Takashi Atoro

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Shape inspection device, processing device, height image processing...
- Patent number 12,000,688
- Issue date Jun 4, 2024
- Keyence Corporation
- Kaoru Kanayama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Shape measuring device
- Patent number 10,066,932
- Issue date Sep 4, 2018
- Keyence Corporation
- Yuji Akishiba
- G01 - MEASURING TESTING
Information Patent Grant
Waveform observing apparatus and system thereof
- Patent number 8,675,005
- Issue date Mar 18, 2014
- Keyence Corporation
- Takashi Atoro
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Waveform observing apparatus
- Patent number 8,332,171
- Issue date Dec 11, 2012
- Keyence Corporation
- Takashi Atoro
- G01 - MEASURING TESTING
Information Patent Grant
Waveform observing apparatus
- Patent number 8,008,905
- Issue date Aug 30, 2011
- Keyence Corporation
- Takashi Atoro
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SHAPE INSPECTION DEVICE, PROCESSING DEVICE, HEIGHT IMAGE PROCESSING...
- Publication number 20240271925
- Publication date Aug 15, 2024
- KEYENCE CORPORATION
- Kaoru KANAYAMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHAPE INSPECTION DEVICE, PROCESSING DEVICE, HEIGHT IMAGE PROCESSING...
- Publication number 20230026608
- Publication date Jan 26, 2023
- KEYENCE CORPORATION
- Kaoru KANAYAMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Shape Measuring Device
- Publication number 20180100732
- Publication date Apr 12, 2018
- KEYENCE CORPORATION
- Yuji Akishiba
- G01 - MEASURING TESTING
Information Patent Application
Waveform Observing Apparatus
- Publication number 20100036631
- Publication date Feb 11, 2010
- KEYENCE CORPORATION
- Takashi Atoro
- G01 - MEASURING TESTING
Information Patent Application
Waveform Observing Apparatus
- Publication number 20100026277
- Publication date Feb 4, 2010
- KEYENCE CORPORATION
- Takashi Atoro
- G01 - MEASURING TESTING
Information Patent Application
Waveform Observing Apparatus and System Thereof
- Publication number 20090313289
- Publication date Dec 17, 2009
- KEYENCE CORPORATION
- Takashi ATORO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE