Takashi Amemiya

Person

Yamanashi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Probe card case and probe card transfer method
- Patent number 10,908,180
- Issue date Feb 2, 2021
- Japan Electronic Materials Corp.
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Grant
Probe card case and probe card transfer method
- Patent number 10,184,954
- Issue date Jan 22, 2019
- Japan Electronic Materials Corp.
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Grant
Substrate inspection apparatus and probe card transferring method
- Patent number 9,671,452
- Issue date Jun 6, 2017
- Tokyo Electron Limited
- Takashi Amemiya
- G01 - MEASURING TESTING
Information Patent Grant
Probe card case
- Patent number D751555
- Issue date Mar 15, 2016
- JAPAN ELECTRONIC MATERIALS CORP.
- Chikaomi Mori
- D14 - Recording, communication, or information retrieval equipment
Information Patent Grant
Probing apparatus and method for adjusting probing apparatus
- Patent number 8,063,652
- Issue date Nov 22, 2011
- Tokyo Electron Ltd.
- Takashi Amemiya
- G01 - MEASURING TESTING
Information Patent Grant
Inspection contact structure and probe card
- Patent number 7,719,296
- Issue date May 18, 2010
- Tokyo Electron Limited
- Takashi Amemiya
- G01 - MEASURING TESTING
Information Patent Grant
Inspection contact structure and probe card
- Patent number 7,701,234
- Issue date Apr 20, 2010
- Tokyo Electron Limited
- Takashi Amemiya
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and probe device for inspection of a semiconductor device
- Patent number 7,692,435
- Issue date Apr 6, 2010
- Tokyo Electron Limited
- Shigekazu Komatsu
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for inspecting electric properties of an object
- Patent number 7,679,385
- Issue date Mar 16, 2010
- Tokyo Electron Limited
- Takashi Amemiya
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 7,541,820
- Issue date Jun 2, 2009
- Tokyo Electron Limited
- Takashi Amemiya
- G01 - MEASURING TESTING
Information Patent Grant
Inspection contact structure and probe card
- Patent number 7,267,551
- Issue date Sep 11, 2007
- Tokyo Electron Limited
- Takashi Amemiya
- G01 - MEASURING TESTING
Information Patent Grant
Conductor pattern check apparatus for locating and repairing short...
- Patent number 5,844,199
- Issue date Dec 1, 1998
- Shinji Iino
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Conductor pattern check apparatus for locating and repairing open c...
- Patent number 5,639,390
- Issue date Jun 17, 1997
- Tokyo Electron Limited
- Shinji Iino
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD CASE AND PROBE CARD TRANSFER METHOD
- Publication number 20170153272
- Publication date Jun 1, 2017
- JAPAN ELECTRONIC MATERIALS CORP.
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD CASE AND PROBE CARD TRANSFER METHOD
- Publication number 20150285838
- Publication date Oct 8, 2015
- TOKYO ELECTRON LIMITED
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE INSPECTION APPARATUS AND PROBE CARD TRANSFERRING METHOD
- Publication number 20150192607
- Publication date Jul 9, 2015
- TOKYO ELECTRON LIMITED
- Takashi Amemiya
- G01 - MEASURING TESTING
Information Patent Application
CONTACT TERMINAL FOR A PROBE CARD, AND THE PROBE CARD
- Publication number 20130099813
- Publication date Apr 25, 2013
- TOKYO ELECTRON LIMITED
- Tomohisa HOSHINO
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF POSITIONING AN ANISOTROPIC CONDUCTIVE CONNECTOR, METHOD O...
- Publication number 20090015281
- Publication date Jan 15, 2009
- JSR Corporation
- Mutsuhiko Yoshioka
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Inspection contact structure and probe card
- Publication number 20080211523
- Publication date Sep 4, 2008
- TOKYO ELECTRON LIMITED
- Takashi Amemiya
- G01 - MEASURING TESTING
Information Patent Application
Inspection contact structure and probe card
- Publication number 20080211528
- Publication date Sep 4, 2008
- TOKYO ELECTRON LIMITED
- Takashi Amemiya
- G01 - MEASURING TESTING
Information Patent Application
Probe Card
- Publication number 20080150558
- Publication date Jun 26, 2008
- Takashi Amemiya
- G01 - MEASURING TESTING
Information Patent Application
Probe Card
- Publication number 20080048698
- Publication date Feb 28, 2008
- Takashi Amemiya
- G01 - MEASURING TESTING
Information Patent Application
Probe card
- Publication number 20080007280
- Publication date Jan 10, 2008
- Takashi Amemiya
- G01 - MEASURING TESTING
Information Patent Application
Probe card and probe device
- Publication number 20070182431
- Publication date Aug 9, 2007
- TOKYO ELECTRON LIMITED
- Shigekazu Komatsu
- G01 - MEASURING TESTING
Information Patent Application
Probing apparatus and method for adjusting probing apparatus
- Publication number 20070108996
- Publication date May 17, 2007
- Takashi Amemiya
- G01 - MEASURING TESTING
Information Patent Application
Inspection contact structure and probe card
- Publication number 20060154497
- Publication date Jul 13, 2006
- Takashi Amemiya
- G01 - MEASURING TESTING

Takashi Amemiya

Person

Patents Grantslast 30 patents

Probe card case and probe card transfer method

Probe card case and probe card transfer method

Substrate inspection apparatus and probe card transferring method

Probe card case

Probing apparatus and method for adjusting probing apparatus

Inspection contact structure and probe card

Inspection contact structure and probe card

Probe card and probe device for inspection of a semiconductor device

Probe card for inspecting electric properties of an object

Probe card

Inspection contact structure and probe card

Conductor pattern check apparatus for locating and repairing short...

Conductor pattern check apparatus for locating and repairing open c...

Patents Applicationslast 30 patents

PROBE CARD CASE AND PROBE CARD TRANSFER METHOD

PROBE CARD CASE AND PROBE CARD TRANSFER METHOD

SUBSTRATE INSPECTION APPARATUS AND PROBE CARD TRANSFERRING METHOD

CONTACT TERMINAL FOR A PROBE CARD, AND THE PROBE CARD

METHOD OF POSITIONING AN ANISOTROPIC CONDUCTIVE CONNECTOR, METHOD O...

Inspection contact structure and probe card

Inspection contact structure and probe card

Probe Card

Probe Card

Probe card

Probe card and probe device

Probing apparatus and method for adjusting probing apparatus

Inspection contact structure and probe card