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Takamasa ASANO
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Hino-city, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Microparticle composition analyzing apparatus
Patent number
10,283,337
Issue date
May 7, 2019
Fuji Electric Co., Ltd.
Naoki Takeda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Signal processing device and noise strength determining method
Patent number
10,061,034
Issue date
Aug 28, 2018
FUJI ELECTRIC CO., LTD.
Yasuyuki Masunaga
G01 - MEASURING TESTING
Information
Patent Grant
Multifunctional particle analysis device and method of calibrating...
Patent number
10,012,628
Issue date
Jul 3, 2018
Fuji Electric Co., Ltd.
Yoshiki Hasegawa
G01 - MEASURING TESTING
Information
Patent Grant
Signal processing device and radiation measurement device
Patent number
9,983,317
Issue date
May 29, 2018
Fuji Electric Co., Ltd.
Yasuyuki Masunaga
G01 - MEASURING TESTING
Information
Patent Grant
Particle analyzing apparatus
Patent number
9,857,282
Issue date
Jan 2, 2018
Fuji Electric Co., Ltd.
Yoshiki Hasegawa
G01 - MEASURING TESTING
Information
Patent Grant
Particle measuring device
Patent number
9,671,325
Issue date
Jun 6, 2017
Fuji Electric Co., Ltd.
Naoki Takeda
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
COIN IDENTIFICATION DEVICE
Publication number
20180151016
Publication date
May 31, 2018
Fuji Electric Co., Ltd.
Kazutoshi MACHIDA
G07 - CHECKING-DEVICES
Information
Patent Application
PARTICLE COMPONENT ANALYZING DEVICE, PARTICLE MULTIPLE-ANALYZING DE...
Publication number
20170292903
Publication date
Oct 12, 2017
Fuji Electric Co., Ltd.
Yoshiki HASEGAWA
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE ANALYZING APPARATUS
Publication number
20170212030
Publication date
Jul 27, 2017
Fuji Electric Co., Ltd.
Yoshiki HASEGAWA
G01 - MEASURING TESTING
Information
Patent Application
TRAP REPLACEMENT MECHANISM AND MICROPARTICLE COMPOSITION ANALYZING...
Publication number
20170154762
Publication date
Jun 1, 2017
Fuji Electric Co., Ltd.
Naoki TAKEDA
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
MICROPARTICLE COMPOSITION ANALYZING APPARATUS
Publication number
20170069476
Publication date
Mar 9, 2017
Fuji Electric Co., Ltd.
Naoki TAKEDA
G01 - MEASURING TESTING
Information
Patent Application
SIGNAL PROCESSING DEVICE AND RADIATION MEASUREMENT DEVICE
Publication number
20170059718
Publication date
Mar 2, 2017
Fuji Electric Co., Ltd.
Yasuyuki MASUNAGA
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE MEASURING DEVICE
Publication number
20170003221
Publication date
Jan 5, 2017
Fuji Electric Co., Ltd.
Naoki TAKEDA
G01 - MEASURING TESTING
Information
Patent Application
MULTIFUNCTIONAL PARTICLE ANALYSIS DEVICE AND METHOD OF CALIBRATING...
Publication number
20160377539
Publication date
Dec 29, 2016
Fuji Electric Co., Ltd.
Yoshiki HASEGAWA
G01 - MEASURING TESTING
Information
Patent Application
SIGNAL PROCESSING DEVICE AND NOISE STRENGTH DETERMINING METHOD
Publication number
20160356896
Publication date
Dec 8, 2016
Fuji Electric Co., Ltd.
Yasuyuki MASUNAGA
G01 - MEASURING TESTING