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Takeo Kamino
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Katsuta, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Electron beam device and sample holding device for electron beam de...
Patent number
8,604,429
Issue date
Dec 10, 2013
Hitachi High-Technologies Corporation
Toshie Yaguchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Standard specimen for a charged particle beam apparatus, specimen p...
Patent number
7,622,714
Issue date
Nov 24, 2009
Hitachi High-Technologies Corporation
Toshie Yaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Focused ion beam system and a method of sample preparation and obse...
Patent number
7,612,337
Issue date
Nov 3, 2009
Hitachi High-Technologies Corporation
Yuya Suzuki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Material characterization system
Patent number
6,992,286
Issue date
Jan 31, 2006
Hitachi High-Technologies Corporation
Toshie Yaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Sample heating holder, method of observing a sample and charged par...
Patent number
6,495,838
Issue date
Dec 17, 2002
Hitachi, Ltd.
Toshie Yaguchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron microscope
Patent number
5,898,177
Issue date
Apr 27, 1999
Hitachi, Ltd.
Kishio Hidaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Specimen heating device for use with an electron microscope
Patent number
5,296,669
Issue date
Mar 22, 1994
Hitachi, Ltd.
Hiroyuki Kobayashi
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
ELECTRON BEAM DEVICE AND SAMPLE HOLDING DEVICE FOR ELECTRON BEAM DE...
Publication number
20110303845
Publication date
Dec 15, 2011
Toshie Yaguchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged particle beam system and its specimen holder
Publication number
20080093565
Publication date
Apr 24, 2008
Hitachi High-Technologies Corporation
Toshie Yaguchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Standard specimen for a charged particle beam apparatus, specimen p...
Publication number
20080073521
Publication date
Mar 27, 2008
Hitachi High-Technologies Corporation
Toshie Yaguchi
G01 - MEASURING TESTING
Information
Patent Application
Focused ion beam system and a method of sample preparation and obse...
Publication number
20070187597
Publication date
Aug 16, 2007
Hitachi High-Technologies Corporation
Yuya Suzuki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Material characterization system
Publication number
20040183012
Publication date
Sep 23, 2004
Toshie Yaguchi
G01 - MEASURING TESTING