Takehiro Yamaoka

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for measuring spreading resistance and spreading resistance...
- Patent number 9,823,208
- Issue date Nov 21, 2017
- Hitachi High-Tech Science Corporation
- Masafumi Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and operation method
- Patent number 6,941,798
- Issue date Sep 13, 2005
- SII NanoTechnology Inc.
- Takehiro Yamaoka
- G01 - MEASURING TESTING
Information Patent Grant
Method of operating scanning probe microscope
- Patent number 6,596,992
- Issue date Jul 22, 2003
- Seiko Instruments Inc.
- Kazunori Ando
- G01 - MEASURING TESTING
Information Patent Grant
Correlation sample for scanning probe microscope and method of proc...
- Patent number 6,405,583
- Issue date Jun 18, 2002
- Seiko Instruments Inc.
- Yoshiharu Shirakawabe
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for modifying patterned film
- Patent number 4,874,460
- Issue date Oct 17, 1989
- Seiko Instruments Inc.
- Yoshitomo Nakagawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Method for Measuring Spreading Resistance and Spreading Resistance...
- Publication number 20160290945
- Publication date Oct 6, 2016
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masafumi Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope and operation method
- Publication number 20040093935
- Publication date May 20, 2004
- Takehiro Yamaoka
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope
- Publication number 20020088937
- Publication date Jul 11, 2002
- Kazunori Ando
- B82 - NANO-TECHNOLOGY