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Takashi Ajima
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Kamakura, JP
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last 30 patents
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Patent Grant
Semiconductor device having insulating layer including polyimide film
Patent number
4,853,760
Issue date
Aug 1, 1989
Tokyo Shibaura Denki Kabushiki Kaisha
Masahiro Abe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device with an improved bonding section
Patent number
4,636,832
Issue date
Jan 13, 1987
Tokyo Shibaura Denki Kabushiki Kaisha
Masahiro Abe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device having a multilayer wiring structure using a p...
Patent number
4,618,878
Issue date
Oct 21, 1986
Kabushiki Kaisha Toshiba
Masaharu Aoyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device of multilayer wiring structure
Patent number
4,613,888
Issue date
Sep 23, 1986
Kabushiki Kaisha Toshiba
Yasukazu Mase
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing a semiconductor device
Patent number
4,560,642
Issue date
Dec 24, 1985
Toyko Shibaura Electric Co., Ltd.
Toshio Yonezawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for forming metallization structure having flat surface on s...
Patent number
4,520,041
Issue date
May 28, 1985
Tokyo Shibaura Denki Kabushiki Kaisha
Masaharu Aoyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of forming deep aluminum doped silicon by implanting Al and...
Patent number
4,515,642
Issue date
May 7, 1985
Tokyo Shibaura Denki Kabushiki Kaisha
Takashi Ajima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing a semiconductor device using epitaxially re...
Patent number
4,479,830
Issue date
Oct 30, 1984
Tokyo Shibaura Denki Kabushiki Kaisha
Yutaka Koshino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System for etching a metal film on a semiconductor wafer
Patent number
4,462,856
Issue date
Jul 31, 1984
Tokyo Shibaura Denki Kabushiki Kaisha
Masahiro Abe
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Method of forming reproducible impurity zone of gallium or aluminum...
Patent number
4,426,234
Issue date
Jan 17, 1984
Tokyo Shibaura Denki Kabushiki Kaisha
Jiro Ohshima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of making transistors by ion implantations, electron beam ir...
Patent number
4,415,372
Issue date
Nov 15, 1983
Tokyo Shibaura Denki Kabushiki Kaisha
Yutaka Koshino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for manufacturing a semiconductor device of mesa type
Patent number
4,404,736
Issue date
Sep 20, 1983
Tokyo Shibaura Denki Kabushiki Kaisha
Yutaka Koshino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing a semiconductor device using silicon carbid...
Patent number
4,351,894
Issue date
Sep 28, 1982
Tokyo Shibaura Electric Co., Ltd.
Toshio Yonezawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device with thermally compensating SiO.sub.2 -silicat...
Patent number
4,224,636
Issue date
Sep 23, 1980
Tokyo Shibaura Electric Co., Ltd.
Toshio Yonezawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device with silicon carbide-glass-silicon carbide pas...
Patent number
4,161,743
Issue date
Jul 17, 1979
Tokyo Shibaura Electric Co., Ltd.
Toshio Yonezawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of producing a P-N junction utilizing polycrystalline silicon
Patent number
4,146,413
Issue date
Mar 27, 1979
Tokyo Shibaura Electric Co., Ltd.
Toshio Yonezawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of producing semiconductor device
Patent number
4,123,564
Issue date
Oct 31, 1978
Tokyo Shibaura Electric Co., Ltd.
Takashi Ajima
H01 - BASIC ELECTRIC ELEMENTS