Takeshi Ogashiwa

Person

Hitachinka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle bean device and information-processing device
- Patent number 10,453,648
- Issue date Oct 22, 2019
- Hitachi High-Technologies Corporation
- Yoshinobu Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 9,040,911
- Issue date May 26, 2015
- Hitachi High-Technologies Corporation
- Takeshi Ogashiwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 8,853,647
- Issue date Oct 7, 2014
- Hitachi High-Technologies Corporation
- Takeshi Ogashiwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 8,455,823
- Issue date Jun 4, 2013
- Hitachi High-Technologies Corporation
- Takashi Ichimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 8,124,940
- Issue date Feb 28, 2012
- Hitachi High-Technologies Corporation
- Kunji Shigeto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and method for charged particle bea...
- Patent number 8,026,491
- Issue date Sep 27, 2011
- Hitachi High-Technologies Corporation
- Takeshi Ogashiwa
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam device and its control method
- Patent number 7,550,724
- Issue date Jun 23, 2009
- Hitachi High-Technologies Corporation
- Takashi Ichimura
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Device and Information-Processing Device
- Publication number 20170345614
- Publication date Nov 30, 2017
- Hitachi High-Technologies Corporation
- Yoshinobu KIMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Electron Microscope
- Publication number 20150108351
- Publication date Apr 23, 2015
- Hitachi High-Technologies Corporation
- Takeshi Ogashiwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20140151555
- Publication date Jun 5, 2014
- Hitachi High-Technologies Corporation
- Takeshi Ogashiwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20110233399
- Publication date Sep 29, 2011
- Takashi Ichimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20090184256
- Publication date Jul 23, 2009
- Hitachi High-Technologies Corporation
- Kunji Shigeto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus and method for charged particle bea...
- Publication number 20070284542
- Publication date Dec 13, 2007
- Takeshi Ogashiwa
- G01 - MEASURING TESTING
Information Patent Application
Electron beam device and its control method
- Publication number 20070057185
- Publication date Mar 15, 2007
- Hitachi High-Technologies Corporation
- Takashi Ichimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus, method of displaying sample image,...
- Publication number 20060219907
- Publication date Oct 5, 2006
- Takeshi Ogashiwa
- H01 - BASIC ELECTRIC ELEMENTS

Takeshi Ogashiwa

Person

Patents Grantslast 30 patents

Charged particle bean device and information-processing device

Scanning electron microscope

Electron microscope

Charged particle beam device

Charged particle beam apparatus

Charged particle beam apparatus and method for charged particle bea...

Electron beam device and its control method

Patents Applicationslast 30 patents

Charged Particle Beam Device and Information-Processing Device

Scanning Electron Microscope

ELECTRON MICROSCOPE

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM APPARATUS

Charged particle beam apparatus and method for charged particle bea...

Electron beam device and its control method

Charged particle beam apparatus, method of displaying sample image,...