Membership
Tour
Register
Log in
Takaaki Nagai
Follow
Person
Kobe, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Sample preparation apparatus, sample preparation system, sample pre...
Patent number
11,971,342
Issue date
Apr 30, 2024
Sysmex Corporation
Takaaki Nagai
G01 - MEASURING TESTING
Information
Patent Grant
Cell classification method, classification device, and program
Patent number
11,965,817
Issue date
Apr 23, 2024
Sysmex Corporation
Yuki Shida
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer and computer program product
Patent number
11,921,106
Issue date
Mar 5, 2024
Sysmex Corporation
Takaaki Nagai
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Sample analyzer and computer program product
Patent number
11,415,575
Issue date
Aug 16, 2022
Sysmex Corporation
Takaaki Nagai
G01 - MEASURING TESTING
Information
Patent Grant
Smear staining apparatus, smear preparing apparatus, and smear stai...
Patent number
11,402,305
Issue date
Aug 2, 2022
Sysmex Corporation
Takaaki Nagai
G01 - MEASURING TESTING
Information
Patent Grant
Specimen measurement system and specimen measurement method
Patent number
11,346,841
Issue date
May 31, 2022
Sysmex Corporation
Takaaki Nagai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Transport device, sample measurement system, and transport method
Patent number
11,340,245
Issue date
May 24, 2022
Sysmex Corporation
Takaaki Nagai
G01 - MEASURING TESTING
Information
Patent Grant
Sample preparation apparatus, sample preparation system, sample pre...
Patent number
11,226,279
Issue date
Jan 18, 2022
Sysmex Corporation
Takaaki Nagai
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer and computer program product
Patent number
10,401,350
Issue date
Sep 3, 2019
Sysmex Corporation
Takaaki Nagai
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer and computer program product
Patent number
10,401,351
Issue date
Sep 3, 2019
Sysmex Corporation
Takaaki Nagai
G01 - MEASURING TESTING
Information
Patent Grant
Sample processing apparatus and rack
Patent number
10,234,364
Issue date
Mar 19, 2019
SYSMEX CORPORATION
Takaaki Nagai
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Sample analyzer and computer program product
Patent number
10,209,244
Issue date
Feb 19, 2019
Sysmex Corporation
Takaaki Nagai
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Hematological analyzer, method for analyzing body fluid and compute...
Patent number
10,168,320
Issue date
Jan 1, 2019
SYSMEX CORPORATION
Takaaki Nagai
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer and computer program product
Patent number
10,151,746
Issue date
Dec 11, 2018
Sysmex Corporation
Takaaki Nagai
G01 - MEASURING TESTING
Information
Patent Grant
Analysis device and reagent container
Patent number
10,031,151
Issue date
Jul 24, 2018
Sysmex Corporation
Takaaki Nagai
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer and computer program product
Patent number
9,933,414
Issue date
Apr 3, 2018
SYSMEX CORPORATION
Takaaki Nagai
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer
Patent number
9,816,983
Issue date
Nov 14, 2017
SYSMEX CORPORATION
Daigo Fukuma
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer and reagent container
Patent number
9,795,967
Issue date
Oct 24, 2017
Sysmex Corporation
Takaaki Nagai
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Sample processing apparatus and rack
Patent number
9,733,161
Issue date
Aug 15, 2017
SYSMEX CORPORATION
Takaaki Nagai
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Sample processing apparatus
Patent number
9,638,610
Issue date
May 2, 2017
SYSMEX CORPORATION
Takaaki Nagai
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Analysis apparatus and analysis method
Patent number
9,638,709
Issue date
May 2, 2017
Sysmex Corporation
Takaaki Nagai
G01 - MEASURING TESTING
Information
Patent Grant
Particle analyzer and particle analysis method
Patent number
9,429,509
Issue date
Aug 30, 2016
Sysmex Corporation
Takaaki Nagai
G01 - MEASURING TESTING
Information
Patent Grant
Analysis apparatus and measurement unit
Patent number
9,417,254
Issue date
Aug 16, 2016
Sysmex Corporation
Takaaki Nagai
G01 - MEASURING TESTING
Information
Patent Grant
Specimen processing system and specimen container classifying appar...
Patent number
9,417,253
Issue date
Aug 16, 2016
Sysmex Corporation
Yasuo Yonekura
G01 - MEASURING TESTING
Information
Patent Grant
Specimen analyzing apparatus
Patent number
9,395,382
Issue date
Jul 19, 2016
Sysmex Corporation
Takahito Mihara
G01 - MEASURING TESTING
Information
Patent Grant
Analysis device and reagent container
Patent number
9,377,477
Issue date
Jun 28, 2016
Sysmex Corporation
Takaaki Nagai
G01 - MEASURING TESTING
Information
Patent Grant
Specimen processing apparatus
Patent number
9,377,383
Issue date
Jun 28, 2016
Sysmex Corporation
Takaaki Nagai
G01 - MEASURING TESTING
Information
Patent Grant
Specimen transporter and specimen imaging system
Patent number
9,297,823
Issue date
Mar 29, 2016
Sysmex Corporation
Mitsuo Yamasaki
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer and sample analyzing method
Patent number
9,243,993
Issue date
Jan 26, 2016
Sysmex Corporation
Takaaki Nagai
G01 - MEASURING TESTING
Information
Patent Grant
Connection device and analyzer
Patent number
9,233,371
Issue date
Jan 12, 2016
Sysmex Corporation
Yoichi Nakamura
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Patents Applications
last 30 patents
Information
Patent Application
SPECIMEN MEASUREMENT SYSTEM AND SPECIMEN MEASUREMENT METHOD
Publication number
20240402179
Publication date
Dec 5, 2024
SYSMEX CORPORATION
Takaaki NAGAI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SPECIMEN ANALYZER AND SPECIMEN PROCESSING SYSTEM
Publication number
20240302398
Publication date
Sep 12, 2024
SYSMEX CORPORATION
Noriyuki Nakanishi
G01 - MEASURING TESTING
Information
Patent Application
BONE MARROW ASPIRATE ANALYSIS METHOD, SAMPLE ANALYZER, AND COMPUTER...
Publication number
20240219391
Publication date
Jul 4, 2024
SYSMEX CORPORATION
Fumiaki HAYASHI
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN MEASUREMENT APPARATUS AND SPECIMEN TRANSPORT DEVICE
Publication number
20240142482
Publication date
May 2, 2024
SYSMEX CORPORATION
Masashi Tada
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT APPARATUS AND ANALYSIS METHOD
Publication number
20230296522
Publication date
Sep 21, 2023
SYSMEX CORPORATION
Toshihiro MIZUKAMI
G01 - MEASURING TESTING
Information
Patent Application
REAGENT CONTAINER, REAGENT CONTAINER KIT, METHOD OF INSTALLING A RE...
Publication number
20230294099
Publication date
Sep 21, 2023
SYSMEX CORPORATION
Noriyuki NAKANISHI
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
SMEAR STAINING APPARATUS, SMEAR PREPARING APPARATUS, AND SMEAR STAI...
Publication number
20220357248
Publication date
Nov 10, 2022
SYSMEX CORPORATION
Takaaki NAGAI
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN MEASUREMENT SYSTEM AND SPECIMEN MEASUREMENT METHOD
Publication number
20220221461
Publication date
Jul 14, 2022
SYSMEX CORPORATION
Takaaki NAGAI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SAMPLE ANALYZER AND COMPUTER PROGRAM PRODUCT
Publication number
20220170912
Publication date
Jun 2, 2022
SYSMEX CORPORATION
Takaaki Nagai
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Application
SAMPLE PREPARATION APPARATUS, SAMPLE PREPARATION SYSTEM, SAMPLE PRE...
Publication number
20220091016
Publication date
Mar 24, 2022
SYSMEX CORPORATION
Takaaki NAGAI
G01 - MEASURING TESTING
Information
Patent Application
CELL CLASSIFICATION METHOD, CLASSIFICATION DEVICE, AND PROGRAM
Publication number
20210293692
Publication date
Sep 23, 2021
SYSMEX CORPORATION
Yuki SHIDA
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN MEASUREMENT SYSTEM AND SPECIMEN MEASUREMENT METHOD
Publication number
20200096515
Publication date
Mar 26, 2020
SYSMEX CORPORATION
Takaaki NAGAI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
BLOOD MEASURING DEVICE CONTROL METHOD
Publication number
20190391171
Publication date
Dec 26, 2019
Sysmex Corporation
Takaaki NAGAI
G01 - MEASURING TESTING
Information
Patent Application
TRANSPORT DEVICE, SAMPLE MEASUREMENT SYSTEM, AND TRANSPORT METHOD
Publication number
20190346465
Publication date
Nov 14, 2019
SYSMEX CORPORATION
Takaaki NAGAI
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE ANALYZER AND COMPUTER PROGRAM PRODUCT
Publication number
20190339258
Publication date
Nov 7, 2019
SYSMEX CORPORATION
Takaaki NAGAI
G01 - MEASURING TESTING
Information
Patent Application
Sample Analyzer and Computer Program Product
Publication number
20190219568
Publication date
Jul 18, 2019
Sysmex Corporation
Takaaki Nagai
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE ANALYZER AND COMPUTER PROGRAM PRODUCT
Publication number
20190170733
Publication date
Jun 6, 2019
SYSMEX CORPORATION
Takaaki Nagai
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE ANALYZER AND COMPUTER PROGRAM PRODUCT
Publication number
20190107533
Publication date
Apr 11, 2019
SYSMEX CORPORATION
Takaaki Nagai
G01 - MEASURING TESTING
Information
Patent Application
SMEAR STAINING APPARATUS, SMEAR PREPARING APPARATUS, AND SMEAR STAI...
Publication number
20180356319
Publication date
Dec 13, 2018
SYSMEX CORPORATION
Takaaki NAGAI
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE PREPARATION APPARATUS, SAMPLE PREPARATION SYSTEM, SAMPLE PRE...
Publication number
20180348112
Publication date
Dec 6, 2018
SYSMEX CORPORATION
Takaaki NAGAI
G01 - MEASURING TESTING
Information
Patent Application
TRANSPORTING APPARATUS, TRANSPORTING METHOD, AND SAMPLE ANALYSIS SY...
Publication number
20180313861
Publication date
Nov 1, 2018
SYSMEX CORPORATION
Kei TAKAI
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE ANALYZER AND COMPUTER PROGRAM PRODUCT
Publication number
20180188236
Publication date
Jul 5, 2018
SYSMEX CORPORATION
Takaaki Nagai
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Application
SAMPLE PROCESSING APPARATUS AND RACK
Publication number
20170363521
Publication date
Dec 21, 2017
SYSMEX CORPORATION
Takaaki NAGAI
G01 - MEASURING TESTING
Information
Patent Application
BLOOD MEASURING DEVICE AND BLOOD MEASURING DEVICE CONTROL METHOD
Publication number
20160282377
Publication date
Sep 29, 2016
SYSMEX CORPORATION
Takaaki NAGAI
G01 - MEASURING TESTING
Information
Patent Application
ANALYSIS DEVICE AND REAGENT CONTAINER
Publication number
20160266161
Publication date
Sep 15, 2016
SYSMEX CORPORATION
Takaaki NAGAI
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE ANALYZER AND REAGENT CONTAINER
Publication number
20150273466
Publication date
Oct 1, 2015
SYSMEX CORPORATION
Takaaki NAGAI
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
SAMPLE ANALYZER
Publication number
20150192573
Publication date
Jul 9, 2015
SYSMEX CORPORATION
Daigo FUKUMA
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE PROCESSING APPARATUS AND RACK
Publication number
20150185120
Publication date
Jul 2, 2015
SYSMEX CORPORATION
Takaaki NAGAI
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE PROCESSING APPARATUS
Publication number
20150185119
Publication date
Jul 2, 2015
SYSMEX CORPORATION
Takaaki NAGAI
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE ANALYZER AND COMPUTER PROGRAM PRODUCT
Publication number
20150132791
Publication date
May 14, 2015
SYSMEX CORPORATION
Takaaki NAGAI
G01 - MEASURING TESTING