Takashi Onishi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electron microscope
- Patent number 10,614,994
- Issue date Apr 7, 2020
- Hitachi High-Technologies Corporation
- Takashi Onishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam generating apparatus, charged particle beam a...
- Patent number 9,548,182
- Issue date Jan 17, 2017
- Hitachi High-Technologies Corporation
- Takashi Onishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun and charged particle beam device having an aperture wi...
- Patent number 9,293,293
- Issue date Mar 22, 2016
- Hitachi High-Technologies Corporation
- Shun-ichi Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam radiation apparatus
- Patent number 8,803,411
- Issue date Aug 12, 2014
- Hitachi High-Technologies Corporation
- Shunichi Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun
- Patent number 8,669,535
- Issue date Mar 11, 2014
- Hitachi High-Technologies Corporation
- Mikio Ichihashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,449,692
- Issue date Nov 11, 2008
- Hitachi High-Technologies Corporation
- Takashi Onishi
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,223,976
- Issue date May 29, 2007
- Hitachi, Ltd.
- Takashi Onishi
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,208,731
- Issue date Apr 24, 2007
- Hitachi, Ltd.
- Takashi Onishi
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,064,324
- Issue date Jun 20, 2006
- Hitachi, Ltd.
- Takashi Onishi
- G01 - MEASURING TESTING
Information Patent Grant
Quarternary amorphous magnetic alloy thin film and magnetic head in...
- Patent number 4,943,883
- Issue date Jul 24, 1990
- Hitachi, Ltd.
- Masaaki Sano
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Electron Microscope
- Publication number 20190279837
- Publication date Sep 12, 2019
- Hitachi High-Technologies Corporation
- Takashi ONISHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM GENERATING APPARATUS, CHARGED PARTICLE BEAM A...
- Publication number 20150179387
- Publication date Jun 25, 2015
- Hitachi High-Technologies Corporation
- Takashi Onishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN AND CHARGED PARTICLE BEAM DEVICE
- Publication number 20140197336
- Publication date Jul 17, 2014
- Hitachi High-Technologies Corporation
- Shun-ichi Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM RADIATION APPARATUS
- Publication number 20130140977
- Publication date Jun 6, 2013
- Hitachi High-Technologies Corporation
- Shunichi Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20130087703
- Publication date Apr 11, 2013
- Takashi Onishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COLD CATHODE FIELD EMISSION ELECTRON GUN AND ITS APPLICATION TO ELE...
- Publication number 20090218508
- Publication date Sep 3, 2009
- Keiji TAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus
- Publication number 20070152150
- Publication date Jul 5, 2007
- Hitachi, Ltd
- Takashi Onishi
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam apparatus
- Publication number 20060289753
- Publication date Dec 28, 2006
- Hitachi, Ltd
- Takashi Onishi
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam apparatus
- Publication number 20060289754
- Publication date Dec 28, 2006
- Hitachi, Ltd
- Takashi Onishi
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam apparatus
- Publication number 20050045822
- Publication date Mar 3, 2005
- Takashi Onishi
- G01 - MEASURING TESTING
Information Patent Application
Electron beam lithography system and method therefor
- Publication number 20040065848
- Publication date Apr 8, 2004
- Takashi Onishi
- B82 - NANO-TECHNOLOGY

Takashi Onishi

Person

Patents Grantslast 30 patents

Electron microscope

Charged particle beam generating apparatus, charged particle beam a...

Electron gun and charged particle beam device having an aperture wi...

Charged particle beam radiation apparatus

Electron gun

Charged particle beam apparatus

Charged particle beam apparatus

Charged particle beam apparatus

Charged particle beam apparatus

Quarternary amorphous magnetic alloy thin film and magnetic head in...

Patents Applicationslast 30 patents

Electron Microscope

CHARGED PARTICLE BEAM GENERATING APPARATUS, CHARGED PARTICLE BEAM A...

ELECTRON GUN AND CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM RADIATION APPARATUS

ELECTRON MICROSCOPE

COLD CATHODE FIELD EMISSION ELECTRON GUN AND ITS APPLICATION TO ELE...

Charged particle beam apparatus

Charged particle beam apparatus

Charged particle beam apparatus

Charged particle beam apparatus

Electron beam lithography system and method therefor