Takeshi MATSUKA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Specimen inspection automation system and method for managing empty...
- Patent number 11,567,094
- Issue date Jan 31, 2023
- HITACHI HIGH-TECH CORPORATION
- Takeshi Matsuka
- G01 - MEASURING TESTING
Information Patent Grant
Automated sample inspection system and method for controlling same
- Patent number 11,073,527
- Issue date Jul 27, 2021
- HITACHI HIGH-TECH CORPORATION
- Takeshi Matsuka
- G01 - MEASURING TESTING
Information Patent Grant
Specimen pre-processing connection device and system provided with...
- Patent number 9,651,571
- Issue date May 16, 2017
- Hitachi High-Technologies Corporation
- Takahiro Sasaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONVEYING DEVICE AND CONVEYING METHOD
- Publication number 20250070694
- Publication date Feb 27, 2025
- HITACHI HIGH-TECH CORPORATION
- Yuki MATSUDA
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
SPECIMEN INSPECTION SYSTEM, AND CONVEYANCE METHOD
- Publication number 20240036068
- Publication date Feb 1, 2024
- HITACHI HIGH-TECH CORPORATION
- Shigeru YANO
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
SAMPLE TRANSPORT DEVICE AND SAMPLE TRANSPORT CARRIER
- Publication number 20230202779
- Publication date Jun 29, 2023
- HITACHI HIGH-TECH CORPORATION
- Takeshi MATSUKA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE TRANSPORT SYSTEM
- Publication number 20220252626
- Publication date Aug 11, 2022
- HITACHI HIGH-TECH CORPORATION
- Shigeru YANO
- G01 - MEASURING TESTING
Information Patent Application
Specimen Inspection Automation System and Method for Managing Empty...
- Publication number 20200241027
- Publication date Jul 30, 2020
- Takeshi MATSUKA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED SAMPLE INSPECTION SYSTEM AND METHOD FOR CONTROLLING SAME
- Publication number 20190170780
- Publication date Jun 6, 2019
- Hitachi High-Technologies Corporation
- Takeshi MATSUKA
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN PRE-PROCESSING CONNECTION DEVICE AND SYSTEM PROVIDED WITH...
- Publication number 20160252539
- Publication date Sep 1, 2016
- Hitachi High-Technologies Corporation
- Takahiro SASAKI
- G01 - MEASURING TESTING

Takeshi MATSUKA

Person

Patents Grantslast 30 patents

Specimen inspection automation system and method for managing empty...

Automated sample inspection system and method for controlling same

Specimen pre-processing connection device and system provided with...

Patents Applicationslast 30 patents

CONVEYING DEVICE AND CONVEYING METHOD

SPECIMEN INSPECTION SYSTEM, AND CONVEYANCE METHOD

SAMPLE TRANSPORT DEVICE AND SAMPLE TRANSPORT CARRIER

SAMPLE TRANSPORT SYSTEM

Specimen Inspection Automation System and Method for Managing Empty...

AUTOMATED SAMPLE INSPECTION SYSTEM AND METHOD FOR CONTROLLING SAME

SPECIMEN PRE-PROCESSING CONNECTION DEVICE AND SYSTEM PROVIDED WITH...