Takahisa HIRAIDE

Person

Shinjuku, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Writing circuit, semiconductor integrated circuit and writing method
- Patent number 8,644,093
- Issue date Feb 4, 2014
- Fujitsu Limited
- Takahisa Hiraide
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for identifying paths having appropriate lengt...
- Patent number 8,166,380
- Issue date Apr 24, 2012
- Fujitsu Limited
- Takahisa Hiraide
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit and method for testing the circuit
- Patent number 8,081,528
- Issue date Dec 20, 2011
- Fujitsu Semiconductor Limited
- Takahisa Hiraide
- G11 - INFORMATION STORAGE
Information Patent Grant
Pseudorandom number generator, semiconductor integrated circuit, ps...
- Patent number 7,895,492
- Issue date Feb 22, 2011
- Fujitsu Limited
- Takahisa Hiraide
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit, test data generating device, LSI...
- Patent number 7,761,761
- Issue date Jul 20, 2010
- Fujitsu Limited
- Tatsuru Matsuo
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit, test data generating device, LSI...
- Patent number 7,757,138
- Issue date Jul 13, 2010
- Fujitsu Limited
- Tatsuru Matsuo
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus and testing method for an integrated circuit, and...
- Patent number 7,734,973
- Issue date Jun 8, 2010
- Fujitsu Microelectronics Limited
- Takahisa Hiraide
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for diagnosing integrated circuit
- Patent number 7,337,379
- Issue date Feb 26, 2008
- Fujitsu Limited
- Takahisa Hiraide
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for testing integrated circuit
- Patent number 7,266,746
- Issue date Sep 4, 2007
- Fujitsu Limited
- Takahisa Hiraide
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus and testing method for an integrated circuit, and...
- Patent number 7,178,078
- Issue date Feb 13, 2007
- Fujitsu Limited
- Takahisa Hiraide
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test pattern preparation system
- Patent number 5,815,513
- Issue date Sep 29, 1998
- Fujitsu Limited
- Takahisa Hiraide
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WRITING CIRCUIT, SEMICONDUCTOR INTEGRATED CIRCUIT AND WRITING METHOD
- Publication number 20130039114
- Publication date Feb 14, 2013
- Fujitsu Limited
- Takahisa HIRAIDE
- G11 - INFORMATION STORAGE
Information Patent Application
INTEGRATED CIRCUIT AND METHOD FOR TESTING THE CIRCUIT
- Publication number 20090245001
- Publication date Oct 1, 2009
- Fujitsu Microelectronics Limited
- Takahisa HIRAIDE
- G11 - INFORMATION STORAGE
Information Patent Application
Pseudorandom number generator, semiconductor integrated circuit, ps...
- Publication number 20080222474
- Publication date Sep 11, 2008
- FUJITSU LIMITED
- Takahisa Hiraide
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor integrated circuit, test data generating device, lsi...
- Publication number 20070288821
- Publication date Dec 13, 2007
- FUJITSU LIMITED
- Tatsuru Matsuo
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit, test data generating device, lsi...
- Publication number 20070288819
- Publication date Dec 13, 2007
- FUJITSU LIMITED
- Tatsuru Matsuo
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for identifying paths having appropriate lengt...
- Publication number 20070245197
- Publication date Oct 18, 2007
- FUJITSU LIMITED
- Takahisa Hiraide
- G01 - MEASURING TESTING
Information Patent Application
Testing apparatus and testing method for an integrated circuit, and...
- Publication number 20070168816
- Publication date Jul 19, 2007
- FUJITSU LIMITED
- Takahisa Hiraide
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Device and method for testing integrated circuit
- Publication number 20050149804
- Publication date Jul 7, 2005
- FUJITSU LIMITED
- Takahisa Hiraide
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for diagnosing integrated circuit, and integra...
- Publication number 20030229838
- Publication date Dec 11, 2003
- FUJITSU LIMITED
- Takahisa Hiraide
- G01 - MEASURING TESTING
Information Patent Application
Testing apparatus and testing method for an integrated circuit, and...
- Publication number 20020124217
- Publication date Sep 5, 2002
- FUJITSU LIMITED
- Takahisa Hiraide
- G01 - MEASURING TESTING

Takahisa HIRAIDE

Person

Patents Grantslast 30 patents

Writing circuit, semiconductor integrated circuit and writing method

Method and apparatus for identifying paths having appropriate lengt...

Integrated circuit and method for testing the circuit

Pseudorandom number generator, semiconductor integrated circuit, ps...

Semiconductor integrated circuit, test data generating device, LSI...

Semiconductor integrated circuit, test data generating device, LSI...

Testing apparatus and testing method for an integrated circuit, and...

Apparatus and method for diagnosing integrated circuit

Device and method for testing integrated circuit

Testing apparatus and testing method for an integrated circuit, and...

Test pattern preparation system

Patents Applicationslast 30 patents

WRITING CIRCUIT, SEMICONDUCTOR INTEGRATED CIRCUIT AND WRITING METHOD

INTEGRATED CIRCUIT AND METHOD FOR TESTING THE CIRCUIT

Pseudorandom number generator, semiconductor integrated circuit, ps...

Semiconductor integrated circuit, test data generating device, lsi...

Semiconductor integrated circuit, test data generating device, lsi...

Method and apparatus for identifying paths having appropriate lengt...

Testing apparatus and testing method for an integrated circuit, and...

Device and method for testing integrated circuit

Apparatus and method for diagnosing integrated circuit, and integra...

Testing apparatus and testing method for an integrated circuit, and...