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Takeyuki Suzuki
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Yokohama, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Integral composite membrane with a continuous ionomer phase
Patent number
11,715,839
Issue date
Aug 1, 2023
W. L. Gore & Associates, Inc.
Alexander Agapov
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Grant
Cylindrical member, contact probe and semiconductor inspection socket
Patent number
11,531,060
Issue date
Dec 20, 2022
Yamaichi Electronics, Co. Ltd.
Takeyuki Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Roll construction of laminated material and method for producing
Patent number
11,456,476
Issue date
Sep 27, 2022
W. L. Gore & Associates, Inc.
Alexander Agapov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Highly reinforced ionomer membranes for high selectivity and high s...
Patent number
11,380,927
Issue date
Jul 5, 2022
W. L. Gore & Associates, Inc.
Takeyuki Suzuki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electrolyte film for fuel cell
Patent number
10,109,878
Issue date
Oct 23, 2018
W. L. Gore & Associates, Co., Ltd.
Masashi Maruyama
C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information
Patent Grant
Contact probe and semiconductor element socket provided with same
Patent number
9,684,031
Issue date
Jun 20, 2017
Yamaichi Electronics Co., Ltd.
Katsumi Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Inspection probe and an IC socket with the same
Patent number
9,588,140
Issue date
Mar 7, 2017
Yamaichi Electronics Co., Ltd.
Katsumi Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor light emitting element
Patent number
9,142,725
Issue date
Sep 22, 2015
Kabushiki Kaisha Toshiba
Takeyuki Suzuki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Contact probe and semiconductor device socket including contact probe
Patent number
9,105,994
Issue date
Aug 11, 2015
Yamaichi Electronics Co., Ltd.
Katsumi Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Reinforced electrolyte membrane for fuel cell, membrane-electrode a...
Patent number
8,802,314
Issue date
Aug 12, 2014
Toyota Jidosha Kabushiki Kaisha
Yasuhiro Akita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Reinforced electrolyte membrane for fuel cell, fuel cell membrane-e...
Patent number
8,795,923
Issue date
Aug 5, 2014
Toyota Jidosha Kabushiki Kaisha
Yasuhiro Akita
C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information
Patent Grant
Probe pin and an IC socket with the same
Patent number
8,669,774
Issue date
Mar 11, 2014
Yamaichi Electronics Co., Ltd.
Yuji Kato
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor light-emitting device and process for production thereof
Patent number
8,659,040
Issue date
Feb 25, 2014
Kabushiki Kaisha Toshiba
Akira Fujimoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Socket for a semiconductor device
Patent number
8,535,101
Issue date
Sep 17, 2013
Yamaichi Electronics Co., Ltd.
Katsumi Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Electric connecting apparatus
Patent number
8,363,410
Issue date
Jan 29, 2013
Yamaichi Electronics Co., Ltd.
Eiji Kobori
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor light-emitting device and process for production thereof
Patent number
8,357,557
Issue date
Jan 22, 2013
Kabushiki Kaisha Toshiba
Akira Fujimoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Manufacturing method for probe contact
Patent number
8,312,626
Issue date
Nov 20, 2012
Yamaichi Electronics Co., Ltd.
Takeyuki Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor light emitting device
Patent number
8,089,081
Issue date
Jan 3, 2012
Kabushiki Kaisha Toshiba
Ryota Kitagawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electrical connecting device
Patent number
7,914,295
Issue date
Mar 29, 2011
Yamaichi Electronics Co., Ltd.
Yuji Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Method for assembling testing equipment for semiconductor substrate
Patent number
7,908,747
Issue date
Mar 22, 2011
Yamaichi Electronics Co., Ltd.
Takeyuki Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Electric connecting apparatus for semiconductor devices and contact...
Patent number
7,677,901
Issue date
Mar 16, 2010
Yamaichi Electronics Co., Ltd.
Katsumi Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Carrier unit for a semiconductor device and semiconductor socket us...
Patent number
7,411,794
Issue date
Aug 12, 2008
Yamaichi Electronics Co., Ltd.
Yoshinori Wakabayashi
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device connector, semiconductor device carrier, semic...
Patent number
7,274,093
Issue date
Sep 25, 2007
Yamaichi Electronics Co., Ltd.
Takeyuki Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Recovery processing method of an electrode
Patent number
7,159,292
Issue date
Jan 9, 2007
Yamaichi Electronics Co., Ltd.
Takeyuki Suzuki
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Base for a semiconductor carrier
Patent number
D525215
Issue date
Jul 18, 2006
Yamaichi Electronics Co., Ltd.
Minoru Hisaishi
D13 - Equipment for production, distribution, or transformation of energy
Information
Patent Grant
Cover for a semiconductor carrier
Patent number
D518798
Issue date
Apr 11, 2006
Yamaichi Electronics Co., Ltd.
Minoru Hisaishi
D13 - Equipment for production, distribution, or transformation of energy
Information
Patent Grant
Semiconductor carrier
Patent number
D507248
Issue date
Jul 12, 2005
Yamaichi Electronics Co., Ltd.
Minoru Hisaishi
D13 - Equipment for production, distribution, or transformation of energy
Information
Patent Grant
Socket for semiconductor device
Patent number
6,910,898
Issue date
Jun 28, 2005
Yamaichi Electronics Co., Ltd.
Takeyuki Suzuki
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Recovery processing method of an electrode
Patent number
6,905,952
Issue date
Jun 14, 2005
Yamaichi Electronics Co., Ltd.
Takeyuki Suzuki
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method for forming a recognition mark on a substrate for a KGD
Patent number
6,835,318
Issue date
Dec 28, 2004
Yamaichi Electronics Co., Ltd.
Takeyuki Suzuki
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20240321696
Publication date
Sep 26, 2024
Kabushiki Kaisha Toshiba
Riku KATAMAWARI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
Publication number
20240321638
Publication date
Sep 26, 2024
Kabushiki Kaisha Toshiba
Takeyuki SUZUKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INTEGRAL COMPOSITE MEMBRANE WITH A CONTINUOUS IONOMER PHASE
Publication number
20230420718
Publication date
Dec 28, 2023
W.L. GORE & ASSOCIATES, INC.
Alexander Agapov
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Application
COMPOSITE ELECTROLYTE MEMBRANE
Publication number
20230343979
Publication date
Oct 26, 2023
W.L. GORE & ASSOCIATES, INC.
Takeyuki Suzuki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20230317672
Publication date
Oct 5, 2023
Kabushiki Kaisha Toshiba
Takeyuki SUZUKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
HIGHLY REINFORCED IONOMER MEMBRANES FOR HIGH SELECTIVITY AND HIGH S...
Publication number
20220293989
Publication date
Sep 15, 2022
W.L. GORE & ASSOCIATES, INC.
Takeyuki Suzuki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
RELEASE FILM FOR USE IN MANUFACTURING OF AN ELECTROLYTE MEMBRANE OR...
Publication number
20220271316
Publication date
Aug 25, 2022
Takeyuki Suzuki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ROLL CONSTRUCTION OF LAMINATED MATERIAL AND METHOD FOR PRODUCING
Publication number
20210328246
Publication date
Oct 21, 2021
W.L. GORE & ASSOCIATES, INC.
Alexander Agapov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INTEGRAL COMPOSITE MEMBRANE WITH A CONTINUOUS IONOMER PHASE
Publication number
20210296674
Publication date
Sep 23, 2021
W.L. GORE & ASSOCIATES, INC.
Alexander Agapov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Cylindrical Member, Contact Probe and Semiconductor Inspection Socket
Publication number
20200393507
Publication date
Dec 17, 2020
Yamaichi Electronics Co., Ltd.
Takeyuki Suzuki
G01 - MEASURING TESTING
Information
Patent Application
HIGHLY REINFORCED IONOMER MEMBRANES FOR HIGH SELECTIVITY AND HIGH S...
Publication number
20200243887
Publication date
Jul 30, 2020
W.L. GORE & ASSOCIATES, INC.
Takeyuki Suzuki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTROLYTE FILM FOR FUEL CELL
Publication number
20170294670
Publication date
Oct 12, 2017
W.L. GORE & ASSOCIATES, CO., LTD.
Masashi Maruyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR LIGHT EMITTING ELEMENT, METHOD FOR MANUFACTURING SAME...
Publication number
20160276532
Publication date
Sep 22, 2016
KABUSHIKI KAISHA TOSHIBA
Kentaro MORI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CONTACT PROBE AND SEMICONDUCTOR ELEMENT SOCKET PROVIDED WITH SAME
Publication number
20150369859
Publication date
Dec 24, 2015
Yamaichi Electronics Co., Ltd.
Katsumi Suzuki
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR LIGHT EMITTING ELEMENT
Publication number
20150263236
Publication date
Sep 17, 2015
Kabushiki Kaisha Toshiba
Takeyuki SUZUKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR LIGHT EMITTING DEVICE AND METHOD FOR MANUFACTURING TH...
Publication number
20150102382
Publication date
Apr 16, 2015
Kabushiki Kaisha Toshiba
Takeyuki Suzuki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INSPECTION PROBE AND AN IC SOCKET WITH THE SAME
Publication number
20140253163
Publication date
Sep 11, 2014
Katsumi SUZUKI
G01 - MEASURING TESTING
Information
Patent Application
CONTACT PROBE AND SEMICONDUCTOR DEVICE SOCKET INCLUDING CONTACT PROBE
Publication number
20120249174
Publication date
Oct 4, 2012
YAMAICHI ELECTRONICS., CO. LTD.
Katsumi SUZUKI
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR LIGHT EMITTING DEVICE AND METHOD FOR MANUFACTURING SAME
Publication number
20120223356
Publication date
Sep 6, 2012
Kabushiki Kaisha Toshiba
Takeyuki SUZUKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD MANUFACTURING SEMICONDUCTOR LIGHT EMITTING DEVICE
Publication number
20120208308
Publication date
Aug 16, 2012
Kabushiki Kaisha Toshiba
Takeyuki SUZUKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR LIGHT-EMITTING DEVICE AND PROCESS FOR PRODUCTION THEREOF
Publication number
20120187414
Publication date
Jul 26, 2012
Kabushiki Kaisha Toshiba
Akira Fujimoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SOCKET FOR A SEMICONDUCTOR DEVICE
Publication number
20120115366
Publication date
May 10, 2012
Yamaichi Electronics Co., Ltd.
Katsumi SUZUKI
G01 - MEASURING TESTING
Information
Patent Application
REINFORCED ELECTROLYTE MEMBRANE FOR FUEL CELL, MEMBRANE-ELECTRODE A...
Publication number
20110287335
Publication date
Nov 24, 2011
W.L, GORE & ASSOCIATES CO., LTD.
Yasuhiro Akita
C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information
Patent Application
PROBE PIN AND AN IC SOCKET WITH THE SAME
Publication number
20110248736
Publication date
Oct 13, 2011
Yamaichi Electronics Co., Ltd.
Yuji KATO
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR LIGHT EMITTING DEVICE AND METHOD OF FABRICATING THE SAME
Publication number
20110215294
Publication date
Sep 8, 2011
Kabushiki Kaisha Toshiba
Takeyuki SUZUKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRIC CONNECTING APPARATUS
Publication number
20110058338
Publication date
Mar 10, 2011
Eiji KOBORI
G01 - MEASURING TESTING
Information
Patent Application
REINFORCED ELECTROLYTE MEMBRANE FOR FUEL CELL, FUEL CELL MEMBRANE-...
Publication number
20110008708
Publication date
Jan 13, 2011
Yasuhiro Akita
C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information
Patent Application
SEMICONDUCTOR LIGHT-EMITTING DEVICE AND PROCESS FOR PRODUCTION THEREOF
Publication number
20100221856
Publication date
Sep 2, 2010
Akira Fujimoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRICAL CONNECTING DEVICE
Publication number
20100120265
Publication date
May 13, 2010
Yuji NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR LIGHT EMITTING DEVICE
Publication number
20100065868
Publication date
Mar 18, 2010
Kabushiki Kaisha Toshiba
Ryota Kitagawa
H01 - BASIC ELECTRIC ELEMENTS