Patent Application
20080222474
This application is based upon and claims the benefit of priority from the prior Japanese Patent Application No. 2007-057790, filed on Mar. 7, 2007, the entire contents of which are incorporated herein by reference.
1. Field of the Invention
The present invention relates to a technology of a built-in self test (BIST) and a pseudorandom number generator.
2. Description of the Related Art
In recent years, as a test method for a semiconductor integrated circuit, a BIST using a pseudorandom number generator, such as a linear feedback shift register (LFSR) is utilized for the purpose of, for example, reducing test time.
Like the LFSR 1200, the use of an n-bit shift register enables output of a test pattern having a maximum cycle of 2n-1. For example, as shown in
When a BIST is performed on the circuit-under-test 1300, an external control signal is first input to set seed values of the LFSR 1200. Based on the input of the external control signal, a control signal is supplied to the LFSR 1200 resulting in values of a test pattern output from the LFSR 1200 to be sequentially input into the first F/Fs in the respective scan paths 1310 to 1340. Subsequently, values stored in the F/Fs are output at each system clock, and output results from each of the scan paths 1310 to 1340 are compressed and stored in the MISR 1350.
Providing the LFSR 1200 in the circuit-under-test 1300 in this manner enables the BIST of the circuit-under-test 1300 to be performed using many test patterns. However, outputting test patterns from the LFSR 1200 that match test patterns having a high failure detection rate automatically generated from an automatic test pattern generator (ATPG) is a problem.
Thus, a test method of correcting each test pattern output from the LFSR based on the input of the external control signal or correcting the seed value of the LFSR to match each test pattern output from the LFSR with each test pattern having a high failure detection rate automatically generated by the ATPG (hereinafter, “ATPG pattern”) has been disclosed (see, for example, Japanese Patent Application Laid-open No. 2002-236144 and Published Japanese Translation of PCT Application No. 2003-518245). According to such a test method, the BIST using test patterns having a high failure detection rate can be efficiently carried out in a short period of time without requiring a high-capacity memory to store a large number of test patterns.
However, in the technologies disclosed in Japanese Patent Application Laid-open No. 2002-236144 and Published Japanese Translation of PCT Application No. 2003-518245, since the factor of the time (clock count) is not considered, the time required to perform the test cannot be reduced in view of the time involved for the correction of the test patterns.
(3) Subsequently, seed values “0001” are again set with respect to the LFSR. At this time, a clock count of 4 is required. (4) The LFSR is shifted for five bits that are matched with the ATPG pattern. At this time, a clock count of 5 is required. (5) A seed value “0 . . . ” is again set with respect to the LFSR. At this time, a clock count of 4 is required. A clock count required for the processing (1) to (5) is 21.
When the seed value is again set with respect to the four-bit shift register in this manner, a control signal having at least a clock count of 4 is required. Therefore, the time required for testing cannot be reduced in view of the clock count involved in correction of the test pattern.
It is an object of the present invention to at least solve the above problems in the conventional technologies.
A pseudorandom number generator according to one aspect of the present invention includes a shift register that outputs a pseudorandom number of a plurality of bits; and a phase change circuit that changes, based on input of an external control signal, a phase for the pseudorandom number to be output by the shift register.
A semiconductor integrated circuit according to another aspect of the present invention includes a pseudorandom number generator that generates a test pattern, and includes a shift register that outputs a pseudorandom number of a plurality of bits and a phase change circuit that changes, based on input of an external control signal, a phase for the test pattern to be output by the shift register; and a circuit-under-test that receives the test pattern output by pseudorandom number generator.
A semiconductor integrated circuit according to still another aspect of the present invention includes a pseudorandom number generator that generates an indeterminate mask pattern, and includes a shift register that outputs a pseudorandom number of a plurality of bits, and a phase change circuit that changes, based on input of an external control signal, a phase for the indeterminate mask pattern to be output by the shift register. The semiconductor integrated circuit further includes a circuit-under-test; and an indeterminate mask unit that, using the indeterminate mask pattern output from the pseudorandom number generator, masks an indeterminate value in an output pattern output from the circuit-under-test.
A computer-readable recording medium according to yet another aspect of the present invention stores therein design data concerning a semiconductor integrated circuit that includes a pseudorandom number generator that generates a test pattern, and has a shift register that outputs a pseudorandom number of a plurality of bits and a phase change circuit that changes, based on input of an external control signal, a phase for the test pattern to be output by the shift register; and a circuit-under-test that receives the test pattern output by pseudorandom number generator.
A computer-readable recording medium according to still another aspect of the present invention stores therein design data concerning a semiconductor integrated circuit that includes a pseudorandom number generator that generates an indeterminate mask pattern, and has a shift register that outputs a pseudorandom number of a plurality of bits and a phase change circuit that changes, based on input of an external control signal, a phase for the indeterminate mask pattern to be output by the shift register; a circuit-under-test; and an indeterminate mask unit that, using the indeterminate mask pattern output from the pseudorandom number generator, masks an indeterminate value in an output pattern output from the circuit-under-test.
A pseudorandom number generator control method according to yet another aspect of the present invention is for a pseudorandom number generator that generates a test pattern, and includes a shift register that outputs a pseudorandom number of a plurality of bits and a phase change circuit that changes, based on input of an external control signal, a phase for the test pattern to be output by the shift register. The pseudorandom number generator control method includes acquiring a test pattern generated before phase change and an automatic test pattern generator (ATPG) pattern output from an ATPG; extracting the ATPG pattern, acquired at the acquiring, in units of blocks; retrieving, from the test pattern acquired at the acquiring and with respect to each block extracted at the extracting, a plurality of signals that match a plurality of signals included in a block extracted at the extracting; determining, based on the signals retrieved at the retrieving, a control signal to be output to the pseudorandom number generator; and outputting the control signal to the pseudorandom number generator.
A pseudorandom number generator control method according to still another aspect of the present invention is for a pseudorandom number generator that generates an indeterminate mask pattern, and includes a shift register that outputs a pseudorandom number of a plurality of bits and a phase change circuit that changes, based on input of an external control signal, a phase for the indeterminate mask pattern to be output by the shift register. The pseudorandom number generator control method includes acquiring an indeterminate mask pattern generated before phase change and an output test pattern output from a circuit-under-test; extracting the output test pattern, acquired at the acquiring, in units of blocks; retrieving, from the indeterminate mask pattern acquired at the acquiring and with respect to each block extracted at the extracting, a plurality of signals that match a plurality of signals included in a block extracted at the extracting; determining, based on the signals retrieved at the retrieving, a control signal to be output to the pseudorandom number generator; and outputting the control signal to the pseudorandom number generator.
A computer-readable recording medium according to yet another aspect of the present invention stores therein a pseudorandom number generator control computer-program for a pseudorandom number generator that generates a test pattern, and includes a shift register that outputs a pseudorandom number of a plurality of bits and a phase change circuit that changes, based on input of an external control signal, a phase for the test pattern to be output by the shift register, wherein the pseudorandom number generator control computer-program causes a computer to execute acquiring a test pattern generated before phase change and an automatic test pattern generator (ATPG) pattern output from an ATPG; extracting the ATPG pattern, acquired at the acquiring, in units of blocks; retrieving, from the test pattern acquired at the acquiring and with respect to each block extracted at the extracting, a plurality of signals that match a plurality of signals included in a block extracted at the extracting; determining, based on the signals retrieved at the retrieving, a control signal to be output to the pseudorandom number generator; and outputting the control signal to the pseudorandom number generator.
A computer-readable recording medium according to yet another aspect of the present invention stores therein a pseudorandom number generator control computer-program for a pseudorandom number generator that generates an indeterminate mask pattern, and includes a shift register that outputs a pseudorandom number of a plurality of bits and a phase change circuit that changes, based on input of an external control signal, a phase for the indeterminate mask pattern to be output by the shift register, wherein the pseudorandom number generator control computer-program causes a computer to execute acquiring an indeterminate mask pattern generated before phase change and an output test pattern output from a circuit-under-test; extracting the output test pattern, acquired at the acquiring, in units of blocks; retrieving, from the indeterminate mask pattern acquired at the acquiring and with respect to each block extracted at the extracting, a plurality of signals that match a plurality of signals included in a block extracted at the extracting; determining, based on the signals retrieved at the retrieving, a control signal to be output to the pseudorandom number generator; and outputting the control signal to the pseudorandom number generator.
A pseudorandom number generator control apparatus according to still another aspect of the present invention is for a pseudorandom number generator that generates a test pattern, and includes a shift register that outputs a pseudorandom number of a plurality of bits and a phase change circuit that changes, based on input of an external control signal, a phase for the test pattern to be output by the shift register. The pseudorandom number generator control apparatus includes an acquiring unit that acquires a test pattern generated before phase change and an automatic test pattern generator (ATPG) pattern output from an ATPG; an extracting unit that extracts the ATPG pattern, acquired by the acquiring unit, in units of blocks; a retrieving unit that retrieves, from the test pattern acquired by the acquiring unit and with respect to each block extracted by the extracting unit, a plurality of signals that match a plurality of signals included in a block extracted by the extracting unit; a determining unit that determines, based on the signals retrieved by the retrieving unit, a control signal to be output to the pseudorandom number generator; and an output unit that outputs the control signal to the pseudorandom number generator.
A pseudorandom number generator control apparatus according to yet another aspect of the present invention is for a pseudorandom number generator that generates an indeterminate mask pattern, and includes a shift register that outputs a pseudorandom number of a plurality of bits and a phase change circuit that changes, based on input of an external control signal, a phase for the indeterminate mask pattern to be output by the shift register. The pseudorandom number generator control apparatus includes an acquiring unit that acquires an indeterminate mask pattern generated before phase change and an output test pattern output from a circuit-under-test; an extracting unit that extracts the output test pattern, acquired by the acquiring unit, in units of blocks; a retrieving unit that retrieves, from the indeterminate mask pattern acquired by the acquiring unit and with respect to each block extracted at by the extracting unit, a plurality of signals that match a plurality of signals included in a block extracted by the extracting unit; a determining unit that determines, based on the signals retrieved by the retrieving unit, a control signal to be output to the pseudorandom number generator; and an output unit that outputs the control signal to the pseudorandom number generator.
The other objects, features, and advantages of the present invention are specifically set forth in or will become apparent from the following detailed description of the invention when read in conjunction with the accompanying drawings.
Referring to the accompanying drawings, exemplary embodiments according to the present invention are explained in detail below.
In the LFSR 100, a phase change circuit is formed that is mainly formed of an XOR circuit and a multiplexer and in the output of a test pattern from the shift register (hereinafter, “test pattern”), can change, e.g., advance, a given phase for the test pattern. For simplicity, a part of the phase change circuit is omitted in
Upon receiving a control signal having a clock count of 1, the phase change circuit can advance the phase by “1(20)”, “2(21)”, “4(22)”, or “8(23)” phases according to the control signal.
A method of determining the phase change performed by the phase change circuit is explained. For example, like the LFSR 100 depicted in
For example, a circuit that advances a phase “2” steps is represented by the following expression (4).
For example, {0,0,1,0} in the first row is indicative of a circuit that sets a value of the F/F (X3) with respect to the F/F (X1). {0,0,0,1} in the second row is indicative of a circuit that sets a value of the F/F (X4) with respect to the F/F (X2).
{1,0,0,1} in the third row is indicative of a circuit that sets an exclusive OR of the F/F (X1) and the F/F (X4) with respect to the F/F (X3). {1,1,0,1} in the fourth row is indicative of a circuit that sets an exclusive OR of the F/F (X1), the F/F (X2), and the F/F (X4) with respect to the F/F (X4).
In the phase change circuit, for example, as shown in
Thus, when a control signal indicating that a phase is advanced by “2 (21)” steps is input to the phase change circuit, a phase of the test pattern output from the LFSR can be advanced by “2 (21)” steps, thereby outputting the test pattern “1100100011 . . . ”. As a result, the test patterns can be matched with each other.
For example, when advancing a phase of the test pattern by “15” steps, control signals having a clock count of only 4 (a control signal indicative of advancing the phase by “1” step, a control signal indicative of advancing the phase by “2” steps, a control signal indicative of advancing the phase by “4” steps, and a control signal indicative of advancing the phase by “8” steps) to the phase change circuit can be input. For example, when advancing the phase for the test pattern by “8” steps, a control signal having a clock count of only 1 (a control signal indicative of advancing the phase by “8” steps) to the phase change circuit can be input.
(3) Subsequently, for the set values of the LFSR to become “0001”, a phase for the test pattern to be output from the LFSR is advanced by “2” steps by inputting a control signal indicating such to the LFSR. At this time, a clock count of 1 is required. (4) Then, the LFSR is shifted for five bits matched the ATPG pattern. At this time, a clock count of 5 is required.
(5) A phase for the test pattern to be output from the LFSR is advanced “3” times by inputting a control signal indicating such to the LFSR such that the set value of the LFSR becomes “0 . . . ”. At this time, a clock count of 2 is required. The clock number required in the processing (1) to (5) is 16. In this manner, the same processing can be executed with a signal count that is “5” less than that in the conventional test pattern matching method, i.e., a method of seed value resetting requiring clock counts of 4) explained with reference to
As explained above, the LFSR 100 according to the first embodiment includes the phase change circuit that can perform arbitrary phase advances for a test pattern output from the four-bit shift register based on the input of the control signal having a maximum clock count of 4 and an average clock count log24, thereby outputting a test pattern that matches the ATPG pattern using a smaller clock count. When the LFSR 100 is built in a circuit under test, a BIST using a test pattern having a high failure detection rate can be performed more efficiently in a short time without requiring a high-capacity memory to store a large number of test patterns.
In the LFSR 300, like the LFSR 100, a phase change circuit is formed that is mainly formed of the XOR circuit and a multiplexer, and can arbitrarily change phases for the test pattern by using an external control signal.
Here, the phase change circuit formed in the LFSR 300 receives one control signal and inverses values of bits associated with the control signal, thereby arbitrarily changing the phase for a test pattern.
For example, as shown in
Thus, when control signals indicating that the first bit, the second bit, and the third bit are inverted (three control signals in total) are input to the phase change circuit and the seed values of the shift register are changed to “0011”, a phase for the test pattern output from the LFSR 300 is advanced by “2” steps, thereby outputting a test pattern “1100100011 . . . ”. As a result, the patterns can be matched with each other.
The LFSR 300 according to the second embodiment includes the phase change circuit that can perform arbitrary phase change for a test pattern output from the four-bit shift register by inverting arbitrary bit values based on input of the control signal having a maximum clock count of 4 and an average clock count log24. Therefore, the LFSR 300 can output a test pattern that matches the ATPG pattern with a smaller clock count and a smaller circuit overhead. When the LFSR 300 is built in a circuit under test, a BIST using a test pattern having a high failure detection rate can be executed more efficiently in a short period of time without requiring a high-capacity memory to store a large number of test patterns.
The input LFSR 410, like the LFSR depicted in
The pattern correction circuit 420 is formed of, for example, an XOR circuit that inverts a test pattern output from the input LFSR 410 based on input of a control signal from the LFSR control apparatus 800. As a result, the pattern correction circuit 420 corrects the test pattern output from the input LFSR 410 based on input of the control signal from the LFSR control apparatus 800 and then inputs the corrected test pattern into the first F/F in each of the scan paths 431 to 434.
The output LFSR 440, like the LFSR depicted in
The indeterminate mask circuit 450 includes, for example, an XOR circuit that inverts an indeterminate mask pattern output from the output LFSR 440 based on the input of a control signal from the LFSR control apparatus 800 or an OR circuit that uses the indeterminate mask pattern output from the output LFSR 440 to mask an indeterminate value included in an output pattern output from each of the scan paths 431 to 434 (hereinafter, “test result pattern”). As a result, the indeterminate mask circuit 450 corrects the indeterminate mask pattern output from the output LFSR 440 based on the control signal from the LFSR control apparatus 800, and then uses the corrected indeterminate mask pattern to change an indeterminate value output from each of the scan paths 431 to 434 to a predetermined fixed value, namely, mask the indeterminate value. Output results that include the masked indeterminate value and are supplied from the scan paths 431 and 434 are compressed and stored in the MISR 460.
Such control signals are determined by LFSR control processing executed by the LFSR control apparatus 800, and output from the LFSR control apparatus 800. Based on each control signal, a test pattern from the input LFSR 410 or an indeterminate mask pattern from the output LFSR 440 is corrected by the input LFSR 410, the pattern correction circuit 420, the output LFSR 440, and the indeterminate mask circuit 450 respectively receiving the control signal.
As a result, the test pattern from the input LFSR 410 can be matched with an ATPG pattern, or the indeterminate mask pattern from the output LFSR 440 can be matched with a test result pattern from each of the scan paths 431 to 434. A procedure of the LFSR control processing executed by the LFSR control apparatus 800 is explained hereinafter with reference to
The computer 810 includes a CPU, a memory, and an interface. The CPU controls the entire LFSR control apparatus 800. The memory is formed of, for example, a read-only memory (ROM), a random access memory (RAM), a hard disk (HD), an optical disk 811, and a flash memory. The memory is used as a work area for the CPU.
The memory stores various kinds of programs that are loaded in response to a command from the CPU. A disk drive controls the reading/writing of data from/into the HD and the optical disk 811. The optical disk 811 and the flash memory are attachable to/detachable from the computer 810. The interface controls input from the input device 820, output to the output device 830, and transmission/reception with respect to the network 840.
As the input device 820, there are a keyboard 821, a mouse 822, a scanner 823, and others. The keyboard 821 includes keys for inputting characters, numerical figures, various instructions, etc., and data is input through the keyboard 821. The keyboard 821 may be of a touch panel type. The mouse 822 performs, for example, movement of a cursor, selection of a range, movement of and size change of a window, etc. The scanner 823 optically reads an image. The read image is retrieved as image data, and stored in the memory in the computer 810. The scanner 823 may have an optical character recognition (OCR) function.
As the output device 830, there are a display 831, a speaker 832, a printer 833, and others. The display 831 displays a cursor, an icon, and a toolbox as well as data, such as, text, an image, or function information. The speaker 832 outputs sound, e.g., sound effects and reading voice. The printer 833 prints image data and/or text data.
The acquiring unit 901 acquires a test pattern(s) generated, before phase change, by the input LFSR 410 and an ATPG pattern output from an ATPG, or a test pattern(s) generated, before phase change, by the output LFSR 440 and a test result pattern output from each of the scan paths 431 to 434. Specifically, the acquiring unit 901 reads each of the patterns from a recording medium, such as the memory explained above. The patterns may be generated by the LFSR control apparatus 800 or may be generated by a different apparatus.
The acquiring unit 901 may acquire each of the patterns from a separate apparatus connected with the LFSR control apparatus 800. Specifically, the acquiring unit 901 realizes the function thereto by, for example, the interface of the computer 810.
The extracting unit 902 extracts blocks of the ATPG pattern or test result patterns acquired by the acquiring unit 901. For example, the extracting unit 902 blocks the acquired ATPG pattern or test result patterns within a range such that a specified number is not exceeded.
For example, when a bit number of the F/F in the input LFSR 410 or the output LFSR 440 is four bits, the extracting unit 902 determines the specified number as “4”. The extracting unit 902 forms a block of the ATPG pattern or the test result patterns in such a manner that the bit count of the bits in which “0” or “1” is set (i.e., the bit count excluding bit values of “X”) does not exceed “4”.
Specifically, the extracting unit 902 realizes the function thereto when, for example, the CPU executes a program stored in the memory of the computer 810. Data extracted by the extracting unit 902 is temporarily recorded in, for example, the memory of the computer 810.
The retrieving unit 903, for each block, retrieves signals that approximates (or coincides with) signals included in a block extracted by the extracting unit 902 from the before-phase-change test patterns acquired by the acquiring unit 901 and generated by the input LFSR 410 or the output LFSR 440.
Here, the retrieving unit 903 retrieves a test pattern that has the least number of bits not matching an ATPG pattern (or a test result pattern) and also has the least amount of phase change performed by the input LFSR 410 (or the output LFSR 440). When the extracting unit 902 forms a block of the ATPG pattern or the test result patterns, the retrieving unit 903 performs the retrieval processing with respect to each block.
Specifically, the retrieving unit 903 realizes the function thereto when, for example, the CPU executes a program stored in the memory of the computer 810. Data retrieved by the retrieving unit 903 is temporarily stored in, for example, the memory of the computer 810.
The determining unit 904 determines, based on the signals retrieved by the retrieving unit 903, a control signal to be output to the input LFSR 410 (or the output LFSR 440) from among the control signals depicted in
The output unit 905 outputs the control signal determined by the determining unit 904 to the input LFSR 410 and the pattern correction circuit 420 (or the output LFSR 440 and the indeterminate mask circuit 450). For example, when the extracting unit 902 forms blocks of the ATPG test pattern (or the test result patterns), the output unit 905 executes the output processing with respect to each block. Specifically, the output unit 905 realizes the function thereto by, for example, by the interface of the computer 810.
First, the acquiring unit 901 acquires before-phase-change test patterns generated by the input LFSR 410 and a ATPG pattern output from the ATPG (step S1001), and the extracting unit 902 extracts the ATPG pattern acquired at step S1001 in units of blocks (step S1002).
The retrieving unit 903 retrieves, for each block, signals that approximates (or coincides with) signals included in a block extracted at step S1002 from the test patterns acquired at step S1001 (step S1003), and the determining unit 904 determines control signals to be output to the input LFSR 410 and the pattern correction circuit 420 based on the signals retrieved at step S1003 (step S1004).
The output unit 905 outputs the control signals determined at step S1004 to the input LFSR 410 and the pattern correction circuit 420 (step S1005), thereby terminating a series of processing.
According to such processing, the control signal output from the LFSR control apparatus 800 for the input LFSR 410 and the pattern correction circuit 420 is first input into the input LFSR 410. As a result, the input LFSR 410 corrects the test patterns and outputs the test patterns approximating the ATPG pattern.
Then, when the control signal is input to the pattern correction circuit 420, the pattern correction circuit 420 corrects (inverts) only signals in the test patterns output from the input LFSR 410 having a value different from the test pattern output from the ATPG, and the corrected test pattern (i.e., a test pattern that matches the ATPG pattern) is input to each of the scan paths 431 to 434.
In LFSR control processing with respect to the output LFSR 440 and the indeterminate mask circuit 450, a control signal output from the LFSR control apparatus 800 for the output LFSR 440 and the indeterminate mask circuit 450 is first input to the output LFSR 440. As a result, the output LFSR 440 corrects each indeterminate mask pattern, and the output LFSR 440 outputs the indeterminate mask pattern that approximates a test result pattern.
Then, when the control signal is input to the indeterminate mask circuit 450, the indeterminate mask circuit 450 corrects (inverts) signals in the test patterns output from the output LFSR 440 having a value different from the test result pattern, thereby effecting indeterminate value mask processing based on the corrected test pattern (i.e., an indeterminate mask pattern that matches the test result pattern).
Here, each of the blocks 1101 to 1103 is formed in columnar units such that a bit count of bits where “0” or “1” is set (i.e., the bit count excluding bit values of “X”) does not exceed a specified number “4” (i.e., the bit count of the input LFSR 410).
For example, the bit count excluding bit values of “X” in the block 1101 that includes columns (1) to (4) is “4”, the bit count excluding bit values of “X” in the block 1102 that includes column (5) is “3”, and the bit count excluding bit values of “X” in the block 1103 that includes columns (6) and (7) is “4”.
In regard to such an ATPG pattern 1100, the LFSR control apparatus 800 searches test patterns output from the input LFSR 410 for a test pattern providing the least number of bits that do not match the ATPG pattern 1100 and the least amount of phase change with respect to the input LFSR 410 based on a current set value.
For example, the LFSR control apparatus 800 retrieves “0001001101111011” as a test pattern with respect to the block 1101. The LFSR control apparatus 800 also retrieves “0110” as a test pattern with respect to the block 1102 and further retrieves “10011000” as a test pattern with respect to the block 1102.
The LFSR control apparatus 800 determines control signals in such a manner that test patterns output from the input LFSR 410 become the retrieved test patterns. For example, when a current set value of the input LFSR 410 is “0100”, test patterns output from the input LFSR 410 are as depicted in Table 1110 of
As explained above, the semiconductor integrated circuit (circuit-under-test 400) according to the third embodiment of the present invention performs arbitrary phase change of a test pattern and then inverts a signal different from an ATPG pattern at a low cost under control of the LFSR control apparatus 800. As a result, the time required to correct the test pattern can be reduced, and the time required for a BIST by the circuit-under-test 400 can be thereby decreased.
The semiconductor integrated circuit (circuit-under-test 400) according to the third embodiment performs phase change of an indeterminate mask pattern and then inverts a signal different from a test result pattern at a low cost (clock number). As a result, the time required to correct the indeterminate mask pattern can be reduced, and the time required for a BIST of the circuit-under-test 400 can be thereby decreased.
The LFSR control method explained in the embodiments can be implemented by a computer such as a personal computer and a workstation executing a program that is prepared in advance. The program is recorded on a computer-readable recording medium such as a hard disk, a flexible disk, a CD-ROM, an MO, and a DVD, and is executed by being read out from the recording medium by a computer. The program can be a transmission medium that can be distributed through a network such as the Internet.
A recording medium storing therein design data concerning the circuit-under-test 400 explained in the embodiment may be prepared. Here, the design data concerning the circuit-under-test 400 is computer-readable electronic data expressing the circuit-under-test 400 by a register transfer level (RTL) description written in a hardware description language (HDL) or a net list after logic synthesis. When such design data is developed in a computer apparatus having a test tool installed therein, a simulation test and others can be executed before manufacture.
When such design data is processed such that it can be written in a programmable logic device (PLD), e.g., a field programmable gate array (FPGA) and then downloaded to the PLD, the circuit-under-test 400 can be manufactured.
Although the invention has been described with respect to a specific embodiment for a complete and clear disclosure, the appended claims are not to be thus limited but are to be construed as embodying all modifications and alternative constructions that may occur to one skilled in the art which fairly fall within the basic teaching herein set forth.
| Number | Date | Country | Kind |
|---|---|---|---|
| 2007-057790 | Mar 2007 | JP | national |
