Takeharu Tani

Person

Ashigara-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Curable composition, cured product, and lens unit
- Patent number 11,603,457
- Issue date Mar 14, 2023
- FUJIFILM Corporation
- Masashi Ono
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Bandpass filter comprising first and second reflective members each...
- Patent number 11,513,395
- Issue date Nov 29, 2022
- FUJIFILM Corporation
- Keisuke Kodama
- G01 - MEASURING TESTING
Information Patent Grant
Optical member
- Patent number 10,696,015
- Issue date Jun 30, 2020
- FUJIFILM Corporation
- Tatsuya Yoshihiro
- B32 - LAYERED PRODUCTS
Information Patent Grant
Anti-reflection optical member
- Patent number 10,310,143
- Issue date Jun 4, 2019
- FUJIFILM Corporation
- Hideki Yasuda
- B32 - LAYERED PRODUCTS
Information Patent Grant
Multilayer structure and laminate structure
- Patent number 9,971,077
- Issue date May 15, 2018
- FUJIFILM Corporation
- Shinya Hakuta
- G02 - OPTICS
Information Patent Grant
Heat ray-shielding material
- Patent number 9,738,559
- Issue date Aug 22, 2017
- FUJIFILM Corporation
- Yuki Matsunami
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Grant
Imaging apparatus
- Patent number 8,988,565
- Issue date Mar 24, 2015
- FUJIFILM Corporation
- Hideki Asano
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Sensor, sensing system and sensing method
- Patent number 8,023,115
- Issue date Sep 20, 2011
- FUJIFILM Corporation
- Masayuki Naya
- G01 - MEASURING TESTING
Information Patent Grant
Organic electroluminescence device
- Patent number 8,018,145
- Issue date Sep 13, 2011
- FUJIFILM Corporation
- Hidemasa Hosoda
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Spectroscopic device and raman spectroscopic system
- Patent number 7,999,934
- Issue date Aug 16, 2011
- FUJIFILM Corporation
- Masayuki Naya
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and program for analyzing electromagnetic field
- Patent number 7,970,589
- Issue date Jun 28, 2011
- FUJIFILM Corporation
- Takeharu Tani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Light measurement apparatus measuring two-dimensional physical prop...
- Patent number 7,812,957
- Issue date Oct 12, 2010
- FUJIFILM Corporation
- Takeharu Tani
- G01 - MEASURING TESTING
Information Patent Grant
Two-photon absorbing optical recording material and two-photon abso...
- Patent number 7,771,915
- Issue date Aug 10, 2010
- FUJIFILM Corporation
- Masaharu Akiba
- G11 - INFORMATION STORAGE
Information Patent Grant
Sensor, multichannel sensor, sensing apparatus, and sensing method
- Patent number 7,643,156
- Issue date Jan 5, 2010
- FUJIFILM Corporation
- Masayuki Naya
- G01 - MEASURING TESTING
Information Patent Grant
Solid state imaging device
- Patent number 7,615,732
- Issue date Nov 10, 2009
- FUJIFILM Corporation
- Takeharu Tani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement apparatus
- Patent number 7,551,286
- Issue date Jun 23, 2009
- FUJIFILM Corporation
- Takeharu Tani
- G01 - MEASURING TESTING
Information Patent Grant
Solid state imaging device including a converging structure
- Patent number 7,491,923
- Issue date Feb 17, 2009
- FUJIFILM Corporation
- Takeharu Tani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-resonant two-photon absorbing material, non-resonant two-photon...
- Patent number 7,432,036
- Issue date Oct 7, 2008
- FUJIFILM Corporation
- Hiroo Takizawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for multiphoton-absorption exposure wherein ex...
- Patent number 7,241,550
- Issue date Jul 10, 2007
- FUJIFILM Corporation
- Takeharu Tani
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Two-photon absorbing polymerizable composition and polymerization p...
- Patent number 7,112,616
- Issue date Sep 26, 2006
- Fuji Photo Film Co., Ltd.
- Hiroo Takizawa
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Sensor utilizing attenuated total reflection
- Patent number 7,012,693
- Issue date Mar 14, 2006
- Fuji Photo Film Co., Ltd.
- Nobufumi Mori
- G01 - MEASURING TESTING
Information Patent Grant
Measuring chip
- Patent number 7,009,706
- Issue date Mar 7, 2006
- Fuji Photo Film Co., Ltd.
- Nobufumi Mori
- G01 - MEASURING TESTING
Information Patent Grant
Optical element, optical deflection element, optical multiplexing e...
- Patent number 6,992,806
- Issue date Jan 31, 2006
- Fuji Photo Film Co., Ltd.
- Toshihiko Baba
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optical fabricating method and apparatus
- Patent number 6,841,340
- Issue date Jan 11, 2005
- Fuji Photo Film Co., Ltd.
- Takeharu Tani
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Optical deflection element
- Patent number 6,768,575
- Issue date Jul 27, 2004
- Fuji Photo Film Co., Ltd.
- Toshihiko Baba
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Stray light cutting structure for optical device
- Patent number 6,707,838
- Issue date Mar 16, 2004
- Fuji Photo Film Co., Ltd.
- Takeharu Tani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical element, optical deflection element, optical multiplexing e...
- Patent number 6,674,954
- Issue date Jan 6, 2004
- Fuji Photo Film Co., Ltd.
- Toshihiko Baba
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optical element
- Patent number 6,522,448
- Issue date Feb 18, 2003
- Fuji Photo Film Co., Ltd.
- Toshihiko Baba
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR ACQUIRING EVALUATION VALUE
- Publication number 20240029253
- Publication date Jan 25, 2024
- FUJIFILM CORPORATION
- Takeharu TANI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BANDPASS FILTER COMPRISING FIRST AND SECOND REFLECTIVE MEMBERS EACH...
- Publication number 20220397788
- Publication date Dec 15, 2022
- FUJIFILM CORPORATION
- Keisuke KODAMA
- G01 - MEASURING TESTING
Information Patent Application
CURABLE COMPOSITION, CURED PRODUCT, AND LENS UNIT
- Publication number 20200165438
- Publication date May 28, 2020
- FUJIFILM CORPORATION
- Masashi ONO
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Application
OPTICAL MEMBER
- Publication number 20200016863
- Publication date Jan 16, 2020
- FUJIFILM CORPORATION
- Tatsuya YOSHIHIRO
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
INFRARED SHIELDING MATERIAL
- Publication number 20180370851
- Publication date Dec 27, 2018
- FUJIFILM CORPORATION
- Hirotoshi YOSHIZAWA
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
ANTIREFLECTION OPTICAL MEMBER
- Publication number 20170315270
- Publication date Nov 2, 2017
- FUJIFILM CORPORATION
- Hideki YASUDA
- B32 - LAYERED PRODUCTS
Information Patent Application
OPTICAL ELEMENT, LENS UNIT, IMAGING MODULE, ELECTRONIC APPARATUS, A...
- Publication number 20160370580
- Publication date Dec 22, 2016
- FUJIFILM CORPORATION
- Goro TAKADA
- G02 - OPTICS
Information Patent Application
ANTI-REFLECTION OPTICAL MEMBER
- Publication number 20160291207
- Publication date Oct 6, 2016
- FUJIFILM CORPORATION
- Hideki YASUDA
- G02 - OPTICS
Information Patent Application
MULTILAYER STRUCTURE AND LAMINATE STRUCTURE
- Publication number 20150168620
- Publication date Jun 18, 2015
- FUJIFILM CORPORATION
- Shinya HAKUTA
- G02 - OPTICS
Information Patent Application
IMAGING ELEMENT
- Publication number 20140346629
- Publication date Nov 27, 2014
- Masayuki NAYA
- G02 - OPTICS
Information Patent Application
IMAGE SENSOR
- Publication number 20140339665
- Publication date Nov 20, 2014
- Takeharu TANI
- G02 - OPTICS
Information Patent Application
ANTIREFLECTION FILM
- Publication number 20140327966
- Publication date Nov 6, 2014
- Takeharu TANI
- G02 - OPTICS
Information Patent Application
IMAGING APPARATUS
- Publication number 20140071316
- Publication date Mar 13, 2014
- FUJIFILM CORPORATION
- Hideki ASANO
- G02 - OPTICS
Information Patent Application
HEAT-RAY SHIELDING MATERIAL
- Publication number 20130122281
- Publication date May 16, 2013
- FUJIFILM CORPORATION
- Shinya Hakuta
- B32 - LAYERED PRODUCTS
Information Patent Application
HEAT-RAY SHIELDING MATERIAL
- Publication number 20130071651
- Publication date Mar 21, 2013
- FUJIFILM CORPORATION
- Shinya Hakuta
- B32 - LAYERED PRODUCTS
Information Patent Application
DEFECT DETECTION APPARATUS
- Publication number 20120038911
- Publication date Feb 16, 2012
- Tatsuya YOSHIHIRO
- G01 - MEASURING TESTING
Information Patent Application
HEAT RAY-SHIELDING MATERIAL
- Publication number 20110111210
- Publication date May 12, 2011
- Yuki MATSUNAMI
- G02 - OPTICS
Information Patent Application
TWO-PHOTON ABSORBING OPTICAL RECORDING MATERIAL AND TWO-PHOTON ABSO...
- Publication number 20100239962
- Publication date Sep 23, 2010
- FUJIFILM Corporation
- Masaharu AKIBA
- G11 - INFORMATION STORAGE
Information Patent Application
ORGANIC ELECTROLUMINESCENCE DEVICE
- Publication number 20100225229
- Publication date Sep 9, 2010
- FUJIFILM CORPORATION
- Hidemasa HOSODA
- B82 - NANO-TECHNOLOGY
Information Patent Application
SPECTROSCOPIC DEVICE AND RAMAN SPECTROSCOPIC SYSTEM
- Publication number 20100165334
- Publication date Jul 1, 2010
- FUJIFILM Corporation
- Masayuki Naya
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE HOLDING DEVICE AND MASS SPECTROSCOPE AND MASS SPECTROSCOPIC...
- Publication number 20090242752
- Publication date Oct 1, 2009
- FUJIFILM CORPORATION
- Naoki MURAKAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SENSOR, MULTICHANNEL SENSOR, SENSING APPARATUS, AND SENSING METHOD
- Publication number 20090213384
- Publication date Aug 27, 2009
- FUJIFILM CORPORATION
- Masayuki Naya
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
MEASUREMENT APPARATUS
- Publication number 20090141283
- Publication date Jun 4, 2009
- Fuji Photo Film Co., Ltd.
- Takeharu Tani
- G01 - MEASURING TESTING
Information Patent Application
Multi-Photon Absorber Medium and Method of Exposure Using the Same
- Publication number 20080272346
- Publication date Nov 6, 2008
- FUJIFILM Corporation
- Takeharu Tani
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUS AND PROGRAM FOR ANALYZING ELECTROMAGNETIC FIELD
- Publication number 20080189088
- Publication date Aug 7, 2008
- FUJIFILM CORPORATION
- Takeharu TANI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Solid state imaging device
- Publication number 20080079031
- Publication date Apr 3, 2008
- FUJIFILM Corporation
- Takeharu Tani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sensor, Multichannel Sensor, Sensing Apparatus, And Sensing Method
- Publication number 20070263221
- Publication date Nov 15, 2007
- FUJIFILM CORPORATION
- Masayuki Naya
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Solid state imaging device
- Publication number 20070145241
- Publication date Jun 28, 2007
- FUJIFILM Corporation
- Takeharu Tani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Plating-thickness monitor apparatus and plating-stopping apparatus
- Publication number 20070134132
- Publication date Jun 14, 2007
- FUJIFILM Corporation
- Takeharu Tani
- G01 - MEASURING TESTING
Information Patent Application
Measurement apparatus
- Publication number 20060001884
- Publication date Jan 5, 2006
- Fuji Photo Film Co., Ltd.
- Takeharu Tani
- G01 - MEASURING TESTING

Takeharu Tani

Person

Patents Grantslast 30 patents

Curable composition, cured product, and lens unit

Bandpass filter comprising first and second reflective members each...

Optical member

Anti-reflection optical member

Multilayer structure and laminate structure

Heat ray-shielding material

Imaging apparatus

Sensor, sensing system and sensing method

Organic electroluminescence device

Spectroscopic device and raman spectroscopic system

Apparatus and program for analyzing electromagnetic field

Light measurement apparatus measuring two-dimensional physical prop...

Two-photon absorbing optical recording material and two-photon abso...

Sensor, multichannel sensor, sensing apparatus, and sensing method

Solid state imaging device

Measurement apparatus

Solid state imaging device including a converging structure

Non-resonant two-photon absorbing material, non-resonant two-photon...

Method and apparatus for multiphoton-absorption exposure wherein ex...

Two-photon absorbing polymerizable composition and polymerization p...

Sensor utilizing attenuated total reflection

Measuring chip

Optical element, optical deflection element, optical multiplexing e...

Optical fabricating method and apparatus

Optical deflection element

Stray light cutting structure for optical device

Optical element, optical deflection element, optical multiplexing e...

Optical element

Patents Applicationslast 30 patents

METHOD FOR ACQUIRING EVALUATION VALUE

BANDPASS FILTER COMPRISING FIRST AND SECOND REFLECTIVE MEMBERS EACH...

CURABLE COMPOSITION, CURED PRODUCT, AND LENS UNIT

OPTICAL MEMBER

INFRARED SHIELDING MATERIAL

ANTIREFLECTION OPTICAL MEMBER

OPTICAL ELEMENT, LENS UNIT, IMAGING MODULE, ELECTRONIC APPARATUS, A...

ANTI-REFLECTION OPTICAL MEMBER

MULTILAYER STRUCTURE AND LAMINATE STRUCTURE

IMAGING ELEMENT

IMAGE SENSOR

ANTIREFLECTION FILM

IMAGING APPARATUS

HEAT-RAY SHIELDING MATERIAL

HEAT-RAY SHIELDING MATERIAL

DEFECT DETECTION APPARATUS

HEAT RAY-SHIELDING MATERIAL

TWO-PHOTON ABSORBING OPTICAL RECORDING MATERIAL AND TWO-PHOTON ABSO...

ORGANIC ELECTROLUMINESCENCE DEVICE

SPECTROSCOPIC DEVICE AND RAMAN SPECTROSCOPIC SYSTEM

SAMPLE HOLDING DEVICE AND MASS SPECTROSCOPE AND MASS SPECTROSCOPIC...

SENSOR, MULTICHANNEL SENSOR, SENSING APPARATUS, AND SENSING METHOD

MEASUREMENT APPARATUS

Multi-Photon Absorber Medium and Method of Exposure Using the Same

APPARATUS AND PROGRAM FOR ANALYZING ELECTROMAGNETIC FIELD

Solid state imaging device

Sensor, Multichannel Sensor, Sensing Apparatus, And Sensing Method

Solid state imaging device

Plating-thickness monitor apparatus and plating-stopping apparatus

Measurement apparatus