BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 shows a schematic diagram of a focused ion beam system according to an embodiment of the invention.
FIG. 2 shows a schematic procedure for the preparation and observation of a sample using the focused ion beam system shown in FIG. 1.
FIG. 3 shows a detailed procedure for the preparation and observation of a sample using the focused ion beam system shown in FIG. 1.
FIG. 4 shows a schematic diagram of a focused ion beam system according to another embodiment of the invention.
FIG. 5 shows a detailed procedure for the preparation and observation of a sample using the focused ion beam system shown in FIG. 4.