection method of circuit substrate
Patent number
8,072,600
Issue date
Dec 6, 2011
Microinspection, Inc.
Tak Eun
G01 - MEASURING TESTING
Information
Patent Grant
Non-contact type apparatus for testing open and short circuits of a...
Patent number
7,746,086
Issue date
Jun 29, 2010
Microinspection, Inc.
Tak Eun
G01 - MEASURING TESTING
Information
Patent Grant
Contact type single side probe device and apparatus and method for...
Patent number
7,629,796
Issue date
Dec 8, 2009
Microinspection, Inc.
Tak Eun
G01 - MEASURING TESTING
Information
Patent Grant
Authentication method using cellular phone in internet
Patent number
7,447,784
Issue date
Nov 4, 2008
MicroInspection, Inc.
Tak Eun
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection apparatus and method adapted to a scanning technique emp...
Patent number
6,753,684
Issue date
Jun 22, 2004
MicroInspection, Inc.
Tak Eun
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Inspection method of circuit substrate
Publication number
20100002232
Publication date
Jan 7, 2010
MICROINSPECTION, INC.
Tak Eun
G01 - MEASURING TESTING
Information
Patent Application
Noncontact type single side probe device and apparatus and method f...
Publication number
20080018339
Publication date
Jan 24, 2008
MICROINSPECTION, INC.
Tak Eun
G02 - OPTICS
Information
Patent Application
Non-contact type single side probe structure
Publication number
20080017508
Publication date
Jan 24, 2008
MICROINSPECTION, INC.
Tak Eun
G01 - MEASURING TESTING
Information
Patent Application
Contact type single side probe device and apparatus and method for...
Publication number
20080018338
Publication date
Jan 24, 2008
MICROINSPECTION, INC.
Tak Eun
G01 - MEASURING TESTING
Information
Patent Application
Inspection apparatus and method adapted to a scanning technique emp...
Publication number
20030006757
Publication date
Jan 9, 2003
Tak Eun
G01 - MEASURING TESTING