Takao Yasue

Person

Itami City, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Surface discharge type plasma display panel with intersecting barri...
- Patent number 6,683,589
- Issue date Jan 27, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Ko Sano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface discharge type plasma display panel with intersecting barri...
- Patent number 6,638,129
- Issue date Oct 28, 2003
- Mitsubishi Denki Kabushiki
- Ko Sano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface discharge plasma display panel having two-dimensional black...
- Patent number 6,417,620
- Issue date Jul 9, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Takao Yasue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface discharge type plasma display panel with intersecting barri...
- Patent number 6,249,264
- Issue date Jun 19, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Ko Sano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for analyzing thin film property
- Patent number 5,723,982
- Issue date Mar 3, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Takao Yasue
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of using scanning probe microscope allowing cleaning of prob...
- Patent number 5,652,428
- Issue date Jul 29, 1997
- Mitsubishi Denki Kabushiki Kaisha
- Tadashi Nishioka
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus and method for analyzing foreign matter on semiconductor...
- Patent number 5,550,372
- Issue date Aug 27, 1996
- Mitsubishi Denki Kabushiki Kaisha
- Takao Yasue
- G01 - MEASURING TESTING
Information Patent Grant
Sample stage for scanning probe microscope head
- Patent number 5,530,253
- Issue date Jun 25, 1996
- Mitsubishi Denki Kabushiki Kaisha
- Tadashi Nishioka
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Adhesion measuring method
- Patent number 5,477,732
- Issue date Dec 26, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Takao Yasue
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever for atomic force microscope and method of manufacturing...
- Patent number 5,469,733
- Issue date Nov 28, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Takao Yasue
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Metal interconnection layer having reduced hillock formation in sem...
- Patent number 5,236,866
- Issue date Aug 17, 1993
- Mitsubishi Denki Kabushiki Kaisha
- Takao Yasue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cantilever for use in atomic force microscope and manufacturing met...
- Patent number 5,193,385
- Issue date Mar 16, 1993
- Mitsubishi Denki Kabushiki Kaisha
- Tadashi Nishioka
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Semiconductor wafer
- Patent number 5,147,824
- Issue date Sep 15, 1992
- Mitsubishi Denki Kabushiki Kaisha
- Takao Yasue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fine scanning mechanism for atomic force microscope
- Patent number 5,107,114
- Issue date Apr 21, 1992
- Mitsubish Denki Kabushiki Kaisha
- Tadashi Nishioka
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Transfer vessel apparatus and method of storing samples
- Patent number 5,088,290
- Issue date Feb 18, 1992
- Mitsubishi Denki Kabushiki Kaisha
- Takao Yasue
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Semiconductor wafer with notches
- Patent number 5,060,043
- Issue date Oct 22, 1991
- Mitsubishi Denki Kabushiki Kaisha
- Takao Yasue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transfer device
- Patent number 5,043,148
- Issue date Aug 27, 1991
- Mitsubishi Denki Kabushiki Kaisha
- Takao Yasue
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Metal interconnection layer having reduced hillock formation
- Patent number 5,040,048
- Issue date Aug 13, 1991
- Mitsubishi Denki Kabushiki Kaisha
- Takao Yasue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tunnel unit and scanning head for scanning tunneling microscope
- Patent number 4,947,042
- Issue date Aug 7, 1990
- Mitsubishi Denki Kabushiki Kaisha
- Tadashi Nishioka
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Fine adjustment mechanism for a scanning tunneling microscope
- Patent number 4,945,235
- Issue date Jul 31, 1990
- Mitsubishi Denki Kabushiki Kaisha
- Tadashi Nishioka
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Fine adjustment mechanism for a scanning tunneling microscope
- Patent number 4,880,975
- Issue date Nov 14, 1989
- Mitsubishi Denki Kabushiki Kaisha
- Tadashi Nishioka
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Transfer vessel device and method of transfer using the device
- Patent number 4,856,297
- Issue date Aug 15, 1989
- Mitsubishi Denki Kabushiki Kaisha
- Takao Yasue
- F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information Patent Grant
Coarse adjusting device of scanning tunneling microscope
- Patent number 4,837,445
- Issue date Jun 6, 1989
- Mitsubishi Denki Kabushiki Kaisha
- Tadashi Nishioka
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Surface discharge type plasma display panel with intersecting barri...
- Publication number 20010026255
- Publication date Oct 4, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Ko Sano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Surface discharge type plasma display panel with intersecting barri...
- Publication number 20010019318
- Publication date Sep 6, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Ko Sano
- H01 - BASIC ELECTRIC ELEMENTS

Takao Yasue

Person

Patents Grantslast 30 patents

Surface discharge type plasma display panel with intersecting barri...

Surface discharge type plasma display panel with intersecting barri...

Surface discharge plasma display panel having two-dimensional black...

Surface discharge type plasma display panel with intersecting barri...

Apparatus for analyzing thin film property

Method of using scanning probe microscope allowing cleaning of prob...

Apparatus and method for analyzing foreign matter on semiconductor...

Sample stage for scanning probe microscope head

Adhesion measuring method

Cantilever for atomic force microscope and method of manufacturing...

Metal interconnection layer having reduced hillock formation in sem...

Cantilever for use in atomic force microscope and manufacturing met...

Semiconductor wafer

Fine scanning mechanism for atomic force microscope

Transfer vessel apparatus and method of storing samples

Semiconductor wafer with notches

Transfer device

Metal interconnection layer having reduced hillock formation

Tunnel unit and scanning head for scanning tunneling microscope

Fine adjustment mechanism for a scanning tunneling microscope

Fine adjustment mechanism for a scanning tunneling microscope

Transfer vessel device and method of transfer using the device

Coarse adjusting device of scanning tunneling microscope

Patents Applicationslast 30 patents

Surface discharge type plasma display panel with intersecting barri...

Surface discharge type plasma display panel with intersecting barri...