Takahiro Jingu

Person

Takasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sample for coordinates calibration and method for fabricating the same
- Patent number 10,444,011
- Issue date Oct 15, 2019
- Hitachi High-Technologies Corporation
- Takahiro Jingu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Defect inspection method, low light detecting method, and low light...
- Patent number 10,261,026
- Issue date Apr 16, 2019
- Hitachi High-Technologies Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and adjusting method
- Patent number 9,885,670
- Issue date Feb 6, 2018
- Hitachi High-Technologies Corporation
- Takahiro Jingu
- G01 - MEASURING TESTING
Information Patent Grant
Surface measurement apparatus
- Patent number 9,823,065
- Issue date Nov 21, 2017
- Hitachi High-Technologies Corporation
- Takanori Kondo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection device and image capture element
- Patent number 9,791,380
- Issue date Oct 17, 2017
- HITACTHI HIGH-TECHNOLOGIES CORPORATION
- Takahiro Jingu
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and measurement device
- Patent number 9,779,912
- Issue date Oct 3, 2017
- Hitachi High-Technologies Corporation
- Masami Makuuchi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Inspection device
- Patent number 9,759,669
- Issue date Sep 12, 2017
- Hitachi High-Technologies Corporation
- Takahiro Jingu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 9,645,094
- Issue date May 9, 2017
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting defect with time/spatial division optical...
- Patent number 9,602,780
- Issue date Mar 21, 2017
- Hitachi High-Technologies Corporation
- Masaaki Ito
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Defect inspection method, low light detecting method and low light...
- Patent number 9,588,054
- Issue date Mar 7, 2017
- Hitachi High-Technologies Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device
- Patent number 9,568,437
- Issue date Feb 14, 2017
- Hitachi High-Technologies Corporation
- Shunichi Matsumoto
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 9,568,439
- Issue date Feb 14, 2017
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system
- Patent number 9,535,009
- Issue date Jan 3, 2017
- Hitachi High-Technologies Corporation
- Kenshiro Ohtsubo
- G01 - MEASURING TESTING
Information Patent Grant
Surface measurement device
- Patent number 9,366,625
- Issue date Jun 14, 2016
- Hitachi High-Technologies Corporation
- Masaaki Ito
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 9,329,136
- Issue date May 3, 2016
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Surface shape measuring apparatus
- Patent number 9,310,190
- Issue date Apr 12, 2016
- Hitachi High-Technologies Corporation
- Masaaki Ito
- G01 - MEASURING TESTING
Information Patent Grant
Surface-defect inspection device
- Patent number 9,019,490
- Issue date Apr 28, 2015
- Hitachi High-Technologies Corporation
- Katsuya Suzuki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Inspection method and inspection device
- Patent number 9,007,581
- Issue date Apr 14, 2015
- Hitachi High-Technologies Corporation
- Izuo Horai
- G01 - MEASURING TESTING
Information Patent Grant
Surface shape measuring apparatus
- Patent number 8,958,076
- Issue date Feb 17, 2015
- Hitachi High-Technologies Corporation
- Kazuo Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and defect inspection device
- Patent number 8,908,171
- Issue date Dec 9, 2014
- Hitachi High-Technologies Corporation
- Masami Makuuchi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus
- Patent number 8,902,417
- Issue date Dec 2, 2014
- Hitachi High-Technologies Corporation
- Nobuaki Hirose
- G01 - MEASURING TESTING
Information Patent Grant
Photoelectric conversion element, defect inspecting apparatus, and...
- Patent number 8,884,207
- Issue date Nov 11, 2014
- Hitachi High-Technologies Corporation
- Hiroshi Kawaguchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Inspecting apparatus and an inspecting method
- Patent number 8,831,899
- Issue date Sep 9, 2014
- Hitachi High-Technologies Corporation
- Kazunori Nemoto
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Examination method and examination device
- Patent number 8,587,777
- Issue date Nov 19, 2013
- Hitachi High-Technologies Corporation
- Takahiro Jingu
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 8,563,958
- Issue date Oct 22, 2013
- Hitachi High-Technologies Corporation
- Kazuo Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Surface-defect inspection device
- Patent number 8,547,546
- Issue date Oct 1, 2013
- Hitachi High-Technologies Corporation
- Katsuya Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Defects inspecting apparatus and defects inspecting method
- Patent number 8,508,727
- Issue date Aug 13, 2013
- Hitachi High-Technologies Corporation
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Grant
Method of apparatus for detecting particles on a specimen
- Patent number 8,289,507
- Issue date Oct 16, 2012
- Hitachi High-Technologies Corporation
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and inspection apparatus
- Patent number 8,269,959
- Issue date Sep 18, 2012
- Hitachi High-Technologies Corporation
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Defects inspecting apparatus and defects inspecting method
- Patent number 8,228,495
- Issue date Jul 24, 2012
- Hitachi High-Technologies Corporation
- Sachio Uto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Device
- Publication number 20200266027
- Publication date Aug 20, 2020
- Hitachi High-Technologies Corporation
- Takahiro JINGU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample for Coordinates Calibration and Method for Fabricating the Same
- Publication number 20170268870
- Publication date Sep 21, 2017
- Hitachi High-Technologies Corporation
- Takahiro Jingu
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD, LOW LIGHT DETECTING METHOD, AND LOW LIGHT...
- Publication number 20170115231
- Publication date Apr 27, 2017
- Hitachi High-Technologies Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20170102339
- Publication date Apr 13, 2017
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Application
Inspection Device and Measurement Device
- Publication number 20160322193
- Publication date Nov 3, 2016
- Hitachi High-Technologies Corporation
- Masami MAKUUCHI
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20160216217
- Publication date Jul 28, 2016
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Application
SURFACE SHAPE MEASURING APPARATUS
- Publication number 20160178360
- Publication date Jun 23, 2016
- Hitachi High-Technologies Corporation
- Masaaki Ito
- G01 - MEASURING TESTING
Information Patent Application
Inspection Device
- Publication number 20160139059
- Publication date May 19, 2016
- Hitachi High-Technologies Corporation
- Shunichi MATSUMOTO
- G01 - MEASURING TESTING
Information Patent Application
Surface Measurement Apparatus
- Publication number 20150354947
- Publication date Dec 10, 2015
- Hitachi High-Technologies Corporation
- Takanori KONDO
- G01 - MEASURING TESTING
Information Patent Application
Inspection Apparatus and Adjusting Method
- Publication number 20150346112
- Publication date Dec 3, 2015
- Hitachi High-Technologies Corporation
- Takahiro Jingu
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20150293034
- Publication date Oct 15, 2015
- Hitachi High-Technologies Corporation
- Masami Makuuchi
- G01 - MEASURING TESTING
Information Patent Application
Inspection Device
- Publication number 20150177161
- Publication date Jun 25, 2015
- Hitachi High-Technologies Corporation
- Takahiro Jingu
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20150146200
- Publication date May 28, 2015
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM
- Publication number 20150131087
- Publication date May 14, 2015
- Hitachi High-Technologies Corporation
- Kenshiro Ohtsubo
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE
- Publication number 20150116702
- Publication date Apr 30, 2015
- Hitachi High-Technologies Corporation
- Shunichi Matsumoto
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND IMAGE CAPTURE ELEMENT
- Publication number 20150109434
- Publication date Apr 23, 2015
- Hitachi High-Technologies Corporation
- Takahiro Jingu
- G01 - MEASURING TESTING
Information Patent Application
SURFACE MEASUREMENT DEVICE
- Publication number 20140375988
- Publication date Dec 25, 2014
- Masaaki Ito
- G01 - MEASURING TESTING
Information Patent Application
SURFACE SHAPE MEASURING APPARATUS
- Publication number 20140198321
- Publication date Jul 17, 2014
- Hitachi High-Technologies Corporation
- Masaaki Ito
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD, LOW LIGHT DETECTING METHOD AND LOW LIGHT...
- Publication number 20130321798
- Publication date Dec 5, 2013
- Hitachi High-Technologies Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Application
SURFACE-DEFECT INSPECTION DEVICE
- Publication number 20130314700
- Publication date Nov 28, 2013
- Hitachi High-Technologies Corporation
- Katsuya SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS
- Publication number 20130286385
- Publication date Oct 31, 2013
- Hitachi High-Technologies Corporation
- Yusuke Miyazaki
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE
- Publication number 20130286387
- Publication date Oct 31, 2013
- Hitachi High-Technologies Corporation
- Masami Makuuchi
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS
- Publication number 20130286191
- Publication date Oct 31, 2013
- Hitachi High-Technologies Corporation
- Masaaki Ito
- G01 - MEASURING TESTING
Information Patent Application
Measuring Apparatus
- Publication number 20130278926
- Publication date Oct 24, 2013
- Hitachi High-Technologies Corporation
- Kazuo Takahashi
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS
- Publication number 20130271754
- Publication date Oct 17, 2013
- Hitachi High-Technologies Corporation
- Nobuaki Hirose
- G01 - MEASURING TESTING
Information Patent Application
Inspection Tool and Image Pickup Device
- Publication number 20130258093
- Publication date Oct 3, 2013
- Hitachi High-Technologies Corporation
- Takahiro JINGU
- G01 - MEASURING TESTING
Information Patent Application
PHOTOELECTRIC CONVERSION ELEMENT, DEFECT INSPECTING APPARATUS, AND...
- Publication number 20130161490
- Publication date Jun 27, 2013
- Hiroshi Kawaguchi
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD AND INSPECTION DEVICE
- Publication number 20130010281
- Publication date Jan 10, 2013
- Hitachi High-Technologies Corporation
- Izuo Horai
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTION DEVICE AND SURFACE INSPECTION METHOD
- Publication number 20130010290
- Publication date Jan 10, 2013
- Hitachi High-Technologies Corporation
- Kazuo Takahashi
- G01 - MEASURING TESTING
Information Patent Application
DEFECTS INSPECTING APPARATUS AND DEFECTS INSPECTING METHOD
- Publication number 20120262709
- Publication date Oct 18, 2012
- Sachio Uto
- G06 - COMPUTING CALCULATING COUNTING

Takahiro Jingu

Person

Patents Grantslast 30 patents

Sample for coordinates calibration and method for fabricating the same

Defect inspection method, low light detecting method, and low light...

Inspection apparatus and adjusting method

Surface measurement apparatus

Inspection device and image capture element

Inspection device and measurement device

Inspection device

Defect inspection device and defect inspection method

Apparatus for inspecting defect with time/spatial division optical...

Defect inspection method, low light detecting method and low light...

Inspection device

Defect inspection device and defect inspection method

Inspection system

Surface measurement device

Defect inspection device and defect inspection method

Surface shape measuring apparatus

Surface-defect inspection device

Inspection method and inspection device

Surface shape measuring apparatus

Defect inspection method and defect inspection device

Inspection apparatus

Photoelectric conversion element, defect inspecting apparatus, and...

Inspecting apparatus and an inspecting method

Examination method and examination device

Inspection apparatus and inspection method

Surface-defect inspection device

Defects inspecting apparatus and defects inspecting method

Method of apparatus for detecting particles on a specimen

Inspection method and inspection apparatus

Defects inspecting apparatus and defects inspecting method

Patents Applicationslast 30 patents

Charged Particle Beam Device

Sample for Coordinates Calibration and Method for Fabricating the Same

DEFECT INSPECTION METHOD, LOW LIGHT DETECTING METHOD, AND LOW LIGHT...

DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

Inspection Device and Measurement Device

DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

SURFACE SHAPE MEASURING APPARATUS

Inspection Device

Surface Measurement Apparatus

Inspection Apparatus and Adjusting Method

INSPECTION DEVICE AND INSPECTION METHOD

Inspection Device

DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

INSPECTION SYSTEM

DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE

INSPECTION DEVICE AND IMAGE CAPTURE ELEMENT

SURFACE MEASUREMENT DEVICE

SURFACE SHAPE MEASURING APPARATUS

DEFECT INSPECTION METHOD, LOW LIGHT DETECTING METHOD AND LOW LIGHT...

SURFACE-DEFECT INSPECTION DEVICE

INSPECTION APPARATUS

DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE

INSPECTION APPARATUS

Measuring Apparatus

INSPECTION APPARATUS

Inspection Tool and Image Pickup Device

PHOTOELECTRIC CONVERSION ELEMENT, DEFECT INSPECTING APPARATUS, AND...

INSPECTION METHOD AND INSPECTION DEVICE

SURFACE INSPECTION DEVICE AND SURFACE INSPECTION METHOD

DEFECTS INSPECTING APPARATUS AND DEFECTS INSPECTING METHOD