Takaho Tanigawa

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of fabricating a dynamic random access memory device having...
- Patent number 6,630,378
- Issue date Oct 7, 2003
- NEC Electronics Corporation
- Takaho Tanigawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device with a stacked capacitance structure
- Patent number 6,249,054
- Issue date Jun 19, 2001
- NEC Corporation
- Takaho Tanigawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device having bit lines and signal wiring laye...
- Patent number 6,020,644
- Issue date Feb 1, 2000
- NEC Corporation
- Takaho Tanigawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating a semiconductor memory device
- Patent number 5,879,981
- Issue date Mar 9, 1999
- NEC Corporation
- Takaho Tanigawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device with a stacked capacitance structure
- Patent number 5,828,097
- Issue date Oct 27, 1998
- NEC Corporation
- Takaho Tanigawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device having peripheral circuit and interface...
- Patent number 5,740,099
- Issue date Apr 14, 1998
- NEC Corporation
- Takaho Tanigawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating capacitive element of semiconductor memory d...
- Patent number 5,663,085
- Issue date Sep 2, 1997
- NEC Corporation
- Takaho Tanigawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of producing semiconductor integrated circuit device having...
- Patent number 5,491,108
- Issue date Feb 13, 1996
- NEC Corporation
- Mieko Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory with stacked-capacitor cells
- Patent number 5,471,418
- Issue date Nov 28, 1995
- NEC Corporation
- Takaho Tanigawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for fabricating a semiconductor memory device including a c...
- Patent number 5,436,187
- Issue date Jul 25, 1995
- NEC Corporation
- Takaho Tanigawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device having stacked capacitor cell
- Patent number 5,305,256
- Issue date Apr 19, 1994
- NEC Corporation
- Takaho Tanigawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing highly-integrated stacked capacitor
- Patent number 5,294,561
- Issue date Mar 15, 1994
- NEC Corporation
- Takaho Tanigawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing circuit for random access memory device
- Patent number 4,888,772
- Issue date Dec 19, 1989
- NEC Corporation
- Takaho Tanigawa
- G11 - INFORMATION STORAGE

Takaho Tanigawa

Person

Patents Grantslast 30 patents

Method of fabricating a dynamic random access memory device having...

Semiconductor memory device with a stacked capacitance structure

Semiconductor memory device having bit lines and signal wiring laye...

Method of fabricating a semiconductor memory device

Semiconductor memory device with a stacked capacitance structure

Semiconductor memory device having peripheral circuit and interface...

Method for fabricating capacitive element of semiconductor memory d...

Method of producing semiconductor integrated circuit device having...

Semiconductor memory with stacked-capacitor cells

Process for fabricating a semiconductor memory device including a c...

Semiconductor memory device having stacked capacitor cell

Method for manufacturing highly-integrated stacked capacitor

Testing circuit for random access memory device